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Search for "cross sections" in Full Text gives 233 result(s) in Beilstein Journal of Nanotechnology. Showing first 200.

Template-controlled piezoactivity of ZnO thin films grown via a bioinspired approach

  • Nina J. Blumenstein,
  • Fabian Streb,
  • Stefan Walheim,
  • Thomas Schimmel,
  • Zaklina Burghard and
  • Joachim Bill

Beilstein J. Nanotechnol. 2017, 8, 296–303, doi:10.3762/bjnano.8.32

Graphical Abstract
  • . ZnO on carboxylate-SAMs on the one hand show homogeneous amplitude images with only low contrast. The cross sections (Figure 5, black) show that the average response is in the range of roughly 10 pm. This indicates that the crystallites have different crystallographic orientations so that the overall
  • (SEM) measurements a DSM 982 GEMINI field-emission SEM with a thermal Schottky-field emitter at a working distance of 2 mm and an acceleration voltage of 3 kV was used. Cross-sections were prepared by sputtering with 80:20 Pt/Pd. X-ray diffractometry (XRD) measurements were performed on a PANalytical
  • the COOH-SAM (a) and the PEL (b). AFM topography images of the ZnO films deposited onto COOH-terminated SAM (a) and PEL (d) after 3 deposition cycles. SEM cross sections of the films after 5 (b,e) and 20 (c,f) deposition cycles on COOH-terminated SAM and PEL (e,f). X-ray diffractograms of ZnO films
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Published 30 Jan 2017

Surface-enhanced infrared absorption studies towards a new optical biosensor

  • Lothar Leidner,
  • Julia Stäb,
  • Jennifer T. Adam and
  • Günter Gauglitz

Beilstein J. Nanotechnol. 2016, 7, 1736–1742, doi:10.3762/bjnano.7.166

Graphical Abstract
  • nanoparticles. As soon as nanoparticles are present, backscattering is a function of particle cross section. Aggregated particles have larger cross sections than nonaggregated particles. This is the proposed explanation of the baseline shift, which increases with increasing particle size in the I0/I spectrum
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Published 16 Nov 2016

Biomechanics of selected arborescent and shrubby monocotyledons

  • Tom Masselter,
  • Tobias Haushahn,
  • Samuel Fink and
  • Thomas Speck

Beilstein J. Nanotechnol. 2016, 7, 1602–1619, doi:10.3762/bjnano.7.154

Graphical Abstract
  • of the vascular bundles of Dracaena marginata The presence of a high number of rather small (Figure 6A) vascular bundles in the periphery and a comparatively lower number of larger vascular bundles in the centre can be well discerned in cross-sections of Dracaena marginata (Figure 1A). It can be also
  • sections of 25 µm thickness were produced with a microtome. Microscope images (Olympus BX61 microscope, Olympus Corp., Tokyo, Japan) of the cross-sections were then evaluated for cross-sectional area (Across) of the sample, number of vascular bundles (#vb) and total area of vascular bundles within the
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Published 07 Nov 2016

Photothermal effect of gold nanostar patterns inkjet-printed on coated paper substrates with different permeability

  • Mykola Borzenkov,
  • Anni Määttänen,
  • Petri Ihalainen,
  • Maddalena Collini,
  • Elisa Cabrini,
  • Giacomo Dacarro,
  • Piersandro Pallavicini and
  • Giuseppe Chirico

Beilstein J. Nanotechnol. 2016, 7, 1480–1485, doi:10.3762/bjnano.7.140

Graphical Abstract
  • of gold nanoparticles in nanomedicine [8][9][10][11][12], and in the fabrication of a broad spectrum of printed diagnostic and analytical tools [13][14][15]. Gold nanoparticles have also large extinction cross-sections in the range of 700–1100 nm (known as the bio-transparent window) because of
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Published 19 Oct 2016

Three-gradient regular solution model for simple liquids wetting complex surface topologies

  • Sabine Akerboom,
  • Marleen Kamperman and
  • Frans A. M. Leermakers

Beilstein J. Nanotechnol. 2016, 7, 1377–1396, doi:10.3762/bjnano.7.129

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Published 04 Oct 2016

The hydraulic mechanism in the hind wing veins of Cybister japonicus Sharp (order: Coleoptera)

  • Jiyu Sun,
  • Wei Wu,
  • Mingze Ling,
  • Bharat Bhushan and
  • Jin Tong

Beilstein J. Nanotechnol. 2016, 7, 904–913, doi:10.3762/bjnano.7.82

Graphical Abstract
  • length was 35–40 mm. Microstructure testing Microstructure testing was conducted in a manner similar to that described in [20]. The microstructures of the cross sections of hind wing veins were captured using an inverted fluorescence microscope (OLYMPUS, LX71). All beetles were anesthetized with ether
  • time helps to obtain aerodynamic force, resulting in a successful take-off [15][16][24][25]. At 0.759 s, the hind wing movement is at its lowest point, and the hind wings are completely expanded. Figure 3A–C demonstrates the cross sections of the wing base, the posterior part of the wing, and the
  • involved in the hydraulic mechanism of the unfolding of the hind wings, the cross sections of the veins were captured using an inverted fluorescence microscope and flow of blood was examined by means of a retinal camera. After 3.31 s, C, CuA, AAP, and AP4 were observed to be nearly full of fluorescence
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Published 23 Jun 2016

Frog tongue surface microstructures: functional and evolutionary patterns

  • Thomas Kleinteich and
  • Stanislav N. Gorb

Beilstein J. Nanotechnol. 2016, 7, 893–903, doi:10.3762/bjnano.7.81

Graphical Abstract
  • , captured during micro-CT scanning, we reconstructed image stacks of virtual cross-sections through the entire specimen with the software NRecon (Bruker microCT, Kontich, Belgium). These image stacks were then exported as 16 bit TIFF files, which we analyzed and visualized with the 3D visualization software
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Published 22 Jun 2016

The role of morphology and coupling of gold nanoparticles in optical breakdown during picosecond pulse exposures

  • Yevgeniy R. Davletshin and
  • J. Carl Kumaradas

Beilstein J. Nanotechnol. 2016, 7, 869–880, doi:10.3762/bjnano.7.79

Graphical Abstract
  • absorption cross-sections and volumes of the nanoparticles. Figure 5f, provides the ratio between the optical breakdown threshold intensity for pure water (for 3 ps pulses at 580 nm IH2O = 8.5 × 1011 W/cm2 [56]) and the threshold intensity of water with gold nanoparticles, Iau (this study). This figure shows
  • comparable absorption cross-sections had Fth = 0.37 mJ/cm3 and Fth = 1.4 mJ/cm3, respectively. A similar situation can be seen comparing s25d@595 against r15d@660, and s15t@585, s25d@532 and s25t@532 against each other, where the nanoparticles with different morphology but comparable absorption cross-section
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Published 16 Jun 2016

High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads

  • Benjamin Grévin,
  • Pierre-Olivier Schwartz,
  • Laure Biniek,
  • Martin Brinkmann,
  • Nicolas Leclerc,
  • Elena Zaborova and
  • Stéphane Méry

Beilstein J. Nanotechnol. 2016, 7, 799–808, doi:10.3762/bjnano.7.71

Graphical Abstract
  • recorded in dark and under illumination at 685 nm, 515 nm and 405 nm. Estimation of the SPV lateral resolution (3 series of topographic and KPFM potential images recorded in dark and under illumination). Correction procedure used for the SPV image calculation. High-resolution topographic and SPV cross
  • sections over an edge-on lamellae. Supporting Information File 40: Additional experimental results. Acknowledgements Financial support by the Agence Nationale de la Recherche (France) with the NANOKAN (ANR-11-BS10-0004) and PICASSO (ANR-11-BS08-0009) projects is gratefully acknowledged. We thank Florent
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Published 03 Jun 2016

Assembling semiconducting molecules by covalent attachment to a lamellar crystalline polymer substrate

  • Rainhard Machatschek,
  • Patrick Ortmann,
  • Renate Reiter,
  • Stefan Mecking and
  • Günter Reiter

Beilstein J. Nanotechnol. 2016, 7, 784–798, doi:10.3762/bjnano.7.70

Graphical Abstract
  • cross sections of closely packing nanocrystals. Phase images as shown in Figure 2 were used. The approximate radius of curvature of the AFM-tip represents the experimental error Δx = 10 nm. A bin size of 5 nm for the cross section was used to determine the distribution of particle diameters. For the AFM
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Published 02 Jun 2016

Thermo-voltage measurements of atomic contacts at low temperature

  • Ayelet Ofarim,
  • Bastian Kopp,
  • Thomas Möller,
  • León Martin,
  • Johannes Boneberg,
  • Paul Leiderer and
  • Elke Scheer

Beilstein J. Nanotechnol. 2016, 7, 767–775, doi:10.3762/bjnano.7.68

Graphical Abstract
  • located on the substrate surface to represent a λ ≈ 500 nm laser source [25]. Simulations were carried out for 77 K at the position of the laser spot aside of the metal film as in the experiment (Figure 7 insets and Figure 2). We investigated the temperature profile along three cross sections after 4 ms
  • temperature of 77 K. We implemented a structure similar to our device. The irradiation point (green dot) corresponds to the one used in our experiment. We calculate the temperature profile along different cross sections shown in the insets as red, green (a) and blue lines (b) (see insets). a) The temperature
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Published 30 May 2016

In situ observation of deformation processes in nanocrystalline face-centered cubic metals

  • Aaron Kobler,
  • Christian Brandl,
  • Horst Hahn and
  • Christian Kübel

Beilstein J. Nanotechnol. 2016, 7, 572–580, doi:10.3762/bjnano.7.50

Graphical Abstract
  • holes was measured by AFM to be 1.3 nm for the ncPda film (Supporting Information File 1, Figure S2). The thickness of the films (ncPda ≈50 nm; ncAuPda ≈50 nm) was measured from FIB cross sections. The ncPda metal films were annealed in situ for ≈1 min at 300 °C and ≈18 min at 300 °C plus an additional
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Published 19 Apr 2016

Rigid multipodal platforms for metal surfaces

  • Michal Valášek,
  • Marcin Lindner and
  • Marcel Mayor

Beilstein J. Nanotechnol. 2016, 7, 374–405, doi:10.3762/bjnano.7.34

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Published 08 Mar 2016

Functional fusion of living systems with synthetic electrode interfaces

  • Oskar Staufer,
  • Sebastian Weber,
  • C. Peter Bengtson,
  • Hilmar Bading,
  • Joachim P. Spatz and
  • Amin Rustom

Beilstein J. Nanotechnol. 2016, 7, 296–301, doi:10.3762/bjnano.7.27

Graphical Abstract
  • Supporting Information File 1, Experimental) and comparing the length of isolated and nonisolated electrodes in SEM cross sections the thickness of the PC layer was determined to be 405 ± 5 nm (Figure 1b, 4). All surface parameters had to be thoroughly tuned in order to achieve a balance between penetration
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Published 26 Feb 2016

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

  • Michael G. Ruppert and
  • S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

Graphical Abstract
  • into account varying cross-sections but system identification based on parameter optimization must be employed to reduce modeling errors [26]. In order to arrive at a system-based model and to use frequency domain system identification, a damping term is added to Equation 13 and taking the Laplace
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Published 24 Feb 2016

Determination of Young’s modulus of Sb2S3 nanowires by in situ resonance and bending methods

  • Liga Jasulaneca,
  • Raimonds Meija,
  • Alexander I. Livshits,
  • Juris Prikulis,
  • Subhajit Biswas,
  • Justin D. Holmes and
  • Donats Erts

Beilstein J. Nanotechnol. 2016, 7, 278–283, doi:10.3762/bjnano.7.25

Graphical Abstract
  • frequency was determined for 20 Sb2S3 NWs with lengths ranging from 6.6 to 30 μm and average thickness from 120 to 305 nm. However, SEM observations revealed that the investigated NWs had either circular or rectangular cross-sections. Resonance in mutually perpendicular directions was observed for NWs with
  • rectangular cross-sections (Figure 2). It was experimentally confirmed that the ratios of the resonance frequencies ω1/ω2 were consistent with the corresponding ratios a/b of the NW side lengths (Table 1). Based on the measured fundamental resonance frequency, ωn, and dimensions of the NW, the Young’s modulus
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Published 19 Feb 2016

Chemical bath deposition of textured and compact zinc oxide thin films on vinyl-terminated polystyrene brushes

  • Nina J. Blumenstein,
  • Caroline G. Hofmeister,
  • Peter Lindemann,
  • Cheng Huang,
  • Johannes Baier,
  • Andreas Leineweber,
  • Stefan Walheim,
  • Christof Wöll,
  • Thomas Schimmel and
  • Joachim Bill

Beilstein J. Nanotechnol. 2016, 7, 102–110, doi:10.3762/bjnano.7.12

Graphical Abstract
  • after PS brush formation were characterized. Figure 1 shows AFM images and cross sections of the two different substrates. The SiOx as well as the PS brush have a low roughness of 0.2 nm. After coating the highly polished SiOx surface with the PS brush, a height profile with more pronounced peaks is
  • nm thick layer of Pt/Pd (80:20). The thicknesses of ZnO films were determined using freshly prepared cross sections. Atomic force microscopy AFM measurements were performed on a Bruker Multimode 3 using commercially available cantilevers (PPP-NCHR, Nanosensors). Water contact angle measurements The
  • recorded. AFM height images and corresponding cross sections of a) a Si wafer and b) a PS brush. ζ-potential of the Si wafer and the PS brush before and after modification measured in water. ATR spectra of PS powder used for the preparation of the brushes before and after modification. The inlay shows a
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Published 25 Jan 2016

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

  • Urs Gysin,
  • Thilo Glatzel,
  • Thomas Schmölzer,
  • Adolf Schöner,
  • Sergey Reshanov,
  • Holger Bartolf and
  • Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

Graphical Abstract
  • ) measurements before and after sputtering of a copper alloy with chromium grains used as electrical contact surface in ultra-high power switches. In addition, we discuss KPFM measurements on cross sections of cleaved silicon carbide structures: a calibration layer sample and a power rectifier. To demonstrate
  • samples of interest are semiconductor surfaces involving various doping concentrations and even cross-sections of interfaces [41][42]. Such measurements are influenced by surface band-bending effects induced by either intrinsic surface defects, adsorbates, interface states and last but not least by the
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Published 28 Dec 2015

Nanoscale rippling on polymer surfaces induced by AFM manipulation

  • Mario D’Acunto,
  • Franco Dinelli and
  • Pasqualantonio Pingue

Beilstein J. Nanotechnol. 2015, 6, 2278–2289, doi:10.3762/bjnano.6.234

Graphical Abstract
  • permission from [24]. Copyright 2012 IOP Publishing. (A) The morphologies and cross-sections of the ripples. The corresponding scratching angles are 0° (a) and (b), 45° (c) and (d), and 90° (e) and (f). (B) Morphologies and 2D FFT images of 3D nanodot arrays. The scanning angles (a) 90° and 0°, (b) 90° and
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Published 02 Dec 2015

Au nanoparticle-based sensor for apomorphine detection in plasma

  • Chiara Zanchi,
  • Andrea Lucotti,
  • Matteo Tommasini,
  • Sebastiano Trusso,
  • Ugo de Grazia,
  • Emilio Ciusani and
  • Paolo M. Ossi

Beilstein J. Nanotechnol. 2015, 6, 2224–2232, doi:10.3762/bjnano.6.228

Graphical Abstract
  • concentration (i.e., it is a ratio of Raman cross-sections). Based on these findings, an additional increase of the dipping time, while avoiding sensor saturation, could be expected to cause at least a slight sensitivity increase towards lower analyte concentrations. A third set of experiments at different APO
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Published 26 Nov 2015

Effect of SiNx diffusion barrier thickness on the structural properties and photocatalytic activity of TiO2 films obtained by sol–gel dip coating and reactive magnetron sputtering

  • Mohamed Nawfal Ghazzal,
  • Eric Aubry,
  • Nouari Chaoui and
  • Didier Robert

Beilstein J. Nanotechnol. 2015, 6, 2039–2045, doi:10.3762/bjnano.6.207

Graphical Abstract
  • average grain size is not affected by the variation of the SiNx barrier thickness. From the fragmented cross-sections (Figure 2b), the film morphology appeared to be composed of distinguishable columns separated by boundaries, which corresponds to an intracolumnar porosity. Operating at pressures higher
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Published 16 Oct 2015

Simulation of thermal stress and buckling instability in Si/Ge and Ge/Si core/shell nanowires

  • Suvankar Das,
  • Amitava Moitra,
  • Mishreyee Bhattacharya and
  • Amlan Dutta

Beilstein J. Nanotechnol. 2015, 6, 1970–1977, doi:10.3762/bjnano.6.201

Graphical Abstract
  • misfit dislocations is significant only at larger diameters [1][19][20]. For constructing the core/shell wires, a strategy similar to that used by Liu et al. [16] has been employed. Although their analyses were for the wires of hexagonal cross-sections, the present investigations are based on the
  • cylindrical CSNWs with circular cross-sections. This is because although GaAs/GaAlAs nanowires with core/shell morphology can form hexagonal cross-sections [21], their Si–Ge-based counterparts are typically depicted as having circular cross-sections in several experimental [3][8][22] and theoretical studies
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Published 02 Oct 2015

The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors

  • Rachel M. Thorman,
  • Ragesh Kumar T. P.,
  • D. Howard Fairbrother and
  • Oddur Ingólfsson

Beilstein J. Nanotechnol. 2015, 6, 1904–1926, doi:10.3762/bjnano.6.194

Graphical Abstract
  • has been verified both by simulations [11] and by experiments [12]. In recent years, it has motivated a number of gas phase studies focusing on the energy dependence of the branching ratios and cross sections for various low energy (0–100 eV) electron-induced reactions with organometallic precursors
  • cross sections at low incident energies. Good examples of such reactions are the extensive fragmentation of tetrafluorophenol and tetrafluoroaniline [35] as well as that of the commonly used FEBID precursor ligands tri- and hexafluoroacetylacetone [36]. In each of these cases, low energy electron
  • more important in FEBID is the fact that interaction of precursor molecules with the surface of the substrate may alter the DEA cross sections substantially. This may be simply due to the enabled energy transfer offering a new relaxation path that competes with DEA (and AD). Conversely, in other
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Published 16 Sep 2015

Possibilities and limitations of advanced transmission electron microscopy for carbon-based nanomaterials

  • Xiaoxing Ke,
  • Carla Bittencourt and
  • Gustaaf Van Tendeloo

Beilstein J. Nanotechnol. 2015, 6, 1541–1557, doi:10.3762/bjnano.6.158

Graphical Abstract
  • ], Copyright (2005) American Physical Society. (b) Measured and calculated knock-on displacement cross sections. The lower boundary of the shaded areas corresponds to the calculated cross section, while the upper boundary is twice the calculated
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Published 16 Jul 2015

Continuum models of focused electron beam induced processing

  • Milos Toth,
  • Charlene Lobo,
  • Vinzenz Friedli,
  • Aleksandra Szkudlarek and
  • Ivo Utke

Beilstein J. Nanotechnol. 2015, 6, 1518–1540, doi:10.3762/bjnano.6.157

Graphical Abstract
  • , residence times, and dissociation cross-sections of molecules “A” and “B” are very likely different from each other, it can be seen that the composition (given by the magnitude Z on the right hand axis) of the deposits can be tuned by changing the electron beam dwell time per pixel. Equation 64 and Equation
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Published 14 Jul 2015
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