Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• frequency modulation (FM) modes; AM–AM, AM–FM, FM–FM, FM–AM [3] where first abbreviation defines a surface tracking procedure and the second – detection of the electrostatic force. It is worth noting that AM is associated with force detection and FM with force gradient detection, and this difference appears

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• applied on thin oxide films beyond imaging the topography of the surface atoms. Keywords: aluminum oxide; charge state; contact potential; defects; domain boundaries; dynamic force microscopy; frequency modulation atomic force microscopy; Kelvin probe force microscopy; magnesium oxide; non-contact atomic

• defects. Experimental setup: dual mode NC-AFM/STM The employed scanning probe microscope, i.e., a NC-AFM in combination with a STM, was optimized for surface investigation on the atomic scale with spatial resolution of some picometers. Note that NC-AFM is frequently referred to as frequency modulation