Deep-learning recognition and tracking of individual nanotubes in low-contrast microscopy videos

• Vladimir Pimonov,
• Said Tahir and
• Vincent Jourdain

Beilstein J. Nanotechnol. 2025, 16, 1316–1324, doi:10.3762/bjnano.16.96

• to the same or another close nanotube (Figure 3). Despite this final manual check, automating recognition and tracking steps has accelerated kinetic extraction, significantly enhanced the time resolution of kinetic curves (Figure 3b–d), and increased the repeatability of kinetic measurements. A

• acquired using this method, forming the foundation for developing a statistically supported model of carbon nanotube growth kinetics. On average, extracting kinetic data from a single video takes approximately 6 h for a time resolution of 5 s using the manual method, compared to just 2 h for a time

• resolution of 1 s with the deep learning model, meaning that the throughput was increased by about a factor of 15 (Figure 3a,b). Conclusion We have identified several critical steps in developing a DL model for extracting kinetic data from in situ microscopy videos of individual nano-objects. A specific

Wavelength-dependent correlation of LIPSS periodicity and laser penetration depth in stainless steel

• Nitin Chaudhary,
• Chavan Akash Naik,
• Shilpa Mangalassery,
• Jai Prakash Gautam and
• Sri Ram Gopal Naraharisetty

Beilstein J. Nanotechnol. 2025, 16, 1302–1315, doi:10.3762/bjnano.16.95

• employed as shown in Figure 1. For nanostructuring, a convex lens made of CaF2 with a focal length of 5 cm was used to focus the laser beam. Precise sample positioning was achieved using a three-dimensional Newport stage with a resolution of 1 µm, controlled by an ESP motion controller, with all axes being

• -resolution images of cross section and surface morphologies of the sample were obtained using a FESEM (Zeiss, Ultra 55). EDS was used to determine the elemental distribution on the bare and laser-treated surfaces. The periodicity in various locations on the FESEM images was determined using ImageJ software

• parallel to the incident beam polarization. In all FESEM images, the incident polarization direction is represented by a violet arrow at the top left corner. High-resolution images of the embedded HSFL ladder-like structure is shown in Figure 5 for two wavelengths for better understanding. The aspect ratio

Enhancing the photoelectrochemical performance of BiOI-derived BiVO₄ films by controlled-intensity current electrodeposition

• Huu Phuc Dang,
• Khanh Quang Nguyen,
• Nguyen Thi Mai Tho and
• Tran Le

Beilstein J. Nanotechnol. 2025, 16, 1289–1301, doi:10.3762/bjnano.16.94

• on the optimized BiVO4(326) sample. The survey spectrum (Figure 7a) confirmed the presence of Bi, V, and O, which is consistent with the BiVO4 structure. High-resolution Bi 4f spectra (Figure 7b) show a characteristic doublet at binding energies of 159.0 eV (Bi 4f7/2) and 164.2 eV (Bi 4f5/2

• 600 min. X-ray photoelectron spectroscopy (XPS) analysis of the BiVO4(326) photoanode before and after PEC stability testing in 30 min (0.5 M Na2SO4). (a) XPS view scans of survey spectrum and high-resolution spectra of (b) Bi 4f, (c) O 1s, and (d) V 2p. Estimated crystallite sizes of BiVO4

Functional bio-packaging enhanced with nanocellulose from rice straw and cinnamon essential oil Pickering emulsion for fruit preservation

• Tuyen B. Ly,
• Duong D. T. Nguyen,
• Hieu D. Nguyen,
• Yen T. H. Nguyen,
• Bup T. A. Bui,
• Kien A. Le and
• Phung K. Le

Beilstein J. Nanotechnol. 2025, 16, 1234–1245, doi:10.3762/bjnano.16.91

• resolution of 4 cm−1. Thermal stability was determined using thermogravimetric analysis (TGA) and differential thermogravimetric analysis (DTG). Samples were heated from 25 to 500 °C at a rate of 10 K·min−1 under N2 atmosphere (50 mL·min−1) in a METTLER TOLEDO 3+ Large furnace (Switzerland). X-ray

Chitosan nanocomposite containing rotenoids: an alternative bioinsecticidal approach for the management of Aedes aegypti

• Maria A. A. Bertonceli,
• Vitor D. C. Cristo,
• Ivo J. Vieira,
• Francisco J. A. Lemos,
• Arnoldo R. Façanha,
• Raimundo Braz-Filho,
• Gustavo V. T. Batista,
• Luis G. M. Basso,
• Sérgio H. Seabra,
• Thalya S. R. Nogueira,
• Felipe F. Moreira,
• Arícia L. E. M. Assis,
• Antônia E. A. Oliveira and
• Kátia V. S. Fernandes

Beilstein J. Nanotechnol. 2025, 16, 1197–1208, doi:10.3762/bjnano.16.88

• nanoparticles (CS/TPP-β-CD), pure rotenoids, and rotenoid-loaded nanoparticles (CS/TPP-β-CD-rot) was analyzed using a PerkinElmer Spectrum Two FTIR spectrometer equipped with an Attenuated Total Reflectance (ATR) accessory. Dried samples were scanned over a wavenumber range of 800–4000 cm−1, with a resolution

Mechanical stability of individual bacterial cells under different osmotic pressure conditions: a nanoindentation study of Pseudomonas aeruginosa

• Lizeth García-Torres,
• Idania De Alba Montero,
• Eleazar Samuel Kolosovas-Machuca,
• Facundo Ruiz,
• Sumati Bhatia,
• Jose Luis Cuellar Camacho and
• Jaime Ruiz-García

Beilstein J. Nanotechnol. 2025, 16, 1171–1183, doi:10.3762/bjnano.16.86

• sample at the nanoscale. The force applied by the AFM tip on the sample is controlled by monitoring the deflection of an extremity of a micrometer mechanical lever onto which the tip is attached. In the study of pathogens, AFM excels in providing high-resolution topographic images while measurements are

• . Therefore, the pre-programed grid in FV defines the amount of information (number of nanoindentations per scanned line) taken from the sample surface and also its resolution. Typical parameters obtained using the FV mode are the height, stiffness, adhesion, elasticity modulus, and dissipation of the sample

• loading force of 500 pN for each nanoindentation applied in a pre-programmed grid of 48 points per line to quantify surface interactions and the mechanical response of bacteria. This allowed us to simultaneously acquire maps with enough resolution on the sample surface to identify individual bacteria and

Crystalline and amorphous structure selectivity of ignoble high-entropy alloy nanoparticles during laser ablation in organic liquids is set by pulse duration

• Robert Stuckert,
• Felix Pohl,
• Oleg Prymak,
• Ulrich Schürmann,
• Christoph Rehbock,
• Lorenz Kienle and
• Stephan Barcikowski

Beilstein J. Nanotechnol. 2025, 16, 1141–1159, doi:10.3762/bjnano.16.84

• in organic solvents (acetone, ethanol, acetonitrile). In a systematic experimental series using high-resolution transmission electron microscopy, scanning transmission electron microscopy with energy-dispersive X-ray spectroscopy, selected-area electron diffraction, X-ray diffraction, electron energy

• . Nanoparticle characterization is done by high-resolution transmission electron microscopy (HRTEM), energy-dispersive X-ray spectroscopy (STEM-EDX), selected-area electron diffraction (SAED), X-ray diffraction (XRD), and electron energy loss spectroscopy (EELS), complemented by tempering and laser post

• (±2% to ±5%), making it unlikely that those differences will have a big impact on structural differences. Based on this data, we can conclude that element ratios close to the mole fraction of the target are converted into NPs (Supporting Information File 1, Figure S6). High-resolution particle

Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

• Samuel Gelman,
• Irit Rosenhek-Goldian,
• Nir Kampf,
• Marek Patočka,
• Maricarmen Rios,
• Marcos Penedo,
• Georg Fantner,
• Amir Beker,
• Sidney R. Cohen and
• Ido Azuri

Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83

• deep learning models to improve resolution and quality of low-resolution AFM images made under standard ambient scanning. Both traditional methods and deep learning models were benchmarked and quantified regarding fidelity, quality, and a survey taken by AFM experts. The deep learning models outperform

• the traditional methods and yield better results. Additionally, some common AFM artifacts, such as streaking, are present in the ground truth high-resolution images. These artifacts are partially attenuated by the traditional methods but are completely eliminated by the deep learning models. This work

• shows deep learning models to be superior for super-resolution tasks and enables significant reduction in AFM measurement time, whereby low-pixel-resolution AFM images are enhanced in both resolution and fidelity through deep learning. Keywords: atomic force microscopy; deep learning; fast scanning

Towards a quantitative theory for transmission X-ray microscopy

• James G. McNally,
• Christoph Pratsch,
• Stephan Werner,
• Stefan Rehbein,
• Andrew Gibbs,
• Jihao Wang,
• Thomas Lunkenbein,
• Peter Guttmann and
• Gerd Schneider

Beilstein J. Nanotechnol. 2025, 16, 1113–1128, doi:10.3762/bjnano.16.82

• ; transmission X-ray microscope; Introduction Transmission X-ray microscopes (TXMs) operating in the soft and tender X-ray energy range are valuable tools for structural analysis in both biomedical and materials science research [1][2][3][4]. These microscopes yield images at a lateral resolution approaching 25

• investigate this further, we performed selected area electron diffraction on the nanospheres, which revealed the presence of crystalline domains in the nanospheres with the lattice spacing of gold (Supporting Information File 1, Section S13, Figure S12a). Furthermore, a high-resolution TEM image showed the

Soft materials nanoarchitectonics: liquid crystals, polymers, gels, biomaterials, and others

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2025, 16, 1025–1067, doi:10.3762/bjnano.16.77

Time-resolved probing of laser-induced nanostructuring processes in liquids

• Maximilian Spellauge,
• David Redka,
• Mianzhen Mo,
• Changyong Song,
• Heinz Paul Huber and
• Anton Plech

Beilstein J. Nanotechnol. 2025, 16, 968–1002, doi:10.3762/bjnano.16.74

• electrons or X-rays are able to address this challenge. In particular, it is possible to investigate LSPC on single objects using single probe pulses and avoid accumulation effects in a heterogeneous sample. The presented results capture structure formation with femtosecond and atomic scale resolution

• ensemble-averaged dynamics with angstrom-scale spatial resolution, as they rely on well-resolved interference fringes from periodic crystalline structures. Consequently, local structural variations are frequently obscured and data interpretation is constrained by predefined models. These limitations become

• even more pronounced when studying non-equilibrium states, such as laser-induced material deformation kinetics, where established knowledge is still developing. To address these challenges, direct imaging probes with high spatial and temporal resolution have been developed [68][69][70]. Direct imaging

Shape, membrane morphology, and morphodynamic response of metabolically active human mitochondria revealed by scanning ion conductance microscopy

• Eric Lieberwirth,
• Anja Schaeper,
• Regina Lange,
• Ingo Barke,
• Simone Baltrusch and
• Sylvia Speller

Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73

• –sample interaction, often leading to an underestimation of mitochondrial apparent height due to applied cantilever pressure [22][25]. Similarly, scanning electron microscopy (SEM) offers high-resolution imaging but requires mitochondria to be chemically fixed, stained, and sectioned, which precludes the

• study demonstrated the use of a nanopipette for extraction of small mitochondrial subpopulations from fibroblasts for next-generation genome sequencing [33]. However, metabolically active, isolated mitochondria and their surface morphology at nanometer resolution have not been reported using SICM. In

• significant advance in imaging metabolically active organelles in their native environment with nanometer-scale resolution. The outer mitochondrial membrane appears largely “featureless” and smooth in these measurements. No detectable signatures of porins or other integral membrane proteins, which are present

Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

• Bob Kyeyune,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72

• . Keywords: atomic resolution imaging; calcium fluoride surface; interaction force; non-contact atomic force microscopy (NC-AFM); tip change; Introduction Non-contact atomic force microscopy (NC-AFM) [1] is a surface science tool that has been used to atomically resolve surfaces of semiconductor and

• insulator materials in real space with unprecedented spatial resolution [2][3][4][5][6]. Besides high-resolution imaging of molecular structures [7], NC-AFM has demonstrated its ability to identify sublattices of atomic surfaces [8][9][10]. In these studies, the knowledge of the tip’s atomic structure plays

Synthesis of biowaste-derived carbon-dot-mediated silver nanoparticles and the evaluation of electrochemical properties for supercapacitor electrodes

• Navya Kumari Tenkayala,
• Chandan Kumar Maity,
• Md Moniruzzaman and
• Subramani Devaraju

Beilstein J. Nanotechnol. 2025, 16, 933–943, doi:10.3762/bjnano.16.71

• energies of 285 and 368 eV, respectively. The high-resolution individual elemental XPS spectra of C 1s and Ag 3d are exhibited in Figure 2c–d. As shown in Figure 2d, the C 1s spectrum of the PG-CDs-AgNPs composite exhibited four primary peaks at binding energies of 282.9, 285.3, 287.1, and 288.5 eV. These

Structural and magnetic properties of microwave-synthesized reduced graphene oxide/VO₂/Fe₂O₃ nanocomposite

• Sumanta Sahoo,
• Ankur Sood and
• Sung Soo Han

Beilstein J. Nanotechnol. 2025, 16, 921–932, doi:10.3762/bjnano.16.70

• and 6.50 mA using an Al Kα. The morphologies and elemental analyses of rGO and the NCs were analyzed through scanning electron microscopy (SEM, Hitachi, S-4800). The structural analysis of these fabricated NCs was examined using high-resolution transmission electron microscopy (HRTEM, FEI Tecnai G2

• element (derived from rGO). The data thus obtained was in coherence with the reported results from XRD and EDX analysis. Additionally, the high-resolution XPS spectrum of V 2p designates two major peaks at 516.5 and 523.3 eV, which can be ascribed to the V 2p3/2 and V 2p1/2, respectively (Figure 7b) [40

• ]. On the other hand, the high-resolution XPS spectrum of Fe 2p reveals two XPS peaks centered at ≈710.8 and ≈724.5 eV, which correspond to Fe 2p3/2 and Fe 2p1/2 levels, respectively (Figure 7c). It is noteworthy to mention that the weak satellite peak at ≈719.5 eV indicates the formation of iron oxide

Focused ion beam-induced platinum deposition with a low-temperature cesium ion source

• Thomas Henning Loeber,
• Bert Laegel,
• Meltem Sezen,
• Feray Bakan Misirlioglu,
• Edgar J. D. Vredenbregt and
• Yang Li

Beilstein J. Nanotechnol. 2025, 16, 910–920, doi:10.3762/bjnano.16.69

• . Compared to a standard Ga+ FIB, the Cs+ FIB can produce images with higher resolution and a larger depth of focus. Furthermore, the material contrast is greater in images acquired with Cs+ compared to images acquired with Ga+. For milling applications, Cs+ can deliver more evenly etched pattern floors than

Heat-induced transformation of nickel-coated polycrystalline diamond film studied in situ by XPS and NEXAFS

• Olga V. Sedelnikova,
• Yuliya V. Fedoseeva,
• Dmitriy V. Gorodetskiy,
• Yuri N. Palyanov,
• Elena V. Shlyakhova,
• Eugene A. Maksimovskiy,
• Anna A. Makarova,
• Lyubov G. Bulusheva and
• Aleksandr V. Okotrub

Beilstein J. Nanotechnol. 2025, 16, 887–898, doi:10.3762/bjnano.16.67

• process occurring at the interface between diamond and Ni nanoparticles was revealed using high-resolution transmission electron microscopy (HRTEM) [19][24]. During annealing, Ni nanoparticles etch the diamond surface, resulting in the formation of a narrow interdiffusion zone. The carbon atoms released

• . Element mapping analysis based on energy-dispersive X-ray (EDX) spectroscopy revealed a uniform distribution of nickel particles in the top layers of all diamond faces after annealing (Supporting Information File 1, Figure S4). The low resolution of the EDX instrument used did not allow the detection of

Insights into the electronic and atomic structures of cerium oxide-based ultrathin films and nanostructures using high-brilliance light sources

• Paola Luches and
• Federico Boscherini

Beilstein J. Nanotechnol. 2025, 16, 860–871, doi:10.3762/bjnano.16.65

• applications, examining the application of high-brilliance light sources on model systems such as supported thin films and epitaxial nanostructures. We review selected studies exploiting the high energy resolution and sensitivity of synchrotron radiation-based X-ray photoelectron spectroscopy and X-ray

• sensitivity, atomic selectivity, spatial and energy resolution, synchrotron radiation-based techniques, which utilize high-brilliance photon beams, have enabled refined characterization of the electronic, structural, and morphological properties of these materials, as well as the modifications they undergo

• under operating conditions. Furthermore, free-electron lasers (FELs), with orders-of-magnitude higher peak brilliance than synchrotrons, have made it possible to achieve temporal resolution of the order of a few tens of femtoseconds, facilitating an ultrafast, element-sensitive characterization of the

Facile one-step radio frequency magnetron sputtering of Ni/NiO on stainless steel for an efficient electrode for hydrogen evolution reaction

• Ha Huu Do,
• Khac Binh Nguyen,
• Phuong N. Nguyen and
• Hoai Phuong Pham

Beilstein J. Nanotechnol. 2025, 16, 837–846, doi:10.3762/bjnano.16.63

• attributed to a satellite peak. The presence of Ni3+ can be ascribed to the formation of NiOOH species originating from water adsorption on the surface of NiO. The high-resolution O 1s spectrum can be deconvoluted into three peaks, namely, O–Ni2+ (528.9 eV), O–Ni3+ (530.5 eV), and O–H (531.4 eV) [39]. To

• mapping of the Ni/NiO/SS-10 sample. (a) Survey XPS spectrum of Ni/NiO/SS-10. High-resolution XPS spectra of (b) Ni 2p3/2 and (c) O 1s. (a) Polarization curves of SS, Ni/NiO/SS-5, Ni/NiO/SS-10, Ni/NiO/SS-15, and Ni/NiO/SS-20 electrodes. (b) Corresponding Tafel slopes of electrodes. (c) Nyquist plots of

Synthesis and magnetic transitions of rare-earth-free Fe–Mn–Ni–Si-based compositionally complex alloys at bulk and nanoscale

• Shabbir Tahir,
• Tatiana Smoliarova,
• Carlos Doñate-Buendía,
• Michael Farle,
• Natalia Shkodich and
• Bilal Gökce

Beilstein J. Nanotechnol. 2025, 16, 823–836, doi:10.3762/bjnano.16.62

• from the Al-based CCA target. High-resolution TEM images and diffractograms of PLAL-generated CCA NPs. (a) Ge-based CCA NP and (b) Al-based CCA NP. (a) ZFC-FC temperature-dependent magnetization (M–T curve) of the bulk Ge-based CCA. (b) Field-dependent magnetization curve at 5 and 300 K for the Ge

Supramolecular hydration structure of graphene-based hydrogels: density functional theory, green chemistry and interface application

• Hon Nhien Le,
• Duy Khanh Nguyen,
• Minh Triet Dang,
• Huyen Trinh Nguyen,
• Thi Bang Tam Dao,
• Trung Do Nguyen,
• Chi Nhan Ha Thuc and
• Van Hieu Le

Beilstein J. Nanotechnol. 2025, 16, 806–822, doi:10.3762/bjnano.16.61

• characteristics of the GO-SG-ZH hydrogel were recorded and analyzed during drying processes in the moisture analyzer (MX-50, resolution of 0.01%). Figure 5a describes the moisture curves during the drying process at 70, 85, and 100 °C, corresponding to the drying times of 170, 100, and 70 min, respectively

• GO nanosheets are visualized. In Figure 8d–f, SEM provided high-resolution images of the GO-SG-ZH/PLA film. The brush-coated layer of the GO-SG-ZH nanocomposite was not completely uniform since rough coating morphology was observed on the substrate surface. Two-dimensional graphene-based sheets

Morphology and properties of pyrite nanoparticles obtained by pulsed laser ablation in liquid and thin films for photodetection

• Akshana Parameswaran Sreekala,
• Bindu Krishnan,
• Rene Fabian Cienfuegos Pelaes,
• David Avellaneda Avellaneda,
• Josué Amílcar Aguilar-Martínez and
• Sadasivan Shaji

Beilstein J. Nanotechnol. 2025, 16, 785–805, doi:10.3762/bjnano.16.60

• temperatures and amounts of sulfur. Characterization The morphological analyses of pyrite NPs were recorded using the FEI Titan G2 80–300 for TEM, high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM), high-resolution TEM (HRTEM) and selected area electron diffraction (SAED). The

• all the samples, the peak position corresponding to the adventitious carbon value was fixed at 284.6 eV. A Shirley-type background baseline was used, and the Gaussian–Lorentzian sum function was applied for peak fitting. The high-resolution spectra of Fe 2p and S 2p after soft surface etching using

• exact binding energy values detected for Fe and S identified from high resolution spectra of Fe 2p and S 2p are given in Supporting Information File 1, Table S2. Optical properties of NPs and thin films Supporting Information File 1, Figure S2a shows the UV–vis spectra of FeS2 nanoparticles in different

Changes of structural, magnetic and spectroscopic properties of microencapsulated iron sucrose nanoparticles in saline

• Sabina Lewińska,
• Pavlo Aleshkevych,
• Roman Minikayev,
• Anna Bajorek,
• Mateusz Dulski,
• Krystian Prusik,
• Tomasz Wojciechowski and
• Anna Ślawska-Waniewska

Beilstein J. Nanotechnol. 2025, 16, 762–784, doi:10.3762/bjnano.16.59

• microcapsules. The resolution of the SEM technique is insufficient to recognize iron sucrose nanoparticles. Therefore, it is impossible to determine whether calcium alginate uniformly covers all iron sucrose nanoparticles or if some nanoparticles are on the microcapsule surface. Furthermore, it remains unclear

• nm, cores, while the thickness of the shell seems constant ≈10 nm. The sucrose shell is homogenous; thus the individual cores appear to be well separated from each other. In Figure 3c, the high-resolution transmission electron microscopy (HRTEM) image presents a single crystalline nanoparticle. The

• contamination from physiological saline, which was also proved by the XRD results. In Figure 11, for all the distinguished states, the high-resolution XPS measurements were performed, the results of which will be further analyzed. Figure 12 presents the spectra for FS0, while the results obtained for FST, due

Thickness dependent oxidation in CrCl₃: a scanning X-ray photoemission and Kelvin probe microscopies study

• Shafaq Kazim,
• Rahul Parmar,
• Maryam Azizinia,
• Matteo Amati,
• Muhammad Rauf,
• Andrea Di Cicco,
• Seyed Javid Rezvani,
• Dario Mastrippolito,
• Luca Ottaviano,
• Tomasz Klimczuk,
• Luca Gregoratti and
• Roberto Gunnella

Beilstein J. Nanotechnol. 2025, 16, 749–761, doi:10.3762/bjnano.16.58

• particular technological interest, even more in the case of chromium trihalides (CrX3, X = Cl, Br, and I), whose longer lifetime under ambient conditions is particularly intriguing. By using synchrotron-based scanning photoelectron microscopy with a resolution of 0.1 μm and Kelvin probe force microscopy, we

• [2][11][8][10], focusing on thin layered flakes and the role of the layer thicknesses obtained by spectro- and scanning microscopy with a lateral resolution of a few tens of nanometers. The interaction with the supporting substrate is a crucial factor [3][12] regarding the properties of the flakes

• showed that oxygen adsorption on cleaved surfaces facilitates the formation of a stable structure with charge transfer signatures, as identified by high-resolution photoemission spectroscopy [8]. It remains unclear whether similar effects occur in exfoliated thin flakes. Like in other materials, the

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

• Matteo Amati,
• Alexey S. Shkvarin,
• Alexander I. Merentsov,
• Alexander N. Titov,
• María Taeño,
• David Maestre,
• Sarah R. McKibbin,
• Zygmunt Milosz,
• Ana Cremades,
• Rainer Timm and
• Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

• current and future applications. Due to their nature resulting in diffused heterogeneous structures (chemical and electronic composition typically organized in phases or building blocks) characterizing these materials needs state of the art technologies which combine nanometer spatial resolution

• , environmental reliability, and operando capabilities. Scanning photoelectron spectromicroscopy (SPEM) is one of the characterization tools that combine high spectral resolution X-ray photoelectron spectroscopy with submicron spatial resolution. In particular, the SPEM equipment hosted at the ESCA microscopy

• four decades, several important upgrades have spread the original ability of XPS of chemical analysis to include, for instance, band mapping through angle resolved measurements (ARPES), spin detection, and imaging or spectromicroscopy at a nanoscale spatial resolution [9][10]. It is worth noting that