Pulse-response measurement of frequency-resolved water dynamics on a hydrophilic surface using a Q-damped atomic force microscopy cantilever

• Masami Kageshima

Beilstein J. Nanotechnol. 2012, 3, 260–266, doi:10.3762/bjnano.3.29

• limited [22][23][24][25]. Using the method of exciting the AFM cantilever with a well-characterized magnetic force [26][27], attempts have been made to measure the frequency-resolved viscoelasticity spectrum of soft-matter systems. The most straightforward approach is a frequency-domain measurement, in

Noncontact atomic force microscopy study of the spinel MgAl₂O₄(111) surface

• Morten K. Rasmussen,
• Kristoffer Meinander,
• Flemming Besenbacher and
• Jeppe V. Lauritsen

Beilstein J. Nanotechnol. 2012, 3, 192–197, doi:10.3762/bjnano.3.21

• Nanoworld with a resonance frequency of 330 kHz and a force constant of 42 N/m were utilized. The constant-detuning mode was used for topographic imaging of the surface by fixing the detuning of the AFM cantilever at a specific setpoint (Δfset) and recording the variation of the tip height (z) while raster

The atomic force microscope as a mechano–electrochemical pen

• Christian Obermair,
• Andreas Wagner and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2011, 2, 659–664, doi:10.3762/bjnano.2.70

• with force constants between 0.03 N/m and 0.1 N/m, were used. Within each experiment, the same AFM cantilever tip was used both for nanolithography and for subsequent AFM imaging. The position of the tip was controlled by a lithography mode of our software, which at the same time allows control of the

Distance dependence of near-field fluorescence enhancement and quenching of single quantum dots

• Volker Walhorn,
• Jan Paskarbeit,
• Heinrich Gotthard Frey,
• Alexander Harder and
• Dario Anselmetti

Beilstein J. Nanotechnol. 2011, 2, 645–652, doi:10.3762/bjnano.2.68

• interface and a gold coated AFM cantilever tip was elucidated by means of a combined TIRFM–AFM approach based on a home-built AFM setup that was mounted on an inverted microscope (Figure 1a). The cantilever position relative to the sample surface can be set and adjusted with subnanometer precision. The

• evanescent field and the AFM cantilever tip (Figure 3a). At small tip distances a strong field enhancement is observed that rapidly decreases with growing gap size. This strong distance dependence is characteristic of dipole–dipole coupling effects. Upon further retraction from the surface Γexc exhibits a

Switching adhesion forces by crossing the metal–insulator transition in Magnéli-type vanadium oxide crystals

• Bert Stegemann,
• Matthias Klemm,
• Siegfried Horn and
• Mathias Woydt

Beilstein J. Nanotechnol. 2011, 2, 59–65, doi:10.3762/bjnano.2.8

• performed with the same tip. SEM images of a Ti microsphere (diameter 7.2 µm) attached at the free end of a single beam tipless AFM cantilever. Acknowledgments The authors are grateful to H. Backhaus and B. Strauss for experimental assistance and to H. Kloss, C. Marwitz, D. Spaltmann and E. Santner for

Tip-sample interactions on graphite studied using the wavelet transform

• Giovanna Malegori and
• Gabriele Ferrini

Beilstein J. Nanotechnol. 2010, 1, 172–181, doi:10.3762/bjnano.1.21

• and topography is compatible with 1–30 ms/pixel data acquisition times required for practical DFS imaging. Conclusion The interaction of an AFM cantilever tip with a graphite sample is measured by applying the wavelet transform analysis to its Brownian motion near the surface. The wavelet transform

The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl–Tomlinson model and the simulation of vibration-induced friction reduction

• W. Merlijn van Spengen,
• Viviane Turq and
• Joost W. M. Frenken

Beilstein J. Nanotechnol. 2010, 1, 163–171, doi:10.3762/bjnano.1.20

• the counter-surface flipped upright in its hinges with a probe needle, allowing easy access with an AFM cantilever tip. The AFM has been used to measure the surface roughness (Figure 6) on the sidewall at the position where the arrow indicating ‘Counter-surface’ is pointing. Autocorrelation function

Sensing surface PEGylation with microcantilevers

• Natalija Backmann,
• Natascha Kappeler,
• Thomas Braun,
• François Huber,
• Hans-Peter Lang,
• Christoph Gerber and
• Roderick Y. H. Lim

Beilstein J. Nanotechnol. 2010, 1, 3–13, doi:10.3762/bjnano.1.2

• reversible collapse when switching between good and poor solvent conditions, respectively. Keywords: AFM; cantilever sensor; polyethylene glycol; polymer brush; reversible collapse; static mode; Introduction Polyethylene glycol (PEG) is often used as a protein-resistant surface layer in biomedicine and

• or steric repulsion of a polymer brush as described by the Alexander–de Gennes theory (in a limited range 0.2 < D/L < 0.9 [10][31][32]), where F is the measured force (as a function of D), kB is Boltzmann’s constant, T is the absolute temperature, Rtip is the radius of the AFM-cantilever tip, L is

• . Rectangular-shaped Si3N4 AFM-cantilevers (Biolever, Olympus/OBL, Veeco) with V-shaped tips were used in all measurements. Spring constant calibrations typically fell within a 20% margin of error from the nominal spring constant of 0.005 N/m. The radius of curvature of each AFM-cantilever tip (Rtip) was