2 article(s) from de los Arcos, Teresa
Correction: AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode
- Hendrik Müller,
- Hartmut Stadler,
- Teresa de los Arcos,
- Adrian Keller and
- Guido Grundmeier
Beilstein J. Nanotechnol. 2025, 16, 252–253, doi:10.3762/bjnano.16.19
AFM-IR investigation of thin PECVD SiOx films on a polypropylene substrate in the surface-sensitive mode
- Hendrik Müller,
- Hartmut Stadler,
- Teresa de los Arcos,
- Adrian Keller and
- Guido Grundmeier
Beilstein J. Nanotechnol. 2024, 15, 603–611, doi:10.3762/bjnano.15.51
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