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Search for "signal-to-noise ratio" in Full Text gives 162 result(s) in Beilstein Journal of Nanotechnology.

Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

  • Adam Sweetman and
  • Andrew Stannard

Beilstein J. Nanotechnol. 2014, 5, 386–393, doi:10.3762/bjnano.5.45

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  • ) measurements and no averaging of curves has been performed to improve the signal-to-noise ratio. In general, in order to perform long-range background subtraction, short-range curves are acquired and then aligned with a separate long-range curve before fitting, which can introduce additional uncertainties. In
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Published 01 Apr 2014

Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review

  • Sidney R. Cohen and
  • Estelle Kalfon-Cohen

Beilstein J. Nanotechnol. 2013, 4, 815–833, doi:10.3762/bjnano.4.93

Graphical Abstract
  • for [84]. The bandwidth advantage has been extended to the MHz range, allowing an access to higher harmonics [85][86][87][88][89]. This provides several advantages: Higher harmonics can be exploited to separate the mechanical measurement from the topographic feedback, the signal-to-noise ratio can be
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Published 29 Nov 2013

k-space imaging of the eigenmodes of sharp gold tapers for scanning near-field optical microscopy

  • Martin Esmann,
  • Simon F. Becker,
  • Bernard B. da Cunha,
  • Jens H. Brauer,
  • Ralf Vogelgesang,
  • Petra Groß and
  • Christoph Lienau

Beilstein J. Nanotechnol. 2013, 4, 603–610, doi:10.3762/bjnano.4.67

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  • restricted to the range from zero to one. Similar plots have been generated from measurements at different spatial positions on our gold film. Within our signal-to-noise ratio, the data show no variation with sample position. This suggests that the possible excitation of localized surface plasmon fields on
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Published 02 Oct 2013

Deformation-induced grain growth and twinning in nanocrystalline palladium thin films

  • Aaron Kobler,
  • Jochen Lohmiller,
  • Jonathan Schäfer,
  • Michael Kerber,
  • Anna Castrup,
  • Ankush Kashiwar,
  • Patric A. Gruber,
  • Karsten Albe,
  • Horst Hahn and
  • Christian Kübel

Beilstein J. Nanotechnol. 2013, 4, 554–566, doi:10.3762/bjnano.4.64

Graphical Abstract
  • analysis. However, as the (200) peak has a considerable lower signal-to-noise ratio, in the present work only the crystallite size determined from the (111) reflection is given. The residual stress was investigated via the sin2Ψ method using the (311) and (331) peaks. Additionally, similar samples were
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Published 24 Sep 2013

Apertureless scanning near-field optical microscopy of sparsely labeled tobacco mosaic viruses and the intermediate filament desmin

  • Alexander Harder,
  • Mareike Dieding,
  • Volker Walhorn,
  • Sven Degenhard,
  • Andreas Brodehl,
  • Christina Wege,
  • Hendrik Milting and
  • Dario Anselmetti

Beilstein J. Nanotechnol. 2013, 4, 510–516, doi:10.3762/bjnano.4.60

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  • for an adequate signal to noise ratio (SNR). Besides, fluorescence and topography data are inherently aligned allowing easy superposition and localization of single fluorescence peaks within topographic features. Many biological systems from single molecules to cells and viruses are mixed complexes
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Published 11 Sep 2013

Optimal geometry for a quartz multipurpose SPM sensor

  • Julian Stirling

Beilstein J. Nanotechnol. 2013, 4, 370–376, doi:10.3762/bjnano.4.43

Graphical Abstract
  • A0 and kN are the amplitude and effective spring constant of the principal eigenmode, and FTS,N is the tip–sample force normal to the sample. For high-resolution AFM imaging A0 should be as low as possible [13]. However, the signal-to-noise ratio, which is a function of A0, [15] limits the minimum
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Published 17 Jun 2013

Polynomial force approximations and multifrequency atomic force microscopy

  • Daniel Platz,
  • Daniel Forchheimer,
  • Erik A. Tholén and
  • David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 352–360, doi:10.3762/bjnano.4.41

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  • detection band and kMΔω the upper limit. In Figure 1 we plot the absolute values of the components of the matrix for experimental data. One could imagine applying different windowing matrices when building , for example one which is weighted by the signal-to-noise ratio at each frequency. The absolute
  • very stable during the entire approach for both polynomial and ADFS reconstruction, which is a result of the high signal-to-noise ratio for the measured frequency components close to resonance. The stability of the reconstruction during approach gives us confidence in the method’s ability to accurately
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Published 10 Jun 2013

Selective surface modification of lithographic silicon oxide nanostructures by organofunctional silanes

  • Thomas Baumgärtel,
  • Christian von Borczyskowski and
  • Harald Graaf

Beilstein J. Nanotechnol. 2013, 4, 218–226, doi:10.3762/bjnano.4.22

Graphical Abstract
  • , show a much higher signal-to-noise ratio for similar structure heights and excitation powers [13]. Thus, the quenching by the underlying silicon does not explain the measured low fluorescence intensities. Another important factor that influences the absorption and emission of radiation by the bound
  • state energy, which was observed as a 10 nm red shift of the emission spectrum from 531 nm to 541 nm for increasing dye concentration. Although it is difficult to exactly determine the peak position in Figure 6 due to the low signal-to-noise ratio of the spectrum, the maximum position clearly seems to
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Published 25 Mar 2013

Towards 4-dimensional atomic force spectroscopy using the spectral inversion method

  • Jeffrey C. Williams and
  • Santiago D. Solares

Beilstein J. Nanotechnol. 2013, 4, 87–93, doi:10.3762/bjnano.4.10

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  • a single 2-dimensional (2D) surface scan. Although signal-to-noise ratio limitations can currently prevent the accurate experimental implementation of the 4D method, and the extraction of rate-dependent material properties from the force maps is a formidable challenge, the spectral inversion method
  • interaction force as a component of the driving force acting on the cantilever and was demonstrated with standard cantilevers, although the low signal-to-noise ratio of certain regions of the spectrum limited its accuracy. In 2007, Sahin and co-workers [8] introduced a T-shaped cantilever with an off-centered
  • frequency deviates from the resonance frequency (recall that harmonic oscillators exhibit a Lorentzian frequency response). As a result, the high-frequency peaks in Zp(ω) become smaller and smaller as ω increases, such that their signal-to-noise ratio decreases rapidly as ω increases. Thus, in order to
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Published 07 Feb 2013

Interpreting motion and force for narrow-band intermodulation atomic force microscopy

  • Daniel Platz,
  • Daniel Forchheimer,
  • Erik A. Tholén and
  • David B. Haviland

Beilstein J. Nanotechnol. 2013, 4, 45–56, doi:10.3762/bjnano.4.5

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  • off-resonance components have small signal-to-noise ratio and their measurement requires special cantilevers [20], high interaction forces [21] or highly damped environments [22]. To increase the number of Fourier components with good signal-to-noise ratio, on-resonance techniques utilize multiple
  • –surface interaction maps a drive-frequency comb to a response-frequency comb, both having the same base frequency Δω. Different drive-frequency combs can be used to place many response frequency components close to a resonance of the cantilever where they can be detected with good signal-to-noise ratio
  • methods in the future that will take advantage of the high signal-to-noise ratio and the high acquisition speed of ImAFM. Experimental The PS sample was spin cast from toluene solution on a silicon oxide substrate. Both PS (Mw = 280 kDa) and toluene were obtained from Sigma-Aldrich and used as purchased
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Published 21 Jan 2013

Nanostructure-directed chemical sensing: The IHSAB principle and the dynamics of acid/base-interface interaction

  • James L. Gole and
  • William Laminack

Beilstein J. Nanotechnol. 2013, 4, 20–31, doi:10.3762/bjnano.4.3

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  • in the supply line. The sensors respond to the analyte gas on a time scale of much less than two seconds. The change in resistance is measured in one-second intervals by using a DC current. The voltage bias used in these experiments is 3 V to obtain an optimum signal-to-noise ratio. A NI DAQPad-6015
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Published 14 Jan 2013

Characterization of the mechanical properties of qPlus sensors

  • Jan Berger,
  • Martin Švec,
  • Martin Müller,
  • Martin Ledinský,
  • Antonín Fejfar,
  • Pavel Jelínek and
  • Zsolt Majzik

Beilstein J. Nanotechnol. 2013, 4, 1–9, doi:10.3762/bjnano.4.1

Graphical Abstract
  • optionally enhanced up to 103 times. Due to the electrode configuration of the prong, the signals from the first stage are in inverse phase with respect to each other. Therefore the application of a differential amplifier leads to a better signal-to-noise ratio [30]. Furthermore, the two OPAs in the first
  • signal-to-noise ratio [30] and can eliminate the driving signal, which is coupled by stray capacitances, from the deflection channel. A plot of added mass versus (2πν)−2(10−10s2) for a single commercial sensor. A simple linear regression of the measured data gives a stiffness, in this case the slope of
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Published 02 Jan 2013

Tuning the properties of magnetic thin films by interaction with periodic nanostructures

  • Ulf Wiedwald,
  • Felix Haering,
  • Stefan Nau,
  • Carsten Schulze,
  • Herbert Schletter,
  • Denys Makarov,
  • Alfred Plettl,
  • Karsten Kuepper,
  • Manfred Albrecht,
  • Johannes Boneberg and
  • Paul Ziemann

Beilstein J. Nanotechnol. 2012, 3, 831–842, doi:10.3762/bjnano.3.93

Graphical Abstract
  • magnetic grains with parallel magnetization either pointing up- or downwards. Increasing areal densities of recording bits, while maintaining the signal-to-noise ratio, demands a reduction of the grain size [1]. As a result of the miniaturization, however, the grain size approaches the superparamagnetic
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Published 07 Dec 2012

Spring constant of a tuning-fork sensor for dynamic force microscopy

  • Dennis van Vörden,
  • Manfred Lange,
  • Merlin Schmuck,
  • Nico Schmidt and
  • Rolf Möller

Beilstein J. Nanotechnol. 2012, 3, 809–816, doi:10.3762/bjnano.3.90

Graphical Abstract
  • resonance frequency [12][13][14]. By measuring the amplitude of the thermal noise, k can be evaluated in situ, e.g., in a vacuum system prior to the measurement, without any modification of the experimental arrangement [15][16][17][18][19][20]. However, this requires a good signal-to-noise ratio for the
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Published 29 Nov 2012

The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

  • César Moreno,
  • Carmen Munuera,
  • Xavier Obradors and
  • Carmen Ocal

Beilstein J. Nanotechnol. 2012, 3, 722–730, doi:10.3762/bjnano.3.82

Graphical Abstract
  • resistive state of a given modification is altered if the total range exceeds the absolute value of the corresponding Vwr. Therefore, in order to explore the true I–V curve by improving the signal-to-noise ratio and using an adequate voltage range for each HR state, we also measured individual I–V curves
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Published 06 Nov 2012

Zeolites as nanoporous, gas-sensitive materials for in situ monitoring of DeNOx-SCR

  • Thomas Simons and
  • Ulrich Simon

Beilstein J. Nanotechnol. 2012, 3, 667–673, doi:10.3762/bjnano.3.76

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  • temperature of 85 °C, observations at lower temperatures were not feasible due to the poor data quality (low signal-to-noise ratio, since the current-resolution limit of the impedance analyser is approached) at very low temperatures. Hence, the Fe-loaded catalyst shows a NH3 loss by SCR reaction at
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Published 26 Sep 2012

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

  • Gregor Hlawacek,
  • Vasilisa Veligura,
  • Stefan Lorbek,
  • Tijs F. Mocking,
  • Antony George,
  • Raoul van Gastel,
  • Harold J. W. Zandvliet and
  • Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 507–512, doi:10.3762/bjnano.3.58

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  • , the BSHe data presented here was recorded with lower PEs between 10 keV and 20 keV. This results in a better signal-to-noise ratio for the BSHe images. Patterns of self-assembled monolayers (SAM) were created by using a PDMS stamp and gas-phase silanization. Orthogonal stripes with an identical width
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Published 12 Jul 2012

Channeling in helium ion microscopy: Mapping of crystal orientation

  • Vasilisa Veligura,
  • Gregor Hlawacek,
  • Raoul van Gastel,
  • Harold J. W. Zandvliet and
  • Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 501–506, doi:10.3762/bjnano.3.57

Graphical Abstract
  • PE of 15 keV. This increases the scattering probability and results in a better signal-to-noise ratio for ion-channeling contrast images. Commercially available polycrystalline gold{111} films on glass, with a chromium interlayer, were flame annealed in a hydrogen flame before the samples were loaded
  • channeling contrast image recorded with the MCP detector is presented in Figure 2. Although, there is excellent contrast at the selected acceleration voltage of 20 keV and the mild dose of 1.11 × 1015 cm−2, the signal-to-noise ratio is considerably worse compared to the SE images presented above. The reason
  • . First, the required ion dose for a high-quality image with a good signal-to-noise ratio is significantly lower. This is particularly important for light materials. The gold sample that has been used here has a comparatively large backscattering probability for helium atoms. The situation changes
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Published 10 Jul 2012

Repulsive bimodal atomic force microscopy on polymers

  • Alexander M. Gigler,
  • Christian Dietz,
  • Maximilian Baumann,
  • Nicolás F. Martinez,
  • Ricardo García and
  • Robert W. Stark

Beilstein J. Nanotechnol. 2012, 3, 456–463, doi:10.3762/bjnano.3.52

Graphical Abstract
  • that the image contrast is related to the signal-to-noise ratio and thus difficult to quantify for heterogeneous samples. The conclusions drawn here are on the basis of the optical impression of the authors. Comparing these observations with the bimodal-spectroscopy measurements on polystyrene from the
  •  6a makes clear that the cantilever response under bimodal operation was sinusoidal in both the first (f1 = 113.5 kHz) and second eigenmodes (f2 = 705.6 kHz). Furthermore, a Fourier analysis of the time traces (Figure 6b) helps to assess the signal-to-noise ratio of the signals. For the first
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Published 20 Jun 2012

X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge

  • Carla Bittencourt,
  • Adam P. Hitchock,
  • Xiaoxing Ke,
  • Gustaaf Van Tendeloo,
  • Chris P. Ewels and
  • Peter Guttmann

Beilstein J. Nanotechnol. 2012, 3, 345–350, doi:10.3762/bjnano.3.39

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  • , but with sufficient stability and signal integration it should be possible to measure the carbon K-edge NEXAFS of a single layer of graphene. The thickness of the studied sample ensures a good signal-to-noise ratio allowing detailed analysis of the peak form and composition. Figure 2a shows an average
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Published 25 Apr 2012
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  • disadvantageous with respect to the signal-to-noise ratio. In the previous report of the step-response measurement the inferior signal-to-noise ratio of the signal hindered detailed analysis. In the present report a pulse-response measurement in which differentiation of the response signal can be dispensed with
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Published 19 Mar 2012

Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique

  • Zsolt Majzik,
  • Martin Setvín,
  • Andreas Bettac,
  • Albrecht Feltz,
  • Vladimír Cháb and
  • Pavel Jelínek

Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28

Graphical Abstract
  • the important oscillation stability [8][9][10]. The key factor to achieve atomic resolution is the proper choice of several parameters, for example, the spring constant and the oscillation amplitude (see Table I in [11]). Theoretically, the optimal signal-to-noise ratio (SNR) is achieved at a value of
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Published 15 Mar 2012

Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

  • Joachim Welker,
  • Esther Illek and
  • Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27

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  • ≈ 0.59 κ−1. The deconvolution quality rises again for larger amplitudes A > 7 κ−1. However, usually amplitudes in the order of the characteristic decay length of the force are desired to obtain the best signal-to-noise ratio [24]. Therefore, in a real experiment it is difficult to judge whether the Sader
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Published 14 Mar 2012

Variations in the structure and reactivity of thioester functionalized self-assembled monolayers and their use for controlled surface modification

  • Inbal Aped,
  • Yacov Mazuz and
  • Chaim N. Sukenik

Beilstein J. Nanotechnol. 2012, 3, 213–220, doi:10.3762/bjnano.3.24

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  • , merged signal (Figure 4B and Figure 4C). Deconvolution reveals the thiophene sulfurs at 164.5 ± 0.2 eV and 165.6 ± 0.2 eV. The overlap among the four peaks in the spectra, together with their inherently problematic signal-to-noise ratio, leads to a situation in which the expected 2:1 peak intensity ratio
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Published 09 Mar 2012

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

  • Maximilian Schneiderbauer,
  • Daniel Wastl and
  • Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18

Graphical Abstract
  • frequency noise is inversely proportional to the oscillation amplitude A of the force sensor. Thus, we can reduce frequency noise by using large amplitudes and therefore minimize the . Moreover, one achieves the best signal-to-noise ratio by using an amplitude that is on the order of the decay length of the
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Published 29 Feb 2012
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