Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

• Joachim Welker,
• Esther Illek and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

• the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method

• ) are investigated with respect to the deconvolution quality. Both methods show a nontrivial dependence of the deconvolution quality on the oscillation amplitude. The matrix method exhibits spikelike features originating from a numerical artifact. By interpolation of the data, the spikelike features can

• be circumvented. The Sader–Jarvis method has a continuous amplitude dependence showing two minima and one maximum, which is an inherent property of the deconvolution algorithm. The optimal deconvolution depends on the ratio of the amplitude and the characteristic decay length of the force for the

Variations in the structure and reactivity of thioester functionalized self-assembled monolayers and their use for controlled surface modification

• Inbal Aped,
• Yacov Mazuz and
• Chaim N. Sukenik

Beilstein J. Nanotechnol. 2012, 3, 213–220, doi:10.3762/bjnano.3.24

• , merged signal (Figure 4B and Figure 4C). Deconvolution reveals the thiophene sulfurs at 164.5 ± 0.2 eV and 165.6 ± 0.2 eV. The overlap among the four peaks in the spectra, together with their inherently problematic signal-to-noise ratio, leads to a situation in which the expected 2:1 peak intensity ratio

Mesoporous MgTa₂O₆ thin films with enhanced photocatalytic activity: On the interplay between crystallinity and mesostructure

• Jin-Ming Wu,
• Igor Djerdj,
• Till von Graberg and
• Bernd M. Smarsly

Beilstein J. Nanotechnol. 2012, 3, 123–133, doi:10.3762/bjnano.3.13

• crystalline standard. The standard was also used for the deconvolution of the instrumental-broadening contribution. Since the initial refinement gave rather high disagreement between the experimental and calculated curves, particularly in the [103] direction, an anisotropic broadening with a larger

Highly efficient ZnO/Au Schottky barrier dye-sensitized solar cells: Role of gold nanoparticles on the charge-transfer process

• Tanujjal Bora,
• Htet H. Kyaw,
• Soumik Sarkar,
• Samir K. Pal and
• Joydeep Dutta

Beilstein J. Nanotechnol. 2011, 2, 681–690, doi:10.3762/bjnano.2.73

• (nonradiative path), observed here, indicates an efficient electron transfer from the sensitizer to the semiconductor system. The various decay time constants obtained after deconvolution of the fluorescence decay curves (Figure 5b) with the instrument response function (IRF) are given in Table 3. The fraction

How to remove the influence of trace water from the absorption spectra of SWNTs dispersed in ionic liquids

• Juan Yang,
• Daqi Zhang and
• Yan Li

Beilstein J. Nanotechnol. 2011, 2, 653–658, doi:10.3762/bjnano.2.69

• introduced in the absorption spectra of IL-dispersed SWNTs and cause problems in spectral deconvolution and further analysis. In order to remove this influence, a quantitative characterization of the trace water in [BMIM]+[PF6]− and [BMIM]+[BF4]− was carried out by means of UV–vis-NIR absorption spectroscopy

• and 600–800 nm, respectively, while the E11 transitions of the metallic nanotubes are of 400–650 nm [23]. As the E11 transitions of semiconducting nanotubes are of the lowest energy and do not overlap with higher energy transitions, the deconvolution of the absorption bands in this region with respect

• in the SWNTs absorption spectra, which will affect the deconvolution and quantitative analysis significantly. Therefore, treatment of the ILs under high vacuum, immediately before taking the spectra, is necessary to reduce the peaks introduced by the trace amount of water. Even so, the water bands

Deconvolution of the density of states of tip and sample through constant-current tunneling spectroscopy

• Holger Pfeifer,
• Berndt Koslowski and
• Paul Ziemann

Beilstein J. Nanotechnol. 2011, 2, 607–617, doi:10.3762/bjnano.2.64

• of characteristic DOS features change depending on parameters such as the energy position, width, barrier height, and the tip–sample separation. Then it is shown that the deconvolution scheme is capable of recovering the original DOS of tip and sample with an accuracy of better than 97% within the

• one-dimensional WKB approximation. Application of the deconvolution scheme to experimental data obtained on Nb(110) reveals a convergent behavior, providing separately the DOS of both sample and tip. In detail, however, there are systematic quantitative deviations between the DOS results based on z–V

• developing a reliable deconvolution scheme shifts the focus towards how to access the actual transmission probability function. Keywords: deconvolution; Nb DOS; STM; STS; Introduction Undoubtedly, the power of scanning tunneling microscopy (STM) is based on its capability to map the surface topology of a

Structure, morphology, and magnetic properties of Fe nanoparticles deposited onto single-crystalline surfaces

• Armin Kleibert,
• Wolfgang Rosellen,
• Mathias Getzlaff and
• Joachim Bansmann

Beilstein J. Nanotechnol. 2011, 2, 47–56, doi:10.3762/bjnano.2.6

• convolution effects in the STM which become important when the particle size is comparable or larger than the tip diameter [63]. The tip convolution in general also superimposes details of the particle shape as, e.g., surface facets. Numerical deconvolution of the STM images has been shown to provide a tool

• deconvolution as shown in Figure 4d, Figure 4e and Figure 4f. The remaining particles appear rounder or show stronger irregular tip features. The particles in Figure 4d, Figure 4e and Figure 4f show edges along certain crystallographic directions of the W(110) substrate as denoted in the figures. Thus, we

• deconvolution of the STM images reveals surface facets consistent with the random orientation as found by means of RHEED. (d)–(f): At smaller sizes (D < 4 nm) some particles show edges along different crystallographic directions of the substrate. These directions do not correspond to the simple model discussed