Transferability of interatomic potentials for silicene

• Marcin Maździarz

Beilstein J. Nanotechnol. 2023, 14, 574–585, doi:10.3762/bjnano.14.48

• –Weber, EDIP, ReaxFF, COMB, and machine-learning-based interatomic potentials. A quantitative systematic comparison and a discussion of the results obtained are reported. Keywords: 2D materials; DFT; force fields; interatomic potentials; mechanical properties; silicene; Introduction We are living in

• -dependent interatomic potential (EDIP) fitted to various bulk phases and defect structures of Si ReaxFF [41]: the reactive force-field (ReaxFF) fitted to a training set of DFT data that pertain to Si/Ge/H bonding environments COMB [42]: the charge optimized many-body (COMB) potential fitted to a pure

SERS performance of GaN/Ag substrates fabricated by Ag coating of GaN platforms

• Magdalena A. Zając,
• Bogusław Budner,
• Malwina Liszewska,
• Bartosz Bartosewicz,
• Łukasz Gutowski,
• Jan L. Weyher and
• Bartłomiej J. Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 552–564, doi:10.3762/bjnano.14.46

• substrates fabricated using both methods, we attempted to prepare substrates with a comparable amount of deposited Ag, which was examined and controlled using atomic force microscopy (AFM). For this purpose, additional Ag layers were deposited on flat Si substrates. Based on the measured thickness of the Ag

• atomic force microscope (AFM) (NT-MDT, Moscow, Russia) in non-contact mode using the approach described previously [37]. The silver layers were removed randomly on the sample to form a sharp edge for measurement of height (layer thickness). AFM measurements were carried out in three different areas on

Carbon nanotube-cellulose ink for rapid solvent identification

• Tiago Amarante,
• Thiago H. R. Cunha,
• Claudio Laudares,
• Ana P. M. Barboza,
• Ana Carolina dos Santos,
• Cíntia L. Pereira,
• Vinicius Ornelas,
• Bernardo R. A. Neves,
• André S. Ferlauto and
• Rodrigo G. Lacerda

Beilstein J. Nanotechnol. 2023, 14, 535–543, doi:10.3762/bjnano.14.44

• length of 5 μm were produced at CTNano/UFMG [59][60][61]. Morphological analysis was carried out by scanning electron microscopy (SEM) in a Quanta 200 FEG, using secondary electrons between 2 and 10 kV. Atomic force microscopy (AFM) was carried out on a Bruker MultiMode8 SPM using the intermittent

On the use of Raman spectroscopy to characterize mass-produced graphene nanoplatelets

• Keith R. Paton,
• Konstantinos Despotelis,
• Naresh Kumar,
• Piers Turner and
• Andrew J. Pollard

Beilstein J. Nanotechnol. 2023, 14, 509–521, doi:10.3762/bjnano.14.42

• widely used characterization tool for GR2Ms [8]. A search of Web of Science showed that of 97,532 articles published in the last five years with “Graphene” in the abstract, 9.3% also mentioned “Raman”. This is compared with atomic force microscopy (AFM) (2.4%), scanning electron microscopy (SEM) (11.4

Molecular nanoarchitectonics: unification of nanotechnology and molecular/materials science

• Katsuhiko Ariga

Beilstein J. Nanotechnol. 2023, 14, 434–453, doi:10.3762/bjnano.14.35

• oligomeric chains were significantly elongated. High-resolution scanning tunneling microscope (STM) topography shows alternating bright twin spots, which correspond to phenylene and tetrafluorophenylene, respectively. A high-resolution atomic force microscope (AFM) image of an entirely elongated fine

Plasmonic nanotechnology for photothermal applications – an evaluation

• A. R. Indhu,
• L. Keerthana and
• Gnanaprakash Dharmalingam

Beilstein J. Nanotechnol. 2023, 14, 380–419, doi:10.3762/bjnano.14.33

• electrons being in proximity to the surface) result in an increased Coulombic force of restoration and hence a shift in the dielectric function [47]. Similarly, with a decrease in grain size, due to the fact that there is an increase in the volume fraction of grain boundaries compared to the grains, and

Overview of mechanism and consequences of endothelial leakiness caused by metal and polymeric nanoparticles

• Magdalena Lasak and
• Karol Ciepluch

Beilstein J. Nanotechnol. 2023, 14, 329–338, doi:10.3762/bjnano.14.28

• induction depends on the density of NPs, where the effective density of Si NPs ranged from 1.57 to 1.72 g/cm3 [20]. The leakage rate increases with increasing nanoparticle density. They also showed that a force of approximately 1.8 nN/μm along the boundaries of VE-cad adherens junctions mediated by

• cumulative gravity appeared to be the critical threshold force required to disrupt endothelial cells. The leakiness of the endothelium resulting from the action of NPs occurs relatively quickly, usually within an hour after exposing the cells to NPs [20][21][23]. In addition to understanding the key

• increasing tensile force, which favored the spread of the crack throughout the VE-cad domain. Lee et al. also suggested that NanoEL is reversible and kinetic, and that a removal of leakiness stimuli triggers the reconstruction of the cadherin bond between adjacent cells. Therefore, NanoEL is a phenomenon

A novel approach to pulsed laser deposition of platinum catalyst on carbon particles for use in polymer electrolyte membrane fuel cells

• Bogusław Budner,
• Wojciech Tokarz,
• Sławomir Dyjak,
• Andrzej Czerwiński,
• Bartosz Bartosewicz and
• Bartłomiej Jankiewicz

Beilstein J. Nanotechnol. 2023, 14, 190–204, doi:10.3762/bjnano.14.19

• on the rotating electrode disk, formed tight and homogeneous layers over its entire surface. The layers of both catalysts adhered quite permanently to the carbon electrode. After the completion of the experiments, no significant loss of coverage occurred due to the centrifugal force of the rotating

High–low Kelvin probe force spectroscopy for measuring the interface state density

• Ryo Izumi,
• Masato Miyazaki,
• Yan Jun Li and
• Yasuhiro Sugawara

Beilstein J. Nanotechnol. 2023, 14, 175–189, doi:10.3762/bjnano.14.18

• Ryo Izumi Masato Miyazaki Yan Jun Li Yasuhiro Sugawara Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan 10.3762/bjnano.14.18 Abstract The recently proposed high–low Kelvin probe force microscopy (KPFM) enables evaluation

• actual semiconductor device evaluation, and there is a need to develop a method for obtaining such physical quantities. Here, we propose high–low Kelvin probe force spectroscopy (high–low KPFS), an electrostatic force spectroscopy method using high- and low-frequency AC bias voltages to measure the

• surfaces to confirm the dependence of the electrostatic force on the frequency of the AC bias voltage and obtain the interface state density. Keywords: high–low Kelvin probe force microscopy; high–low Kelvin probe force spectroscopy; interface state density; Kelvin probe force microscopy; Kelvin probe

Structural, optical, and bioimaging characterization of carbon quantum dots solvothermally synthesized from o-phenylenediamine

• Zoran M. Marković,
• Milica D. Budimir,
• Martin Danko,
• Dušan D. Milivojević,
• Pavel Kubat,
• Danica Z. Zmejkoski,
• Vladimir B. Pavlović,
• Marija M. Mojsin,
• Milena J. Stevanović and
• Biljana M. Todorović Marković

Beilstein J. Nanotechnol. 2023, 14, 165–174, doi:10.3762/bjnano.14.17

• 2.2 mg/mL. These specimens were designated as CQDs/PU. For bioimaging studies, toluene was evaporated, and a thin film of CQDs was redissolved in water and filtered. The prepared QCD samples were characterized by transmission electron microscopy (TEM), atomic force microscopy (AFM), Fourier

A distributed active patch antenna model of a Josephson oscillator

• Vladimir M. Krasnov

Beilstein J. Nanotechnol. 2023, 14, 151–164, doi:10.3762/bjnano.14.16

• magnetic field, Hy, introduces a chain of Josephson vortices (fluxons) in the JJ. The dc bias current, Ib, exerts a Lorentz force, FL, and causes a unidirectional fluxon motion. Upon collision with the junction edge, the fluxons annihilate. The released energy produces an EMW pulse, which is partially

• two superconducting electrodes (light blue) separated by a dielectric interlayer (yellow). Red ovals represent Josephson vortices that are driven by the Lorentz force, FL, exerted by the dc bias current, Ib. From the outside, the junction has a patch antenna geometry. However, inside it is driven by a

Batch preparation of nanofibers containing nanoparticles by an electrospinning device with multiple air inlets

• Dong Wei,
• Chengwei Ye,
• Adnan Ahmed and
• Lan Xu

Beilstein J. Nanotechnol. 2023, 14, 141–150, doi:10.3762/bjnano.14.15

• . Therefore, the optimal applied voltage value was 50 kV (Figure 2g), due to the stable jets generated under this voltage and the obtained fibers with smaller diameter and more uniform particle distribution. Figure 1a shows the force analysis of point A on the free surface of spinning solution and point B on

• force (Ph) caused by the fluctuation height of spinning solution, surface tension (Ps) of the spinning solution, and electric field force (PE) produced by the applied voltage. These forces determine whether a jet could be formed at point A. The polymer fluid surface tension would make the liquid surface

• the electric field intensity of the thin liquid surface (V/m), εα is the dielectric constant of the polymer, and k is the amount of radial fluctuations on the spinning solution surface. In addition, the centripetal force F1 at point B is generated by the horizontal component of the viscous force (τ

Intermodal coupling spectroscopy of mechanical modes in microcantilevers

• Ioan Ignat,
• Bernhard Schuster,
• Jonas Hafner,
• MinHee Kwon,
• Daniel Platz and
• Ulrich Schmid

Beilstein J. Nanotechnol. 2023, 14, 123–132, doi:10.3762/bjnano.14.13

• Ioan Ignat Bernhard Schuster Jonas Hafner MinHee Kwon Daniel Platz Ulrich Schmid Institute of Sensor and Actuator Systems, TU Wien, Gußhaustraße 27–29, 1040 Vienna, Austria 10.3762/bjnano.14.13 Abstract Atomic force microscopy (AFM) is highly regarded as a lens peering into the next discoveries

• . Through such findings we aim to expand the field of multifrequency AFM with innumerable possibilities leading to improved signal-to-noise ratios, all accessible with no additional hardware. Keywords: atomic force microscopy; intermodal coupling; nonlinear mechanics; optomechanics; sideband cooling

• ; Introduction Atomic force microscopy has established itself as one of the most powerful tools in nanotechnology. With meticulous setups amassing techniques such as ultra high vacuum, cryogenic temperatures, and CO-terminated tips, it is able to create a wonderful vista of surfaces, not missing the atoms for

Characterisation of a micrometer-scale active plasmonic element by means of complementary computational and experimental methods

• Ciarán Barron,
• Giulia Di Fazio,
• Samuel Kenny,
• Silas O’Toole,
• Robin O’Reilly and
• Dominic Zerulla

Beilstein J. Nanotechnol. 2023, 14, 110–122, doi:10.3762/bjnano.14.12

• optical and thermal data are used to inform detailed finite element method simulations for verification and to predict system responses allowing for enhanced design choices to maximise modulation depth and localisation. Keywords: active plasmonics; atomic force microscope; scanning Joule expansion

• on a sapphire substrate via physical vapour deposition (PVD). After this, two separate AFMs are used to machine channels in the silver film to create the desired constriction, which in this case measures 10 μm. The tip of the AFM is held at a set loading force in contact with the thin metal film and

• setup used to perform such measurements. An Adama NM-RC probe (spring constant: 290.3 N/m, nominal resonance frequency: 814 kHz) has been used in contact mode to scan the topography of an electrically modulated sample with a loading force of 1.9 μN. This particular probe is intended for use in

Antimicrobial and mechanical properties of functionalized textile by nanoarchitectured photoinduced Ag@polymer coating

• Jessica Plé,
• Marine Dabert,
• Helene Lecoq,
• Sophie Hellé,
• Lydie Ploux and
• Lavinia Balan

Beilstein J. Nanotechnol. 2023, 14, 95–109, doi:10.3762/bjnano.14.11

• cycles, during which an abrasive material (wool here) is frictioned linearly on the surface with a force of 12 N, following a Lissajous curves pattern. Figure 7a shows the Ag@PEG600DA-functionalized textile before and after 500 and 1000 abrasion cycles. The total reflectance spectra and its diffuse

Liquid phase exfoliation of talc: effect of the medium on flake size and shape

• Samuel M. Sousa,
• Helane L. O. Morais,
• Joyce C. C. Santos,
• Ana Paula M. Barboza,
• Bernardo R. A. Neves,
• Elisângela S. Pinto and
• Mariana C. Prado

Beilstein J. Nanotechnol. 2023, 14, 68–78, doi:10.3762/bjnano.14.8

• based on atomic force microscopy images of thousands of flakes, the shape and size distribution of nanotalc obtained using the four different media are compared. This comparison highlights the strengths and weaknesses of the media tested and hopefully will facilitate the choice of the medium for

• applications that have specific requirements. Keywords: 2D materials; atomic force microscopy; liquid phase exfoliation; nanomaterials; talc; Introduction Two-dimensional (2D) materials have attracted a lot of interest due to their outstanding properties [1]. However, large-scale production is still a

• nanosheets [6]. The energy may be provided by an ultrasonic bath, a shear force mixer, or a tip sonicator. The solution serves three purposes: it provides a medium to propagate the mechanical energy, suspends the exfoliated nanosheets, and prevents them from agglomerating again. The versatility of the method

Upper critical magnetic field in NbRe and NbReN micrometric strips

• Zahra Makhdoumi Kakhaki,
• Antonio Leo,
• Federico Chianese,
• Loredana Parlato,
• Giovanni Piero Pepe,
• Angela Nigro,
• Carla Cirillo and
• Carmine Attanasio

Beilstein J. Nanotechnol. 2023, 14, 45–51, doi:10.3762/bjnano.14.5

• superconductivity and both contribute to the behavior of Hc2(T), namely the orbital and the paramagnetic effect. While the former is due to the Lorentz force acting on electrons of the Cooper pairs with opposite momentum, the latter is related to splitting of the spin-singlet pairs because of the Zeeman effect

Gap-directed chemical lift-off lithographic nanoarchitectonics for arbitrary sub-micrometer patterning

• Chang-Ming Wang,
• Hong-Sheng Chan,
• Chia-Li Liao,
• Che-Wei Chang and
• Wei-Ssu Liao

Beilstein J. Nanotechnol. 2023, 14, 34–44, doi:10.3762/bjnano.14.4

• placed in the gap between the supporting substrate and a capping layer [43][44][45]. On the other hand, capillary force can induce the formation of nanochannel gaps when a structural top layer is brought into contact with the bottom surface [43]. Through these techniques, structures that are at the

• environment without additional compression force. The collapse of stamps occurs spontaneously and is dependent on the properties of the PDMS stamp. Thereafter, the contact-sealed stamp was removed from the Au substrate, and the Au surface was immersed in a 1 mM ethanolic BAT solution to backfill ligand

• force microscopy (Dimension Fastscan, Bruker Nano Surfaces, Hsinchu, Taiwan). Results and Discussion The results of selective SAM removal are visualized by backfilling biotinylated alkanethiol (BAT) molecules into the post lift-off regions followed by conjugating streptavidin and FITC-labeled anti

The influence of structure and local structural defects on the magnetic properties of cobalt nanofilms

• Alexander Vakhrushev,
• Aleksey Fedotov,
• Olesya Severyukhina and
• Anatolie Sidorenko

Beilstein J. Nanotechnol. 2023, 14, 23–33, doi:10.3762/bjnano.14.3

• vectors; pi is the momentum; eij is the unit vector along rij; fi is the analogue of the force applied to spin; and U is the potential energy. The general form of the expression for describing the total energy of magnetic systems can be written in the following form: where the first two terms in the right

• arrangement and force behavior, which caused their reorientation. Analysis of Figure 4 shows that there are significant differences in the spin distributions of an ideal crystalline hexagonal close-packed cobalt (letters (a), (b), (c)) and the nanofilm with structural defects formed as a result of the

Electrical and optical enhancement of ITO/Mo bilayer thin films via laser annealing

• Abdelbaki Hacini,
• Ahmad Hadi Ali,
• Nurul Nadia Adnan and
• Nafarizal Nayan

Beilstein J. Nanotechnol. 2022, 13, 1589–1595, doi:10.3762/bjnano.13.133

• roughness of the bilayer structure were studied utilizing an atomic force microscope (AFM, Bruker Dimension Edge) and the Gwyddion software. The optical transmission was measured using an UV–vis spectrophotometer (UV-3600i Plus, SHIMADZU) in the range of λ = 300–800 nm. Finally, the electrical properties

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

• Alfred J. Weymouth,
• Emily Roche and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2022, 13, 1572–1577, doi:10.3762/bjnano.13.131

• -precision STM and atomic force microscopy (AFM) scanning. Third, CuPc and PTCDA are known to form commensurate phases on flat metal surfaces. In particular, they have been well studied at different stoichiometries on Ag(111) [16]. Henneke and co-workers showed that more than 0.15 ML of PTCDA in addition to

Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy

• Nobuyuki Ishida

Beilstein J. Nanotechnol. 2022, 13, 1558–1563, doi:10.3762/bjnano.13.129

• electrodes. In Kelvin probe force microscopy (KPFM) measurements on electrochemical cells, the surface potential is generally measured relative to electrical ground instead of a stable reference. Here, we show that the changes in the surface potential, measured using KPFM relative to the surface potential in

• . Keywords: electrochemistry; Kelvin probe force microscopy (KPFM); reference electrode; solid electrolyte; Introduction Kelvin probe force microscopy (KPFM) is a scanning probe technique for imaging surface potentials on the nanometer scale [1][2][3][4]. Its operating principle is based on detecting the

• electrostatic force acting between the tip and sample [3]. CPD measurements relative to ground are not particularly problematic when analyzing KPFM data obtained from electronic devices [7][10][11][12] because the electrode potential relative to ground determines working conditions of the devices. In contrast

Induced electric conductivity in organic polymers

• Konstantin Y. Arutyunov,
• Anatoli S. Gurski,
• Vladimir V. Artemov,
• Alexander L. Vasiliev,
• Azat R. Yusupov,
• Danfis D. Karamov and
• Alexei N. Lachinov

Beilstein J. Nanotechnol. 2022, 13, 1551–1557, doi:10.3762/bjnano.13.128

• atomic force microscopy. In some cases, it was possible to observe regions with surface macromolecular (quasicrystalline) ordering [7]. The remarkable property of PDP is that, depending on the length of certain atomic bonds, its molecule can exist in several spatial configurations. Under normal

• , associates of macromolecules are formed in the solution, and the influence of adhesion processes decreases, but the cohesive forces increase. In the entire thickness range from 3 nm to 1 µm, the films are solid, without significant defects and/or pin holes. The polymer films were studied by atomic force

• strip and the whole sandwich itself. (b) Atomic force microscope scan of a PDP film 0.1 wt % on Si substrate. The plot at the bottom illustrates the roughness of the surface along the indicated line. (c) Side view of a Pb–PDP–Pb structure on glass with solitary defect (lead shortcut) obtained by

Frequency-dependent nanomechanical profiling for medical diagnosis

• Santiago D. Solares and
• Alexander X. Cartagena-Rivera

Beilstein J. Nanotechnol. 2022, 13, 1483–1489, doi:10.3762/bjnano.13.122

• Bioengineering, National Institutes of Health, Bethesda, Maryland, USA 10.3762/bjnano.13.122 Abstract Atomic force microscopy (AFM), developed in the early 1980s, has become a powerful characterization tool in micro- and nanoscale science. In the early 1990s, its relevance within biology and medicine research

• mechanical changes in the affected tissues. Keywords: atomic force microscopy; healthcare; mechanical properties; mechanobiology; medical diagnosis; Introduction Since its invention in the early 1980s, atomic force microscopy (AFM) has been extensively used for topographical, mechanical, electrical, and

• -established and widely used technique for fundamental micro- and nanoscale research, especially concerning topographical characterization and general force measurements [1][2][3][4][5]. However, advanced mechanical property analysis is not yet widely used for broad-impact applications. In fact, while some

Coherent amplification of radiation from two phase-locked Josephson junction arrays

• Mikhail A. Galin,
• Vladimir M. Krasnov,
• Ilya A. Shereshevsky,
• Nadezhda K. Vdovicheva and
• Vladislav V. Kurin

Beilstein J. Nanotechnol. 2022, 13, 1445–1457, doi:10.3762/bjnano.13.119

• (Figure 2, Figure 5b,c). The inductances are equal to 100 pH while the internal resistance of the power supplies has the value of 90 Ω. The latter allows for measurements of IVCs close to the regime of constant bias current. However, the electromotive force of the power supply is, in fact, the primary

• mA, and the lowest differential resistance is Rd = 2.8 Ω. The radiation power increases abruptly at the step and reaches the maximal value Pb = 0.32 μW at Vb = 40.06 mV, corresponding to an averaged Josephson frequency of = 193.7 GHz. The indicated value Vb corresponds to the electromotive force of

• cavity mode is playing a decisive role for synchronization of the array. Junctions in the antinodal regions are phase-locked by the driving EM field of the cavity mode. In the nodal regions, the driving force is very small, and, therefore, JJs are unsynchronized there. These asynchronous nodal regions