Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

• Jannis Lübbe,
• Matthias Temmen,
• Sebastian Rode,
• Philipp Rahe,
• Angelika Kühnle and
• Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

• values are due to frequency-range limitations of the spectrum analyser. In the case of higher harmonics, we cannot easily calculate the modal cantilever stiffness, as it strongly depends on the tip mass, which is generally not known [13]. Therefore, determining requires the knowledge of the stiffness

Effect of spherical Au nanoparticles on nanofriction and wear reduction in dry and liquid environments

• Dave Maharaj and
• Bharat Bhushan

Beilstein J. Nanotechnol. 2012, 3, 759–772, doi:10.3762/bjnano.3.85

• obtained in both cases were converted to forces by using an established calibration method [2][38]. Normal loads were determined by multiplying the cantilever vertical deflection by the cantilever stiffness [2]. The vertical deflection in turn was obtained by operating the cantilever in force-calibration

Repulsive bimodal atomic force microscopy on polymers

• Alexander M. Gigler,
• Christian Dietz,
• Maximilian Baumann,
• Nicolás F. Martinez,
• Ricardo García and
• Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

• fixed ratio between the cantilever stiffness and the effective tip–sample stiffness. It will be interesting to explore the impact of stiffness further. From an experimental point of view, such an experiment is demanding, as a very large detection bandwidth is needed. By contrast, using short, soft