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Search for "ellipsometry" in Full Text gives 77 result(s) in Beilstein Journal of Nanotechnology.

Tip-enhanced Raman spectroscopic imaging of patterned thiol monolayers

  • Johannes Stadler,
  • Thomas Schmid,
  • Lothar Opilik,
  • Phillip Kuhn,
  • Petra S. Dittrich and
  • Renato Zenobi

Beilstein J. Nanotechnol. 2011, 2, 509–515, doi:10.3762/bjnano.2.55

Graphical Abstract
  • considerable Raman intensity changes, thus flat gold films are an ideal substrate to minimize the STM feedback changes and distance related artifacts. Previous studies on self-assembled thiol films were conducted using AFM [13], STM [15][24][25], XPS and Ellipsometry [26] as well as Raman spectroscopy [27][28
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Published 30 Aug 2011

Sensing surface PEGylation with microcantilevers

  • Natalija Backmann,
  • Natascha Kappeler,
  • Thomas Braun,
  • François Huber,
  • Hans-Peter Lang,
  • Christoph Gerber and
  • Roderick Y. H. Lim

Beilstein J. Nanotechnol. 2010, 1, 3–13, doi:10.3762/bjnano.1.2

Graphical Abstract
  • conformation of a surface-grafted PEG layer, and how this might influence its interfacial properties may prove beneficial towards optimizing the PEGylation process. Although techniques such as X-ray photoelectron spectroscopy (XPS) [6][7] and ellipsometry [8] have been proven powerful in terms of studying
  • chains into their swelling state. Discussion We have studied the behavior of 20 kDa mPEG–SH “grafted to” Au surfaces using a microcantilever array-based sensor. Consistent with XPS [8], ellipsometry [8][34], QCM [35] and AFM [36] polymer “grafting to” studies, we find that the adsorption profile of mPEG
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Published 22 Nov 2010
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