Annealing-induced recovery of indents in thin Au(Fe) bilayer films

• Anna Kosinova,
• Ruth Schwaiger,
• Leonid Klinger and
• Eugen Rabkin

Beilstein J. Nanotechnol. 2016, 7, 2088–2099, doi:10.3762/bjnano.7.199

• ) on the Au (111) reflection. Cross-section samples were prepared in a dual-beam focused ion beam microscope (FIB; FEI Strata 400-S). Appendix Topography evolution of an axisymmetrical indent by surface diffusion (small slope approximation) To check whether surface diffusion alone can lead to indent

Fundamental properties of high-quality carbon nanofoam: from low to high density

• Natalie Frese,
• Shelby Taylor Mitchell,
• Christof Neumann,
• Amanda Bowers,
• Armin Gölzhäuser and
• Klaus Sattler

Beilstein J. Nanotechnol. 2016, 7, 2065–2073, doi:10.3762/bjnano.7.197

• under investigation using an electro-optical lens system. The image is then provided either by ionoluminescence [26], Rutherford backscattering of the ions [27], or secondary electron emission [28]. The high resolution is given by the small subsurface ion beam spread [29]. The instrument is suitable for

Nanostructured SnO₂–ZnO composite gas sensors for selective detection of carbon monoxide

• Paul Chesler,
• Cristian Hornoiu,
• Susana Mihaiu,
• Cristina Vladut,
• Jose Maria Calderon Moreno,
• Mihai Anastasescu,
• Carmen Moldovan,
• Bogdan Firtat,
• Costin Brasoveanu,
• George Muscalu,
• Ion Stan and
• Mariuca Gartner

Beilstein J. Nanotechnol. 2016, 7, 2045–2056, doi:10.3762/bjnano.7.195

• ]. However, the addition of another oxide component described in these papers involves complicated and expensive vapor preparation techniques (e.g., chemical vapor deposition (CVD) or physical vapor deposition (PVD), ion-beam or laser-assisted techniques, spray pyrolysis), expensive dedicated equipment (e.g

Numerical investigation of depth profiling capabilities of helium and neon ions in ion microscopy

• Patrick Philipp,
• Lukasz Rzeznik and
• Tom Wirtz

Beilstein J. Nanotechnol. 2016, 7, 1749–1760, doi:10.3762/bjnano.7.168

• polymer sample. The ion beam induces chemical and structural modifications in the polymers, chain scission and bond breaking as well as crosslinking depending on the chemical composition and the structure of the polymer chain [7]. In general, heterocyclic groups are more resistant to electron excitation

Thickness-modulated tungsten–carbon superconducting nanostructures grown by focused ion beam induced deposition for vortex pinning up to high magnetic fields

• Ismael García Serrano,
• Javier Sesé,
• Isabel Guillamón,
• Hermann Suderow,
• Sebastián Vieira,
• Manuel Ricardo Ibarra and
• José María De Teresa

Beilstein J. Nanotechnol. 2016, 7, 1698–1708, doi:10.3762/bjnano.7.162

• Materiales de Aragón (ICMA), CSIC - Universidad de Zaragoza, 50009 Zaragoza, Spain 10.3762/bjnano.7.162 Abstract We report efficient vortex pinning in thickness-modulated tungsten–carbon-based (W–C) nanostructures grown by focused ion beam induced deposition (FIBID). By using FIBID, W–C superconducting

• pinning potentials, maximizing the opportunities for the investigation of fundamental aspects in vortex science under changing external stimuli (e.g., temperature, magnetic field, electrical current). Keywords: focused ion beam induced deposition; magnetotransport; superconductivity; vortex lattice

• ; Introduction In focused electron/ion beam induced deposition (FEBID/FIBID), a precursor molecule is dissociated by a focused electron/ion beam, producing the local growth of a deposit in a single step and with the shape determined by the electron/ion beam scan [1][2][3][4]. Materials grown by FEBID/FIBID can

Nanoanalytics for materials science

• Thilo Glatzel and
• Tom Wirtz

Beilstein J. Nanotechnol. 2016, 7, 1674–1675, doi:10.3762/bjnano.7.159

• included in both the device structures and detection techniques. A typical setup includes a probe (such as tip, ion beam or electron beam), the condition of the sample and the interaction between them, which all need to be extensively investigated by simulations and modeling in order to obtain an in-depth

Nano- and microstructured materials for in vitro studies of the physiology of vascular cells

• Alexandra M. Greiner,
• Adria Sales,
• Hao Chen,
• Sarah A. Biela,
• Dieter Kaufmann and
• Ralf Kemkemer

Beilstein J. Nanotechnol. 2016, 7, 1620–1641, doi:10.3762/bjnano.7.155

• lithography [66]), etching (focused-ion beam [67] and electron-beam nanolithography [68]), electrical (electrospinning [69][70][71][72]), mechanical (nanoskiving [46][73], nanoimprint lithography [66]) and colloidal (colloidal lithgraphy [74][75]) are given here. Nanoscale optical photolithography takes

• techniques [76]. In UV-NIL, the mold is brought into contact with a wafer previously coated with photoresist and solidified with UV light. A resolution of 30 nm can be achieved [77]. Focused-ion beam nanolithography relies on a beam of ions to locally modify a surface coating, to mill a substrate or to

• focused-ion beam nanolithography it is also possible to deposit materials. The desired material to deposit is in the gas phase and it is let to adsorb on the surface. Afterwards, the ion beam decomposes the adsorbed molecules into a volatile component and a non-volatile component. The non-volatile

Graphene-enhanced plasmonic nanohole arrays for environmental sensing in aqueous samples

• Christa Genslein,
• Peter Hausler,
• Eva-Maria Kirchner,
• Rudolf Bierl,
• Antje J. Baeumner and
• Thomas Hirsch

Beilstein J. Nanotechnol. 2016, 7, 1564–1573, doi:10.3762/bjnano.7.150

• arrays have been first fabricated 1995 by Masuda and Fukuda using a replication process of an anodized alumina structure [23]. Since then, a vast number of techniques has been invented. For example, as focused ion beam (FBI) milling allows a control of the size and shape of the nanoholes with good

Dynamic of cold-atom tips in anharmonic potentials

• Tobias Menold,
• Peter Federsel,
• Carola Rogulj,
• Hendrik Hölscher,
• József Fortágh and
• Andreas Günther

Beilstein J. Nanotechnol. 2016, 7, 1543–1555, doi:10.3762/bjnano.7.148

• approximated plane [51]. The outcoupled atoms leave the trap and become ionized via a three-photon ionization process. The resulting ion beam is captured and guided by an ion optics [55] and finally detected by a channel electron multiplier (CEM) [56][57], yielding single-atom resolution. While individual

• leave the trap and become ionized via a three-photon ionization process with lasers at 778 nm and 1064 nm. The resulting ion beam is captured and guided by ion optics [55] (not shown) and finally detected by a channel electron multiplier (CEM) [56][57]. Individual ions are detected with temporal

Dealloying of gold–copper alloy nanowires: From hillocks to ring-shaped nanopores

• Adrien Chauvin,
• Cyril Delacôte,
• Mohammed Boujtita,
• Benoit Angleraud,
• Junjun Ding,
• Chang-Hwan Choi,
• Pierre-Yves Tessier and
• Abdel-Aziz El Mel

Beilstein J. Nanotechnol. 2016, 7, 1361–1367, doi:10.3762/bjnano.7.127

• [6][7]. The formation of hillocks has been encountered in case of various processes such as evaporation and sputtering [7][8][9], ion beam assisted deposition (IBAD) [10][11], chemical vapor deposition (CVD) [12][13] and electroplating [14]. Hillocks are the outcome of a nodular growth taking place

Experimental and simulation-based investigation of He, Ne and Ar irradiation of polymers for ion microscopy

• Lukasz Rzeznik,
• Yves Fleming,
• Tom Wirtz and
• Patrick Philipp

Beilstein J. Nanotechnol. 2016, 7, 1113–1128, doi:10.3762/bjnano.7.104

• ion source from Cameca [49], For the generation of the He+ primary ion current, a 20:80 percent Ne/He gas mixture was needed. The He+ and Ne+ beam were then selected using the magnetic sector on the primary column. As stated in [50], the primary ion beam current (20–100 nA) and diameter (25–100 µm

• ) depended on the primary ion species. Irradiation of polymer samples was performed with 5.5 and 14.5 keV Ne+ and He+ primary ions, resulting in 25° and 36° incidence with respect to the surface normal. The primary ion beam was raster-scanned over a surface of 250 × 250 μm2. On the PS and PMMA samples, the

Customized MFM probes with high lateral resolution

• Óscar Iglesias-Freire,
• Miriam Jaafar,
• Eider Berganza and
• Agustina Asenjo

Beilstein J. Nanotechnol. 2016, 7, 1068–1074, doi:10.3762/bjnano.7.100

• , either by using focused ion beam (FIB) milled tips [1][2], electron beam deposited tips [3][4] or stencil-deposited metal dots onto an AFM tip [5]. Following a different approach, probes with carbon nanotubes (CNTs) have been fabricated for MFM imaging either by mechanical attachment [6][7][8] or direct

Role of solvents in the electronic transport properties of single-molecule junctions

• Katharina Luka-Guth,
• Sebastian Hambsch,
• Andreas Bloch,
• Philipp Ehrenreich,
• Bernd Michael Briechle,
• Filip Kilibarda,
• Torsten Sendler,
• Dmytro Sysoiev,
• Thomas Huhn,
• Artur Erbe and
• Elke Scheer

Beilstein J. Nanotechnol. 2016, 7, 1055–1067, doi:10.3762/bjnano.7.99

• Katharina Luka-Guth Sebastian Hambsch Andreas Bloch Philipp Ehrenreich Bernd Michael Briechle Filip Kilibarda Torsten Sendler Dmytro Sysoiev Thomas Huhn Artur Erbe Elke Scheer Physics Department, University of Konstanz, D-78457 Konstanz, Germany Institute of Ion Beam Physics and Materials Research

Signal enhancement in cantilever magnetometry based on a co-resonantly coupled sensor

• Julia Körner,
• Christopher F. Reiche,
• Thomas Gemming,
• Bernd Büchner,
• Gerald Gerlach and
• Thomas Mühl

Beilstein J. Nanotechnol. 2016, 7, 1033–1043, doi:10.3762/bjnano.7.96

• (≈10−5 mbar). First, the cantilever was shortened via focused ion beam milling to increase its resonance frequency. This step also increased the stiffness of the cantilever to about 133.8 N/m (see Table 1) which is rather high compared to typical values in cantilever magnetometry. In a second step, an

Large-scale fabrication of achiral plasmonic metamaterials with giant chiroptical response

• Morten Slyngborg,
• Yao-Chung Tsao and
• Peter Fojan

Beilstein J. Nanotechnol. 2016, 7, 914–925, doi:10.3762/bjnano.7.83

• beam lithography or focused ion beam milling, which both are expensive and time consuming methods. Large-scale fabrication of PCMs have been attempted to some degree applying different approaches such as glancing angle deposition [28], scaffold ornamentation [29][30], individual chiral nanoparticles

• CD response at = 0° has also been observed by ECMs produced with focused ion beam milling [13]. The ECM property that allows for the measurement of the enantiomeric structures from one sample, yields several advantages over PCMs in biosensor applications: 1) PCMs require fabrication of the two

• broad signal [13]. This is presumably related to the heterogeneity and 3D nature of the ECM structures, which is less dominant in the hole arrays fabricated by focused ion beam lithography. In spite of this, the CD linewidths of the present ECMs are comparable to those of gammadion PCMs, which have been

Efficient electron-induced removal of oxalate ions and formation of copper nanoparticles from copper(II) oxalate precursor layers

• Kai Rückriem,
• Sarah Grotheer,
• Henning Vieker,
• Paul Penner,
• André Beyer,
• Armin Gölzhäuser and
• Petra Swiderek

Beilstein J. Nanotechnol. 2016, 7, 852–861, doi:10.3762/bjnano.7.77

• with a Carl Zeiss Orion Plus®. The helium ion beam was operated at acceleration voltages between 34 and 35 kV and at currents between 0.2 and 0.3 pA. The working distance was about 11 mm at a sample tilt of 30°. Secondary electrons were collected by an Everhart–Thornley detector at 500 V grid voltage

Microscopic characterization of Fe nanoparticles formed on SrTiO₃(001) and SrTiO₃(110) surfaces

• Miyoko Tanaka

Beilstein J. Nanotechnol. 2016, 7, 817–824, doi:10.3762/bjnano.7.73

• structure is also reported with samples annealed in UHV at comparatively low temperatures [34][35][36] and matches with our results. However, crystal deformation presumably due to ion-beam thinning is also observed in our case [25]. When Fe was deposited on these surfaces, Fe nanoparticles of similar sizes

• with local depletion of O−, which was caused during sample preparation by ion-beam bombardment and UHV annealing. These surface charges, which induce an electric field variation at the interface, could affect the local interfacial reactivity [64][65] and hence the position of each deposited atom. It is

Magnetic switching of nanoscale antidot lattices

• Ulf Wiedwald,
• Joachim Gräfe,
• Kristof M. Lebecki,
• Maxim Skripnik,
• Felix Haering,
• Gisela Schütz,
• Paul Ziemann,
• Eberhard Goering and
• Ulrich Nowak

Beilstein J. Nanotechnol. 2016, 7, 733–750, doi:10.3762/bjnano.7.65

• – into thin films. Such antidots act as an inner surface of the materials leading to strong variations of optical [1][2], electrical [3][4], superconducting [5][6], or magnetic properties [7]. Nowadays, top-down approaches like e-beam lithography [8][9] or focused ion beam milling (FIB) [10] and bottom

Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

• Christian Ganser,
• Gerhard Fritz-Popovski,
• Roland Morak,
• Parvin Sharifi,
• Benedetta Marmiroli,
• Barbara Sartori,
• Heinz Amenitsch,
• Thomas Griesser,
• Christian Teichert and
• Oskar Paris

Beilstein J. Nanotechnol. 2016, 7, 637–644, doi:10.3762/bjnano.7.56

• actuation experiment was prepared with focused ion beam (FIB) cutting using an AURIGA Crossbeam Workstation (Zeiss). Scanning electron microscopy (SEM) images of the sample cross-section were taken with the same instrument with the electron microscope operated at a voltage of 2 keV. GISAXS: measurements and

Hydration of magnesia cubes: a helium ion microscopy study

• Ruth Schwaiger,
• Johannes Schneider,
• Gilles R. Bourret and
• Oliver Diwald

Beilstein J. Nanotechnol. 2016, 7, 302–309, doi:10.3762/bjnano.7.28

• , for both types of samples (i.e., when the indium foil was used as received or subjected to vacuum drying prior to imaging). The cubes selected for the measurements had an estimated maximum tilt angle of 30° relative to the incident ion beam. This does not change the edge length increase factor (L2/L1

• not be avoided. In addition, fluctuations in the beam current may have occurred. However, the contrast changes observed may also be indicative of chemical modifications; since SEs in the HIM are generated almost exclusively from the primary ion beam, they carry information about the surface chemistry

Nanoscale rippling on polymer surfaces induced by AFM manipulation

• Mario D’Acunto,
• Franco Dinelli and
• Pasqualantonio Pingue

Beilstein J. Nanotechnol. 2015, 6, 2278–2289, doi:10.3762/bjnano.6.234

• behavior can be obtained by sliding loads on unpaved roads, ski slopes and rail tracks. Similarly, ion-beam sputtering on metal or semiconductor substrates can produce ripples on the microscale and nanoscale. The first example, reported in the literature, showed that low energy ion erosion of glass

• patterns can be tuned by varying the energy of the ions and ranges from a few tens of nanometers up to a few micrometers, with ion beam energies ranging from 0.1 to 100 keV. In particular two types of patterns are observed: ripples oriented either parallel or perpendicular to the direction of the ion beam

Near-field visualization of plasmonic lenses: an overall analysis of characterization errors

• Jing Wang,
• Yongqi Fu,
• Zongwei Xu and
• Fengzhou Fang

Beilstein J. Nanotechnol. 2015, 6, 2069–2077, doi:10.3762/bjnano.6.211

• elliptical slits. The focusing performance of the structures was studied before [22]. The structures can be fabricated and measured by using focused ion beam (FIB) direct writing technique and near-field scanning optical microscope (NSOM) respectively, as shown in Figure 1. However, from the point of view of

• the sample, and θ is the tilt angle of the sample. FIB nanofabrication error Stigmation Stigmation is generated in the ion column of the FIB machine due to asymmetrical voltage applied on the stigmator consisting of octopole electrodes. The ion beam is distorted due to the asymmetrical voltage

• distribution on the electrodes. The energy spreading is asymmetrical and produces an elliptical spot of the ion beam instead of the normal circular spot. Theoretically, it can be expressed as Equation 1 [28]: where B is the magnetic field, q is the velocity of an ion, M is the mass, V is the accelerating

Focused particle beam-induced processing

• Michael Huth and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2015, 6, 1883–1885, doi:10.3762/bjnano.6.191

• direction, Yuri Petrov and Oleg Vyvenko have exploited reflected helium ions for high-resolution imaging with “chemical contrast” [11]. Hongzhou Zhang and coworkers have utilized a focused helium ion beam to modify and mill thin silicon foils [12], which constitutes pioneering work in HIM towards

Surface engineering of nanoporous substrate for solid oxide fuel cells with atomic layer-deposited electrolyte

• Sanghoon Ji,
• Waqas Hassan Tanveer,
• Wonjong Yu,
• Sungmin Kang,
• Gu Young Cho,
• Sung Han Kim,
• Jihwan An and
• Suk Won Cha

Beilstein J. Nanotechnol. 2015, 6, 1805–1810, doi:10.3762/bjnano.6.184

• deposited on BECs with different thicknesses, whose cross-sectional microstructure was investigated by focused ion beam and field emission scanning electron microscopy (FIB/FE-SEM) imaging: the BECs were 40 nm and 320 nm in thickness. In case of the thinner BEC, a significant amount of ALD YSZ certainly

• -deposited (ALD) yttria-stabilized zirconia (YSZ) electrolyte and 60 nm-thick top electrode catalyst (sputtered porous Pt cathode). (A) Focused ion beam-prepared field emission scanning electron microscopy (FE-SEM) cross-sectional images for 50 nm-thick ALD YSZ films deposited on 80 nm pore AAO supported 40

Lower nanometer-scale size limit for the deformation of a metallic glass by shear transformations revealed by quantitative AFM indentation

• Arnaud Caron and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2015, 6, 1721–1732, doi:10.3762/bjnano.6.176

• metallic glass samples and relate them to our results. We will then discuss alternative concepts leading to homogeneous flow and finally the role of strain rates. The investigation of the plastic flow of micro- and nano-fabricated test samples prepared from metallic glasses by focus ion beam (FIB) with