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Scanning probe microscopy and related methods

  • Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

Graphical Abstract
  • . Scanning probe microscopy (SPM) uses probing tips to map properties, such as topography, local adhesive forces, elasticity, friction or magnetic properties. In the emerging fields of nanoscience and nanotechnology these types of microscopes help to characterize the nanoworld. In addition, local probes can
  • the colleagues for their excellent contributions. Ernst Meyer Basel, December 2010 Scanning probe microscopy: A large familiy of microscopes, which have in common that they use local probes to characterize surfaces. AFM: Atomic Force MicroscopySTM: Scanning Tunneling Microscopy, PDM: Phase Detection
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Published 22 Dec 2010
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