Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)

• Christian Held,
• Thomas Seyller and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2012, 3, 179–185, doi:10.3762/bjnano.3.19

• the unit cell are plausible candidates to explain the variations in contact potential. These differences could express themselves as a variation of the surface reconstruction (e.g., (5×5), (6×6) versus (6√3×6√3)R30°) of the interface layer [4]. Finally, we add a few comments on the data quality in the

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

• Adam Sweetman,
• Sam Jarvis,
• Rosanna Danza and
• Philip Moriarty

Beilstein J. Nanotechnol. 2012, 3, 25–32, doi:10.3762/bjnano.3.3

• ) “Crescent” (empty green squares), (g) “Wormlike” (empty pink triangles), (h) “Discuslike” (empty black circles), (j) Ball and stick model of the Si(100) surface reconstruction showing in-phase (p(2 × 2)) and out-of-phase (c(4 × 2)) dimer buckling. Larger scans of (a) inverted and (b) high-setpoint inverted