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Search for "ellipsometry" in Full Text gives 81 result(s) in Beilstein Journal of Nanotechnology.

Mapping mechanical properties of organic thin films by force-modulation microscopy in aqueous media

  • Jianming Zhang,
  • Zehra Parlak,
  • Carleen M. Bowers,
  • Terrence Oas and
  • Stefan Zauscher

Beilstein J. Nanotechnol. 2012, 3, 464–474, doi:10.3762/bjnano.3.53

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  • , including surface plasmon resonance (SPR) [58], quartz-crystal microbalance (QCM) [59][60][61] and ellipsometry [62]. These methods, however, do not resolve differences in the grafting density and packing of the molecules with high spatial resolution (micrometer or less). Here we show that FMM in solution
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Letter
Published 26 Jun 2012

Variations in the structure and reactivity of thioester functionalized self-assembled monolayers and their use for controlled surface modification

  • Inbal Aped,
  • Yacov Mazuz and
  • Chaim N. Sukenik

Beilstein J. Nanotechnol. 2012, 3, 213–220, doi:10.3762/bjnano.3.24

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  • unless otherwise indicated. Contact angle goniometry, spectroscopic ellipsometry, XPS, ATR–FTIR, were all carried out as previously described [11][12]. Syntheses ω-Undecenylbromide was prepared as follows: In a round-bottom flask (500 mL) equipped with a magnetic stirring bar were placed CH2Cl2 (100 mL
  • in Supporting Information File 1. Monolayer preparation Silicon wafers (for ellipsometry and ATR–FTIR measurements) and quartz wafers (for UV and XPS measurements) were cleaned and activated as previously reported [12] and used as substrates for depositing siloxane-anchored SAMs based on compounds 1
  • –4. The SAMs were characterized by contact angle, ATR–FTIR, UV–vis, ellipsometry, and XPS. These characterization tools were applied (as previously reported [12]) both on the directly deposited SAMs and on those that had been subjected to the oxidation reactions reported herein. General procedures
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Published 09 Mar 2012

Direct-write polymer nanolithography in ultra-high vacuum

  • Woo-Kyung Lee,
  • Minchul Yang,
  • Arnaldo R. Laracuente,
  • William P. King,
  • Lloyd J. Whitman and
  • Paul E. Sheehan

Beilstein J. Nanotechnol. 2012, 3, 52–56, doi:10.3762/bjnano.3.6

Graphical Abstract
  • ellipsometry). After placing the chip briefly under vacuum in a load lock chamber (~10−7 Torr), no ODT film was detectable. Additional attempts with less volatile inks – such as eicosanethiol – yielded similar results, leading us to conclude that typical inks used in conventional DPN cannot be used for DPN
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Published 19 Jan 2012

Direct monitoring of opto-mechanical switching of self-assembled monolayer films containing the azobenzene group

  • Einat Tirosh,
  • Enrico Benassi,
  • Silvio Pipolo,
  • Marcel Mayor,
  • Michal Valášek,
  • Veronica Frydman,
  • Stefano Corni and
  • Sidney R. Cohen

Beilstein J. Nanotechnol. 2011, 2, 834–844, doi:10.3762/bjnano.2.93

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  • ); ESI–MS (m/z): [M − 1]+ 365.09. Monolayer preparation Gold substrate preparation: AFM images of the different substrates are shown in Figure 8. Three types of gold substrates were used. For basic characterization of the monolayers (ellipsometry, AFM topography, XPS), a 150 nm gold film was prepared on
  • (DMF) at room temperature for 24 h. After adsorption, the samples were rinsed with pure DMF and ethanol and blown dry with nitrogen. The monolayer quality was verified by ellipsometry, X-ray photoelectron spectroscopy, and AFM. Ellipsometry Ellipsometric measurements were carried out with a variable
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Published 20 Dec 2011

Tip-enhanced Raman spectroscopic imaging of patterned thiol monolayers

  • Johannes Stadler,
  • Thomas Schmid,
  • Lothar Opilik,
  • Phillip Kuhn,
  • Petra S. Dittrich and
  • Renato Zenobi

Beilstein J. Nanotechnol. 2011, 2, 509–515, doi:10.3762/bjnano.2.55

Graphical Abstract
  • considerable Raman intensity changes, thus flat gold films are an ideal substrate to minimize the STM feedback changes and distance related artifacts. Previous studies on self-assembled thiol films were conducted using AFM [13], STM [15][24][25], XPS and Ellipsometry [26] as well as Raman spectroscopy [27][28
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Published 30 Aug 2011

Sensing surface PEGylation with microcantilevers

  • Natalija Backmann,
  • Natascha Kappeler,
  • Thomas Braun,
  • François Huber,
  • Hans-Peter Lang,
  • Christoph Gerber and
  • Roderick Y. H. Lim

Beilstein J. Nanotechnol. 2010, 1, 3–13, doi:10.3762/bjnano.1.2

Graphical Abstract
  • conformation of a surface-grafted PEG layer, and how this might influence its interfacial properties may prove beneficial towards optimizing the PEGylation process. Although techniques such as X-ray photoelectron spectroscopy (XPS) [6][7] and ellipsometry [8] have been proven powerful in terms of studying
  • chains into their swelling state. Discussion We have studied the behavior of 20 kDa mPEG–SH “grafted to” Au surfaces using a microcantilever array-based sensor. Consistent with XPS [8], ellipsometry [8][34], QCM [35] and AFM [36] polymer “grafting to” studies, we find that the adsorption profile of mPEG
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Published 22 Nov 2010
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