Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

• Sergei Magonov and
• John Alexander

Beilstein J. Nanotechnol. 2011, 2, 15–27, doi:10.3762/bjnano.2.2

• verification of KFM operations. The same is true for metal alloys because their surface potentials are directly defined by work function [8]. At the beginning we compare KFM imaging in the non-contact and intermittent contact modes. When the AFM probe, which is driven into an oscillation at its resonant

• related to the strength and orientation of the molecular dipole, as is the case in fluoroalkanes self-assemblies. In other materials surface potential correlates to the surface work function of metals, the doping level of semiconductors, the strength and orientation of molecular dipoles, and the presence

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• force microscopy; scanning tunneling microscopy; thin films; work function; Review Introduction The chemical properties of many crystal surfaces, especially oxides, are significantly influenced by defects in the perfectly ordered structure [1][2][3][4][5]. These defects can be impurities in the surface

• material with the lower work function (here tip) flow to the material with the higher work function. The Fermi levels align and an electrical field is built up [21]. The contact potential ΔΦ is then given by the difference in work function of the tip and of the sample surface, which may contain the studied

• single point defects or single adsorbates, instead of integrating over a square millimeter range. However, absolute values of the work function cannot be measured directly, only work function differences. Point defects Oxygen vacancies, also known as color centers, are electron trapping point defects and