Beilstein J. Nanotechnol.2011,2, 691–692, doi:10.3762/bjnano.2.74
a setup based on a scanning tunnelling microscope. Alternatively, this can be achieved by mechanically controllable break junctions. A third, widely used method employs breaking of a thin wire by electromigration. Many methods have been explored for introducing the molecules into the junction, but
is known to exert a force on the ions, which is responsible for the phenomenon of electromigration mentioned above. However, the microscopic theory for the effect is poorly understood. It has recently been shown, through seminal work by Todorov and his group, that the electron force is