Bimodal atomic force microscopy driving the higher eigenmode in frequency-modulation mode: Implementation, advantages, disadvantages and comparison to the open-loop case

• Daniel Ebeling and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 198–207, doi:10.3762/bjnano.4.20

• amplitude (oscillation or drive), 2nd phase or frequency shift (see Figure 3 for parameters). Simulation of the change in frequency response for the second eigenmode of a cantilever with fundamental eigenfrequency of 60.8 kHz (Q ≈ 150), second eigenfrequency of 380.8 kHz (Q ≈ 450), and fundamental force

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

• Jeffrey C. Williams and
• Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

• frequency deviates from the resonance frequency (recall that harmonic oscillators exhibit a Lorentzian frequency response). As a result, the high-frequency peaks in Zp(ω) become smaller and smaller as ω increases, such that their signal-to-noise ratio decreases rapidly as ω increases. Thus, in order to

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy

• Jannis Lübbe,
• Matthias Temmen,
• Sebastian Rode,
• Philipp Rahe,
• Angelika Kühnle and
• Michael Reichling

Beilstein J. Nanotechnol. 2013, 4, 32–44, doi:10.3762/bjnano.4.4

• 300 kHz, respectively, and are exchanged depending on the eigenfrequency of the cantilever. Details on this modification and the frequency response of the preamplifiers can be found in [7]. The light source is a 48TE-SOT (Schäfter+Kirchhoff GmbH, Hamburg, Germany) and emits light at a wavelength of

• -bandwidth preamplifier) or the preamplifier supplied by the manufacturer (high-bandwidth preamplifier) is used depending on the bandwidth requirements. The frequency response of both preamplifiers is shown in Figure 5. To measure noise spectra, the SR770 spectrum analyzer (Stanford Research Systems, Inc

• frequency response and need to be individually adjusted for each setting of the loop filter order o and cutoff frequency fc (see Section 3 of Supporting Information File 1 for details). The optimum settings for each loop filter used in the following are listed in Table S4 in Section 3 of Supporting

Focused electron beam induced deposition: A perspective

• Michael Huth,
• Fabrizio Porrati,
• Christian Schwalb,
• Marcel Winhold,
• Roland Sachser,
• Maja Dukic,
• Jonathan Adams and
• Georg Fantner

Beilstein J. Nanotechnol. 2012, 3, 597–619, doi:10.3762/bjnano.3.70

Wavelet cross-correlation and phase analysis of a free cantilever subjected to band excitation

• Francesco Banfi and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2012, 3, 294–300, doi:10.3762/bjnano.3.33

• cantilever oscillation modes when the tip interacts with the sample surface. The temporal evolution of the amplitude, phase or frequency response is in many cases a fundamental parameter. The implementation of these techniques is based on the continuous excitation of multiple flexural cantilever modes [3][4

• ], impulsive cantilever excitation [5] or thermal-noise excitation [6][7][8][9]. Thermal noise analysis has been performed, with the aid of wavelet transforms, to characterize the time–frequency response of a thermally excited cantilever in dynamic force spectroscopy [10][11][12]. In these previous works, the

Pulse-response measurement of frequency-resolved water dynamics on a hydrophilic surface using a Q-damped atomic force microscopy cantilever

• Masami Kageshima

Beilstein J. Nanotechnol. 2012, 3, 260–266, doi:10.3762/bjnano.3.29

• measurement a step stress is applied to the cantilever and the response signal u(t) is converted to the corresponding frequency response function, i.e., a complex compliance , by Fourier–Laplace transformation as, Actually, the time differentiation of u(t) required prior to Fourier–Laplace transformation is

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

• Zsolt Majzik,
• Martin Setvín,
• Andreas Bettac,
• Albrecht Feltz,
• Vladimír Cháb and
• Pavel Jelínek

Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28

• enough to achieve a reasonable value for the output voltage. However there is a side effect to high-gain operation. The frequency response is strongly reduced as the gain is inversely proportional to the bandwidth. In such a regime, the feedback capacitor Cf plays an important role in the circuit

• will consider only the parasitic capacitance Cp in the rest of the discussion. For circuit analyses we performed numerical simulations with the SPICE-based analog simulation program TINA-TI [38]. The frequency response of the IVC is shown in Figure 3A. For calculations we used the macro model of Op111

• output voltage Vout is proportional to the charge, it is also called a charge amplifier. The charge amplification breaks at the second pole in the frequency response (f2) which is around 110 kHz in this particular example setup. The optimal function of the IVC is guaranteed as long as the value of the

Determination of object position, vortex shedding frequency and flow velocity using artificial lateral line canals

• Adrian Klein and
• Horst Bleckmann

Beilstein J. Nanotechnol. 2011, 2, 276–283, doi:10.3762/bjnano.2.32

• to the external flow field; 2) the sensors are protected from the external environment and thus are less prone to physical damage; 3) the sensitivity, frequency response and dynamic amplitude range of ALLCs can easily be altered by changing canal morphology (e.g., the number, size and placement of