Quantitative wear evaluation of tips based on sharp structures

• Ke Xu and
• Houwen Leng

Beilstein J. Nanotechnol. 2024, 15, 230–241, doi:10.3762/bjnano.15.22

• . Orji et al. [14] utilized a transmission electron microscope (TEM) to image a tip and derived its tapered shape from the TEM image. Electron microscopic observation offers the advantages of high precision and resolution, enabling accurate acquisition of morphological information about the tip. However

Ion beam processing of DNA origami nanostructures

• Leo Sala,
• Agnes Zerolová,
• Violaine Vizcaino,
• Alain Mery,
• Alicja Domaracka,
• Hermann Rothard,
• Philippe Boduch,
• Dominik Pinkas and
• Jaroslav Kocišek

Beilstein J. Nanotechnol. 2024, 15, 207–214, doi:10.3762/bjnano.15.20

• nanoparticle binding [50][51] can be used to bring metallic materials to the surface at unprecedented resolution. Irradiation of such metal–DNA origami nanostructures with ion beams can be used to manufacture metallic nanostructures with sub-nanometer resolution. Finally, the localized DNA origami height

Graphene removal by water-assisted focused electron-beam-induced etching – unveiling the dose and dwell time impact on the etch profile and topographical changes in SiO₂ substrates

• Aleksandra Szkudlarek,
• Jan M. Michalik,
• Inés Serrano-Esparza,
• Zdeněk Nováček,
• Veronika Novotná,
• Piotr Ozga,
• Czesław Kapusta and
• José María De Teresa

Beilstein J. Nanotechnol. 2024, 15, 190–198, doi:10.3762/bjnano.15.18

• processes using the so-called focused electron-beam-induced etching (FEBIE), with a spatial resolution of ten nanometers. Nanopatterning graphene with such a method in one single step and without using a physical mask or resist is a very appealing approach. During the process, on top of graphene

• communication devices. All those future technologies will require high-precision lithography techniques with excellent lateral resolution, high throughput, and minimized possibility of material damage. In the last decade, several approaches have been made to provide the most suitable method for patterning

• shape control are very limited in those cases. Conventional electron beam lithography (EBL) reaches the resolution of a few nanometers. However, it leaves residual resists on the surface [9], which strongly affects electrical transport properties [10]. A similar high resolution can be achieved with e

Enhanced feedback performance in off-resonance AFM modes through pulse train sampling

• Mustafa Kangül,
• Navid Asmari,
• Santiago H. Andany,
• Marcos Penedo and
• Georg E. Fantner

Beilstein J. Nanotechnol. 2024, 15, 134–143, doi:10.3762/bjnano.15.13

• at frequencies far away from the resonance frequency of the cantilever (off-resonance tapping (ORT) modes) can provide high-resolution imaging of a wide range of sample types, including biological samples, soft polymers, and hard materials. These modes offer precise and stable control of vertical

In situ optical sub-wavelength thickness control of porous anodic aluminum oxide

• Aleksandrs Dutovs,
• Raimonds Popļausks,
• Oskars Putāns,
• Vladislavs Perkanuks,
• Aušrinė Jurkevičiūtė,
• Tomas Tamulevičius,
• Uldis Malinovskis,
• Iryna Olyshevets,
• Donats Erts and
• Juris Prikulis

Beilstein J. Nanotechnol. 2024, 15, 126–133, doi:10.3762/bjnano.15.12

• , temperature, voltage, and sample geometry) were found to be less than 1 nm/s. Together with spectrum acquisition, data transfer, and other tasks, it was possible to extract hPAAO values at 0.2 s intervals, which resulted in sub-nanometer sampling resolution of hPAAO. However, it is important to note that

Influence of conductive carbon and MnCo₂O₄ on morphological and electrical properties of hydrogels for electrochemical energy conversion

• Sylwia Pawłowska,
• Karolina Cysewska,
• Yasamin Ziai,
• Jakub Karczewski,
• Piotr Jasiński and
• Sebastian Molin

Beilstein J. Nanotechnol. 2024, 15, 57–70, doi:10.3762/bjnano.15.6

• present material functional groups, FTIR spectroscopy in attenuated total reflectance (ATR) mode was used (Bruker Vertex70 FT-IR Spectrometer). The FTIR analysis was carried out in a wavenumber range of 400–4000 cm−1 and with a resolution of 2 cm−1 and eight scans were made for each sample. Transmittance

TEM sample preparation of lithographically patterned permalloy nanostructures on silicon nitride membranes

• Joshua Williams,
• Michael I. Faley,
• Joseph Vimal Vas,
• Peng-Han Lu and
• Rafal E. Dunin-Borkowski

Beilstein J. Nanotechnol. 2024, 15, 1–12, doi:10.3762/bjnano.15.1

• –iron alloy (80 atom % Ni and 20 atom % Fe) that has a small coercive field (Hc) [17] and low magnetostriction (λs) [18], as well as high permeability and high saturation magnetization (Ms) [19]. TEM offers high spatial resolution for magnetic imaging. TEM-based magnetic imaging techniques such as

• advantageous in terms of structural resolution, process simplicity, and the absence of resist residues [21]. We have fabricated ferromagnetic nanodisks on a conventional TEM grid from TedPella® using three different fabrication methods. In the first method, a bilayer of positive PMMA resist yielded an undercut

• structure. The resist was patterned using an electron beam, which offers higher resolution than other sources (e.g., UV light) because of the smaller wavelength of electrons. Since the use of an ultrasonic bath will destroy the free-standing membrane, the undercut must be deliberately made larger to ensure

unDrift: A versatile software for fast offline SPM image drift correction

• Tobias Dickbreder,
• Franziska Sabath,
• Lukas Höltkemeier,
• Ralf Bechstein and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2023, 14, 1225–1237, doi:10.3762/bjnano.14.101

• autocorrelation is superior for images containing very few unit cells. In between these extremes, there is a range where both methods work well as shown in our examples in Figure 2. The dependence of the optimal transformation for peak extraction on the image size is caused by the finite resolution of the

• series After discussing the performance of unDrift under different experimental conditions, we now demonstrate the applicability to long image series spanning several hundred SPM images with an example shown in Figure 5. The presented series comprises 530 high-resolution AFM images recorded at the

• directions. Extraction of lattice vectors from images exhibiting periodic structures. (a, d) High-resolution AFM images showing atomic resolution at the calcite (10.4)–water interface. (b, e) Fourier transform images of the real-space images shown in (a) and (d). The maxima in the Fourier transforms are

Fluorescent bioinspired albumin/polydopamine nanoparticles and their interactions with Escherichia coli cells

• Eloïse Equy,
• Jordana Hirtzel,
• Sophie Hellé,
• Béatrice Heurtault,
• Eric Mathieu,
• Morgane Rabineau,
• Vincent Ball and
• Lydie Ploux

Beilstein J. Nanotechnol. 2023, 14, 1208–1224, doi:10.3762/bjnano.14.100

• high-resolution fluorescence imaging (high-resolution confocal microscopy). Also, the capacity of the pristine and fluorescent NPs to inhibit the growth of bacterial cells was evaluated through minimal inhibitory concentration (MIC) tests. The MIC value was also determined for Staphylococcus aureus (S

• inversely related to NP size [36]. The accumulation of pristine and fluorescent BSA/PDA NPs was evaluated by standard and high-resolution fluorescence confocal microscopy after 24 h of contact of NPs with E. coli cells. Obviously, bacteria without NPs and bacteria with pristine BSA/PDA NPs were not detected

• ), a low fluorescence signal was detected in the 460–541 nm and 415–482 nm ranges with the standard and the high-resolution microscope, respectively (Supporting Information File 1, Figure S7a). In part, it may result from the fluorescence of Ox-BSA/PDA NPs at λexc = 405 nm; however, it is more probably

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH₃)₂Cl]₂

• Elif Bilgilisoy,
• Ali Kamali,
• Thomas Xaver Gentner,
• Gerd Ballmann,
• Sjoerd Harder,
• Hans-Peter Steinrück,
• Hubertus Marbach and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

Spatial variations of conductivity of self-assembled monolayers of dodecanethiol on Au/mica and Au/Si substrates

• Julian Skolaut,
• Jędrzej Tepper,
• Federica Galli,
• Wulf Wulfhekel and
• Jan M. van Ruitenbeek

Beilstein J. Nanotechnol. 2023, 14, 1169–1177, doi:10.3762/bjnano.14.97

• applied method uses conductive atomic force microscopy (CAFM). In this technique, a conductive probe is used in an AFM, which allows for imaging the surface topography (and other characteristics such as adhesion and stiffness) with lateral resolution while simultaneously being able to measure current

• coating on a non-conductive probe in contrast to the CoCr-coated Si probes. This is at the cost of lateral resolution due to the larger radius of the probe apex. All measurements presented here were carried out in the Quantitative Imaging (QI™) mode by JPK. A sketch of the procedure is shown in Figure 1

A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements

• François Piquemal,
• Khaled Kaja,
• Pascal Chrétien,
• José Morán-Meza,
• Frédéric Houzé,
• Christian Ulysse and
• Abdelmounaim Harouri

Beilstein J. Nanotechnol. 2023, 14, 1141–1148, doi:10.3762/bjnano.14.94

• versatility and high resolution in probing the local conductivity of materials, C-AFM has been extensively used in studying semiconductors [6][7], two-dimensional materials [8][9][10], memristive devices [11][12][13][14][15], photoelectric systems [16][17][18], dielectric films [19][20][21][22][23], molecular

Curcumin-loaded albumin submicron particles with potential as a cancer therapy: an in vitro study

• Nittiya Suwannasom,
• Netsai Sriaksorn,
• Chutamas Thepmalee,
• Krissana Khoothiam,
• Ausanai Prapan,
• Hans Bäumler and
• Chonthida Thephinlap

Beilstein J. Nanotechnol. 2023, 14, 1127–1140, doi:10.3762/bjnano.14.93

• , USA). CUR was prepared in DMSO, while the particles were prepared by dilution in deionized water. The FTIR spectra were recorded in the range of 400–4000 cm−1 with a resolution of 4 cm−1. Circular dichroism measurements Circular dichroism (CD) spectra of HSA, HSA-MPs, and CUR- HSA-MPs were recorded

Density functional theory study of Au-fcc/Ge and Au-hcp/Ge interfaces

• Olga Sikora,
• Małgorzata Sternik,
• Benedykt R. Jany,
• Franciszek Krok,
• Przemysław Piekarz and
• Andrzej M. Oleś

Beilstein J. Nanotechnol. 2023, 14, 1093–1105, doi:10.3762/bjnano.14.90

• crystalline phases on a specific substrate [2][3]. The structure of a heterophase can be studied using advanced atomic-resolution experiments, such as high-resolution electron microscopy [4], high-resolution secondary-electron microscopy [5], scanning transmission electron microscopy [6][7] or scanning

Properties of tin oxide films grown by atomic layer deposition from tin tetraiodide and ozone

• Kristjan Kalam,
• Peeter Ritslaid,
• Tanel Käämbre,
• Aile Tamm and
• Kaupo Kukli

Beilstein J. Nanotechnol. 2023, 14, 1085–1092, doi:10.3762/bjnano.14.89

• beamline [18] at a solids research endstation [19]. XPS was carried out using a SPECS Phoibos150 hemispherical photoelectron kinetic energy analyser at an overall spectral resolution of 0.3 eV. XAS was carried out at 0.1 eV spectral resolution in total electron yield (TEY) mode by measuring sample

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

• interface. Since the early 90’s, a variety of approaches have been implemented to improve KPFM performances in terms of spatial, potentiometric, and temporal resolution. Several research teams continue to work in this direction and KPFM is still an evolving technique in many aspects. In particular, the

• quantitative measurements can be performed by pump-probe KPFM (pp-KPFM), with a time-resolution down to the sub-nanosecond scale [10]. However, pp-KPFM features a severely limited bandwidth. In the case of our last implementation of pp-KPFM [4], several tens of seconds (to minutes) are needed to record a

• (in terms of lateral resolution and sensitivity, respectively). This mode takes advantage of heterodyning effects (frequency mixing) between the electrical bias modulation and the cantilever mechanical oscillation (usually performed at the first eigenmode, angular frequency ω0). These effects result

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

• Zeinab Eftekhari,
• Nasim Rezaei,
• Hidde Stokkel,
• Jian-Yao Zheng,
• Andrea Cerreta,
• Ilka Hermes,
• Minh Nguyen,
• Guus Rijnders and
• Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

• mechanical oscillation of the piezoelectric membrane with vertical atomic resolution in real-time. This technique offers the opportunity to measure concurrently the optoelectronic and mechanical response of the device at the nanoscale. Furthermore, time-dependent atomic force microscopy (AFM) was employed to

• precise motion with high resolution. This offers promising possibilities for biomedical, environmental, and micro/nanoengineering applications [5][6]. Various types of design and actuation mechanisms have been developed in recent years [7][8]. A primary requirement to unlock the better performance of

• these micro/nano devices is to scrutinize their structure and the interaction between their different components. This can be done by high-resolution characterization techniques that simultaneously probe dynamic properties of different parts of the device. This enables the decoupling of the roles of

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• through real-space mapping. Complementing these full-fiber scans, high-resolution topography and stiffness maps on smaller fiber subdomains were also obtained to study the nanostructure of Technora®. From detailed topography maps, we found that the well-aligned surface features observed on the full

• on the AFM maps for clarity. In each highlighted region, there was clearly a correlation between topography and stiffness, but the precise nature of this correlation required higher resolution analysis of line profiles. From lateral profiles such as Figure 5a, we observed that domains with high

• structures of these fiber classes, which in turn help explain the mechanical and multifunctional performances of these fiber classes reported in other studies. In the future it would be especially interesting to carry out higher resolution scans within these fibers to characterize atomic structure [26]. Flat

Fragmentation of metal(II) bis(acetylacetonate) complexes induced by slow electrons

• Janina Kopyra and
• Hassan Abdoul-Carime

Beilstein J. Nanotechnol. 2023, 14, 980–987, doi:10.3762/bjnano.14.81

• of an electron source, an oven, and a quadrupole mass analyzer (QMA). The components are housed in a UHV chamber at a base pressure of around 2 × 10−8 mbar. A well-defined electron beam generated from a trochoidal electron monochromator (resolution approx. 210 meV FWHM), orthogonally intersects an

Isolation of cubic Si₃P₄ in the form of nanocrystals

• Polina K. Nikiforova,
• Sergei S. Bubenov,
• Vadim B. Platonov,
• Andrey S. Kumskov,
• Nikolay N. Kononov,
• Tatyana A. Kuznetsova and
• Sergey G. Dorofeev

Beilstein J. Nanotechnol. 2023, 14, 971–979, doi:10.3762/bjnano.14.80

• determination; thus, the linear dimensions of the particles could only be estimated to be in the range of 10–50 nm. The particles are polycrystalline and highly defective as evident from the high-resolution image (Figure 7a). The size of the crystalline domains does not exceed 10 nm in its longest dimension

• . (a) Bright-field TEM image and (b) electron diffraction of the sample SP550. TEM studies of the sample SP550. (a) High-resolution TEM image; (b) HAADF-STEM image; EDX elemental maps for (c) Si Kα, (d) P Kα, and (e) O Kα. The scale bar in images (b–e) is 30 nm. Synthesis conditions and results of X

Upscaling the urea method synthesis of CoAl layered double hydroxides

• Camilo Jaramillo-Hernández,
• Víctor Oestreicher,
• Martín Mizrahi and
• Gonzalo Abellán

Beilstein J. Nanotechnol. 2023, 14, 927–938, doi:10.3762/bjnano.14.76

• microscope at an accelerating voltage of 20 kV. Atomic force microscopy (AFM) AFM was carried out with a Bruker Dimension Icon microscope in scan-assist-mode. A Bruker Scanasyst-Air silicon tip with a diameter of around 10 nm was used to obtain images with a resolution of 512 × 512 or 1024 × 1024 pixels. The

• aperture selecting the unscattered electrons. To record the images, an AMT RX80 8MP CCD camera (JEOL JEM-1010) and a Gatan CCD 1k × 1k device were used. (A) PXRD patterns exhibit the layered nature of the obtained samples. Indexation according to [13]. (B) ATR-FTIR spectra. (C) High-resolution XPS spectra

Two-dimensional molecular networks at the solid/liquid interface and the role of alkyl chains in their building blocks

• Suyi Liu,
• Yasuo Norikane and
• Yoshihiro Kikkawa

Beilstein J. Nanotechnol. 2023, 14, 872–892, doi:10.3762/bjnano.14.72

• flat conducting substrates, such as metal surfaces and highly oriented pyrolytic graphite (HOPG), under ultrahigh vacuum (UHV) conditions, at solid/air or solid/liquid interfaces [23][24][25][26][27][28]. Although UHV-STM offers high-resolution imaging, it requires large, complex, and expensive

• resolution. (ii) Post-reaction is available by external stimuli such as the addition of metal ions for metal coordination, light irradiation for photoreaction, and post-blending of other molecules. (iii) The dynamic process of the 2D structural change (caused by the external stimuli) can be followed in situ

Industrial perspectives for personalized microneedles

• Remmi Danae Baker-Sediako,
• Benjamin Richter,
• Matthias Blaicher,
• Michael Thiel and
• Martin Hermatschweiler

Beilstein J. Nanotechnol. 2023, 14, 857–864, doi:10.3762/bjnano.14.70

• dollars (2500+ USD) when new, but these cost-effective printers are aimed at hobbyists and lack the resolution necessary for microneedle development (Figure 4). Professional SLA or DLP printers are more suitable for microneedle development because they can achieve feature sizes of the order of a few

• dimensions with high spatial resolution, which lends itself to continuous rather than discrete printing [59][61]. A key result of 2PP grayscale printing is that the technique is, on average, five to ten times faster than the common 2PP layer-by-layer approach [52]. Thiel et al. successfully applied 2GL® to

Nanostructured lipid carriers containing benznidazole: physicochemical, biopharmaceutical and cellular in vitro studies

• Giuliana Muraca,
• María Esperanza Ruiz,
• Rocío C. Gambaro,
• Sebastián Scioli-Montoto,
• María Laura Sbaraglini,
• Gisel Padula,
• José Sebastián Cisneros,
• Cecilia Yamil Chain,
• Vera A. Álvarez,
• Cristián Huck-Iriart,
• Guillermo R. Castro,
• María Belén Piñero,
• Matias Ildebrando Marchetto,
• Catalina Alba Soto,
• Germán A. Islan and
• Alan Talevi

Beilstein J. Nanotechnol. 2023, 14, 804–818, doi:10.3762/bjnano.14.66

• Fourier-transform infrared spectroscopy Fourier-transform infrared spectroscopy spectra were obtained. The attenuated total reflection mode was used to record the spectra over the range of 400–4000 cm−1 at a resolution of 2 cm−1. Transmission electron microscopy Transmission electron microscopy images

Silver-based SERS substrates fabricated using a 3D printed microfluidic device

• Phommachith Sonexai,
• Minh Van Nguyen,
• Bui The Huy and
• Yong-Ill Lee

Beilstein J. Nanotechnol. 2023, 14, 793–803, doi:10.3762/bjnano.14.65

• dimension to a scale smaller than a millimeter remains challenging [29]. In the second approach, 3D printing can replace photolithography to fabricate a mold. This approach can achieve a better lateral resolution of printed features down to 100 µm with a higher aspect ratio of the printed channel features

• [30]; also, it does not require a clean room. The stereolithography (SLA) technique is an additive manufacturing technique in which a photopolymer resin is cured and converted from a liquid to a solid by an ultraviolet laser. The resolution of SLA printers is determined by the radial beam scattering

• and the type of resin [31]. With particular resins, SLA can fabricate features with lateral dimensions of 100 µm and a mold-printed resolution of 50 µm. Over the past decade, numerous SERS substrates based on various materials, including paper [32][33], polymers [34][35], fibers [36], dielectrics [37