Search for "focused ion beam" in Full Text gives 124 result(s) in Beilstein Journal of Nanotechnology.
Beilstein J. Nanotechnol. 2016, 7, 1698–1708, doi:10.3762/bjnano.7.162
Beilstein J. Nanotechnol. 2016, 7, 1620–1641, doi:10.3762/bjnano.7.155
Beilstein J. Nanotechnol. 2016, 7, 1564–1573, doi:10.3762/bjnano.7.150
Beilstein J. Nanotechnol. 2016, 7, 1068–1074, doi:10.3762/bjnano.7.100
Beilstein J. Nanotechnol. 2016, 7, 1033–1043, doi:10.3762/bjnano.7.96
Beilstein J. Nanotechnol. 2016, 7, 914–925, doi:10.3762/bjnano.7.83
Beilstein J. Nanotechnol. 2016, 7, 733–750, doi:10.3762/bjnano.7.65
Beilstein J. Nanotechnol. 2016, 7, 637–644, doi:10.3762/bjnano.7.56
Beilstein J. Nanotechnol. 2015, 6, 2069–2077, doi:10.3762/bjnano.6.211
Beilstein J. Nanotechnol. 2015, 6, 1805–1810, doi:10.3762/bjnano.6.184
Beilstein J. Nanotechnol. 2015, 6, 1467–1484, doi:10.3762/bjnano.6.152
Beilstein J. Nanotechnol. 2015, 6, 1377–1384, doi:10.3762/bjnano.6.142
Beilstein J. Nanotechnol. 2015, 6, 1298–1305, doi:10.3762/bjnano.6.134
Beilstein J. Nanotechnol. 2015, 6, 1158–1163, doi:10.3762/bjnano.6.117
Beilstein J. Nanotechnol. 2015, 6, 1010–1015, doi:10.3762/bjnano.6.104
Beilstein J. Nanotechnol. 2015, 6, 907–918, doi:10.3762/bjnano.6.94
Beilstein J. Nanotechnol. 2015, 6, 492–498, doi:10.3762/bjnano.6.50
Beilstein J. Nanotechnol. 2015, 6, 451–461, doi:10.3762/bjnano.6.46
Beilstein J. Nanotechnol. 2015, 6, 444–450, doi:10.3762/bjnano.6.45
Beilstein J. Nanotechnol. 2015, 6, 336–342, doi:10.3762/bjnano.6.32
Beilstein J. Nanotechnol. 2014, 5, 2498–2504, doi:10.3762/bjnano.5.259
Beilstein J. Nanotechnol. 2014, 5, 1944–1965, doi:10.3762/bjnano.5.205
Beilstein J. Nanotechnol. 2014, 5, 1926–1932, doi:10.3762/bjnano.5.203
Beilstein J. Nanotechnol. 2014, 5, 1712–1724, doi:10.3762/bjnano.5.181
Beilstein J. Nanotechnol. 2014, 5, 1463–1471, doi:10.3762/bjnano.5.159