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Search for "accelerating voltage" in Full Text gives 155 result(s) in Beilstein Journal of Nanotechnology.

Tunable magnetism on the lateral mesoscale by post-processing of Co/Pt heterostructures

  • Oleksandr V. Dobrovolskiy,
  • Maksym Kompaniiets,
  • Roland Sachser,
  • Fabrizio Porrati,
  • Christian Gspan,
  • Harald Plank and
  • Michael Huth

Beilstein J. Nanotechnol. 2015, 6, 1082–1090, doi:10.3762/bjnano.6.109

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  • with a CS probe corrector (DCOR) was used. The TEM was equipped with a X-FEG high-brightness electron gun, the high-end post-column electron energy filter Quantum ERSTM from Gatan, and four high sensitivity SDD X-ray detectors from Bruker (Super-X). The measurements were performed at an accelerating
  • voltage of 300 kV with an electron probe diameter smaller than 1 Å. Before the TEM measurements, sample C was covered with a 300 nm thick protective Pt–C layer deposited by FEBID. The pixel time for the energy-dispersive X-ray cross-sectional line scan (cross-sectional EDX) was 8 seconds per spectrum and
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Published 29 Apr 2015

Patterning technique for gold nanoparticles on substrates using a focused electron beam

  • Takahiro Noriki,
  • Shogo Abe,
  • Kotaro Kajikawa and
  • Masayuki Shimojo

Beilstein J. Nanotechnol. 2015, 6, 1010–1015, doi:10.3762/bjnano.6.104

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  • irradiation Focused electron beam irradiation on the gold particle-covered substrate was carried out using a SEM equipped with a field emission gun. The accelerating voltage of the electron beam was 15 kV. For a line scan, the irradiation time was about 2 s for each particle. For the L-shaped and rectangular
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Published 22 Apr 2015

Structure and mechanism of the formation of core–shell nanoparticles obtained through a one-step gas-phase synthesis by electron beam evaporation

  • Andrey V. Nomoev,
  • Sergey P. Bardakhanov,
  • Makoto Schreiber,
  • Dashima G. Bazarova,
  • Nikolai A. Romanov,
  • Boris B. Baldanov,
  • Bair R. Radnaev and
  • Viacheslav V. Syzrantsev

Beilstein J. Nanotechnol. 2015, 6, 874–880, doi:10.3762/bjnano.6.89

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  • electron microscopy (TEM), high-resolution TEM (HRTEM), selective area electron diffraction (SAED), and energy dispersive X-ray fluorescence (EDX) analysis. These measurements were performed on a JEM-2010 TEM (JEOL, Japan, 200 kV accelerating voltage, 0.14 nm resolution) equipped with an EDX (EDAX Co
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Published 31 Mar 2015

Mapping of elasticity and damping in an α + β titanium alloy through atomic force acoustic microscopy

  • M. Kalyan Phani,
  • Anish Kumar,
  • T. Jayakumar,
  • Walter Arnold and
  • Konrad Samwer

Beilstein J. Nanotechnol. 2015, 6, 767–776, doi:10.3762/bjnano.6.79

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  • microstructure, an electron back-scatter diffraction (EBSD) study was performed using a Zeiss SUPRA 55 Gemini field emission gun (FEG) scanning electron microscope (SEM) at an accelerating voltage of 20 kV, an aperture of 120 μm, a working distance of 16 mm, a tilt angle of 70° and a specimen–detector distance
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Published 18 Mar 2015

Self-assembled anchor layers/polysaccharide coatings on titanium surfaces: a study of functionalization and stability

  • Ognen Pop-Georgievski,
  • Dana Kubies,
  • Josef Zemek,
  • Neda Neykova,
  • Roman Demianchuk,
  • Eliška Mázl Chánová,
  • Miroslav Šlouf,
  • Milan Houska and
  • František Rypáček

Beilstein J. Nanotechnol. 2015, 6, 617–631, doi:10.3762/bjnano.6.63

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  • performed on a Quanta 200 FEG (FEI, Czech Republic) microscope. All micrographs presented are secondary electron images taken under high vacuum using an accelerating voltage of 30 kV. X-ray photoelectron spectroscopy (XPS): The core-level photoelectron spectra were recorded using an angle-resolved
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Published 02 Mar 2015

Palladium nanoparticles anchored to anatase TiO2 for enhanced surface plasmon resonance-stimulated, visible-light-driven photocatalytic activity

  • Kah Hon Leong,
  • Hong Ye Chu,
  • Shaliza Ibrahim and
  • Pichiah Saravanan

Beilstein J. Nanotechnol. 2015, 6, 428–437, doi:10.3762/bjnano.6.43

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  • . Characterization The morphology of the samples were investigated by field emission scanning electron microscopy (FESEM, Hitachi SU-8000) equipped with an energy dispersive X-ray spectrometer (EDS, Zeiss Auriga). The images were taken at an accelerating voltage of 20 kV. High resolution transmission electron
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Published 11 Feb 2015

Nanoporous Ge thin film production combining Ge sputtering and dopant implantation

  • Jacques Perrin Toinin,
  • Alain Portavoce,
  • Khalid Hoummada,
  • Michaël Texier,
  • Maxime Bertoglio,
  • Sandrine Bernardini,
  • Marco Abbarchi and
  • Lee Chow

Beilstein J. Nanotechnol. 2015, 6, 336–342, doi:10.3762/bjnano.6.32

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  • ]. SEM images were performed using a FEI Helios 600 Nanolab microscope in the secondary electron (SE) mode with an accelerating voltage of 5 kV, using either an Everhart–Thornley Detector (ETD) located below the objective lens for imaging at low magnifications, or using a through lens detector (TLD
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Published 30 Jan 2015

Comparative evaluation of the impact on endothelial cells induced by different nanoparticle structures and functionalization

  • Lisa Landgraf,
  • Ines Müller,
  • Peter Ernst,
  • Miriam Schäfer,
  • Christina Rosman,
  • Isabel Schick,
  • Oskar Köhler,
  • Hartmut Oehring,
  • Vladimir V. Breus,
  • Thomas Basché,
  • Carsten Sönnichsen,
  • Wolfgang Tremel and
  • Ingrid Hilger

Beilstein J. Nanotechnol. 2015, 6, 300–312, doi:10.3762/bjnano.6.28

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  • ) at an accelerating voltage 80 kV. Incubation of cells in the presence of selected drugs inhibiting specific metabolic pathways Effects of GNP and asymmetric Janus particles on total cellular ATP level and uptake in the presence of selective drugs blocking specific metabolic pathways associated with
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Published 27 Jan 2015

Anticancer efficacy of a supramolecular complex of a 2-diethylaminoethyl–dextran–MMA graft copolymer and paclitaxel used as an artificial enzyme

  • Yasuhiko Onishi,
  • Yuki Eshita,
  • Rui-Cheng Ji,
  • Masayasu Onishi,
  • Takashi Kobayashi,
  • Masaaki Mizuno,
  • Jun Yoshida and
  • Naoji Kubota

Beilstein J. Nanotechnol. 2014, 5, 2293–2307, doi:10.3762/bjnano.5.238

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  • scattering and (b) particle electrophoretic mobility measurements. (c) A Scanning electron microscopic image (HITACHI S-4800) of the freeze-dried DDMC–paclitaxel complex taken at an accelerating voltage of 5 kV. (a): Reprinted from [24]. Anticancer efficacy of a supramolecular complex against PTX-resistant
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Published 01 Dec 2014

Nanocrystalline ceria coatings on solid oxide fuel cell anodes: the role of organic surfactant pretreatments on coating microstructures and sulfur tolerance

  • Chieh-Chun Wu,
  • Ling Tang and
  • Mark R. De Guire

Beilstein J. Nanotechnol. 2014, 5, 1712–1724, doi:10.3762/bjnano.5.181

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  • carefully peeled from the electrodes before analysis. Cell characterization Scanning electron microscope (SEM) images of the anodes were taken (FEI xT Nova Nanolab) at 5 kV accelerating voltage. Energy-dispersive X-ray spectroscopy (EDXS) mapping at beam energy of 15 keV, combined with SEM images, was used
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Published 06 Oct 2014

Surface topography and contact mechanics of dry and wet human skin

  • Alexander E. Kovalev,
  • Kirstin Dening,
  • Bo N. J. Persson and
  • Stanislav N. Gorb

Beilstein J. Nanotechnol. 2014, 5, 1341–1348, doi:10.3762/bjnano.5.147

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  • obtained by using a Hitachi TM3000 tabletop electron microscope (Hitachi High-Technologies Corp., Tokyo, Japan) at an accelerating voltage of 3 kV (Figure 1). 3D surface profiles of the positive replicas were acquired by using a white light interferometer NewView 6k (Zygo, Middlefield, CT, USA) with 5× and
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Published 22 Aug 2014

A nanometric cushion for enhancing scratch and wear resistance of hard films

  • Katya Gotlib-Vainshtein,
  • Olga Girshevitz,
  • Chaim N. Sukenik,
  • David Barlam and
  • Sidney R. Cohen

Beilstein J. Nanotechnol. 2014, 5, 1005–1015, doi:10.3762/bjnano.5.114

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  • was assessed by SEM (Inspect, FEI), at an accelerating voltage of 30 kV with surface gold coatings of approximately 10 nm thickness. Rutherford backscattering spectrometry (RBS). The thicknesses of the TiO2 layers were measured by Rutherford backscattering spectrometry (RBS). This work was done using
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Published 10 Jul 2014

Optimizing the synthesis of CdS/ZnS core/shell semiconductor nanocrystals for bioimaging applications

  • Li-wei Liu,
  • Si-yi Hu,
  • Ying Pan,
  • Jia-qi Zhang,
  • Yue-shu Feng and
  • Xi-he Zhang

Beilstein J. Nanotechnol. 2014, 5, 919–926, doi:10.3762/bjnano.5.105

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  • report using CdS/ZnS QDs as luminescence probes for bioimaging. Results and Discussion Characterization of QDs Sizes and structure of the QDs were determined by using a JEOL JEM-100cx transmission electron microscope with an accelerating voltage of 80 kV. Transmission electron microscopy (TEM) images
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Published 27 Jun 2014

Pyrite nanoparticles as a Fenton-like reagent for in situ remediation of organic pollutants

  • Carolina Gil-Lozano,
  • Elisabeth Losa-Adams,
  • Alfonso F.-Dávila and
  • Luis Gago-Duport

Beilstein J. Nanotechnol. 2014, 5, 855–864, doi:10.3762/bjnano.5.97

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  • transmission electron microscopy (HR-TEM), selected area electron diffraction (SAED) and X-ray diffraction (XRD). The TEM studies were done on a JEOL JEM-3011 microscope with accelerating voltage of 200 kV. The XRD analysis of the nanoparticles and the microparticles was done on a Philips diffractometer with a
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Published 16 Jun 2014

Effects of the preparation method on the structure and the visible-light photocatalytic activity of Ag2CrO4

  • Difa Xu,
  • Shaowen Cao,
  • Jinfeng Zhang,
  • Bei Cheng and
  • Jiaguo Yu

Beilstein J. Nanotechnol. 2014, 5, 658–666, doi:10.3762/bjnano.5.77

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  • with ethanol and water, and then dried at 70 °C for 4 h. Characterization The XRD were recorded on an X-ray diffractometer (type HZG41BPC) with Cu Kα irradiation source at a scan rate (2θ) of 0.05°·s−1. The accelerating voltage and applied current were 40 kV and 80 mA, respectively. The morphology
  • observation was carried out by SEM (S4800, Hitachi, Japan) at an accelerating voltage of 5 kV. TEM and HRTEM analysis were conducted by the transmission electron microscopy (JEM-2100F, JEOL, Japan) at an accelerating voltage of 200 kV. The DRS were taken with a UV–vis spectrophotometer (UV2550, Shimadzu
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Published 19 May 2014

High activity of Ag-doped Cd0.1Zn0.9S photocatalyst prepared by the hydrothermal method for hydrogen production under visible-light irradiation

  • Leny Yuliati,
  • Melody Kimi and
  • Mustaffa Shamsuddin

Beilstein J. Nanotechnol. 2014, 5, 587–595, doi:10.3762/bjnano.5.69

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  • ). The morphologies and size of the samples were observed by using field emission scanning electron microscopy (FESEM) with JEOL JSM 6701F at an accelerating voltage of 2 kV with platinum coating prior to analysis. DR UV–vis spectra were recorded at room temperature using a UV–visible spectrometer
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Published 07 May 2014

One-step synthesis of high quality kesterite Cu2ZnSnS4 nanocrystals – a hydrothermal approach

  • Vincent Tiing Tiong,
  • John Bell and
  • Hongxia Wang

Beilstein J. Nanotechnol. 2014, 5, 438–446, doi:10.3762/bjnano.5.51

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  • a JEOL JEM-1400 microscope. High-resolution TEM (HRTEM) and selected area electron diffraction (SAED) images were obtained using JEOL JEM-2100 microscope at an accelerating voltage of 200 kV. Ultraviolet–visible (UV–vis) absorption spectrum of the sample was measured at room temperature using a
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Published 09 Apr 2014

Dye-sensitized Pt@TiO2 core–shell nanostructures for the efficient photocatalytic generation of hydrogen

  • Jun Fang,
  • Lisha Yin,
  • Shaowen Cao,
  • Yusen Liao and
  • Can Xue

Beilstein J. Nanotechnol. 2014, 5, 360–364, doi:10.3762/bjnano.5.41

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  • scanning electron microscopy (SEM, JEOL JSM-7600F) with energy-dispersive X-ray analysis system and transmission electron microscopy (TEM, JEOL JEM-2100) at an accelerating voltage at 200 kV. Photocatalytic generation of H2 with erythrosin B-sensitized Pt@TiO2 core–shell particles: In a typical run, 5 mg
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Published 26 Mar 2014

En route to controlled catalytic CVD synthesis of densely packed and vertically aligned nitrogen-doped carbon nanotube arrays

  • Slawomir Boncel,
  • Sebastian W. Pattinson,
  • Valérie Geiser,
  • Milo S. P. Shaffer and
  • Krzysztof K. K. Koziol

Beilstein J. Nanotechnol. 2014, 5, 219–233, doi:10.3762/bjnano.5.24

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  • Exeter Analytical CE-440 CHN Elemental Analyzer. A JEOL 6340F FEG SEM was used with an accelerating voltage of 5 kV. A secondary electron imaging (SEI) detector was used in all cases. TEM imaging of nanotube samples was performed on JEOL 200CX (tungsten filament, operated at 200 kV), JEOL 2000FX (LaB6
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Published 03 Mar 2014

Photovoltaic properties of ZnO nanorods/p-type Si heterojunction structures

  • Rafal Pietruszka,
  • Bartlomiej S. Witkowski,
  • Grzegorz Luka,
  • Lukasz Wachnicki,
  • Sylwia Gieraltowska,
  • Krzysztof Kopalko,
  • Eunika Zielony,
  • Piotr Bieganski,
  • Ewa Placzek-Popko and
  • Marek Godlewski

Beilstein J. Nanotechnol. 2014, 5, 173–179, doi:10.3762/bjnano.5.17

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  • solar cell structures were characterized by a Scanning Electron Microscope Hitachi SU-70 with an accelerating voltage of 15 kV. PV response was measured by using current–voltage (I–V) curve tracer for fast I–V measurements with a sun simulator cl. AAA, at an illumination irradiance of 100 mW/cm2
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Published 14 Feb 2014

Preparation of NiS/ZnIn2S4 as a superior photocatalyst for hydrogen evolution under visible light irradiation

  • Liang Wei,
  • Yongjuan Chen,
  • Jialin Zhao and
  • Zhaohui Li

Beilstein J. Nanotechnol. 2013, 4, 949–955, doi:10.3762/bjnano.4.107

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  • Bruker D8 Advance X-ray diffractometer with Cu Kα radiation. The transmission electron microscopy (TEM) and high-resolution transmission electron microscopy (HRTEM) images were measured by a JEOL model JEM 2010 EX instrument at an accelerating voltage of 200 kV. The powder particles were supported on a
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Published 23 Dec 2013

Cytotoxic and proinflammatory effects of PVP-coated silver nanoparticles after intratracheal instillation in rats

  • Nadine Haberl,
  • Stephanie Hirn,
  • Alexander Wenk,
  • Jörg Diendorf,
  • Matthias Epple,
  • Blair D. Johnston,
  • Fritz Krombach,
  • Wolfgang G. Kreyling and
  • Carsten Schleh

Beilstein J. Nanotechnol. 2013, 4, 933–940, doi:10.3762/bjnano.4.105

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  • (ultrasound bath). Scanning electron microscopy (SEM) was performed with an ESEM Quanta 400 instrument with gold/palladium-sputtered samples. Transmission electron microscopic (TEM) was carried out with a CM200 FEG-Instrument (Philips) with a Supertwin lens, operated at an accelerating voltage of 200 keV. The
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Published 19 Dec 2013

Synthesis of boron nitride nanotubes from unprocessed colemanite

  • Saban Kalay,
  • Zehra Yilmaz and
  • Mustafa Çulha

Beilstein J. Nanotechnol. 2013, 4, 843–851, doi:10.3762/bjnano.4.95

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  • coated with a few nm thick gold-layers by using a Baltec SDC 005 sputter-coater. Scanning electron microscopy (SEM) images were obtained by using a Carl Zeis Evo-40 instrument under high vacuum with an accelerating voltage of 10 kV. Raman spectroscopy All Raman Spectroscopic measurements were performed
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Published 04 Dec 2013

AFM as an analysis tool for high-capacity sulfur cathodes for Li–S batteries

  • Renate Hiesgen,
  • Seniz Sörgel,
  • Rémi Costa,
  • Linus Carlé,
  • Ines Galm,
  • Natalia Cañas,
  • Brigitta Pascucci and
  • K. Andreas Friedrich

Beilstein J. Nanotechnol. 2013, 4, 611–624, doi:10.3762/bjnano.4.68

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  • Gemini (Zeiss) and AFM with a Multimode 8 Bruker system. XRD measurement of Li2S in air X-ray diffractograms (Figure 3) were measured in reflection mode with an X-ray diffractometer (D8 Discover GADDS) equipped with a VÅNTEC-2000 areal detector. Exposures were made with an accelerating voltage of 45 kV
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Published 04 Oct 2013

Ferromagnetic behaviour of Fe-doped ZnO nanograined films

  • Boris B. Straumal,
  • Svetlana G. Protasova,
  • Andrei A. Mazilkin,
  • Thomas Tietze,
  • Eberhard Goering,
  • Gisela Schütz,
  • Petr B. Straumal and
  • Brigitte Baretzky

Beilstein J. Nanotechnol. 2013, 4, 361–369, doi:10.3762/bjnano.4.42

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  • -on transmission electron microscopy (TEM) and EPMA. TEM investigations were carried out on a Jeol JEM–4000FX microscope at an accelerating voltage of 400 kV. X-ray diffraction (XRD) data were obtained on a Siemens diffractometer (Cu Kα radiation). Evaluation of the grain size D from the X-ray peak
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Published 13 Jun 2013
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