Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

• Elena T. Herruzo and
• Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 198–206, doi:10.3762/bjnano.3.22

• Lennard-Jones and Derjaguin–Muller–Toporov forces. Keywords: AFM; atomic force microscopy; bimodal AFM; frequency shift; integral calculus applications; Introduction Since the invention of the atomic force microscope (AFM) [1], numerous AFM studies have been pursued in order to extract information from

Noncontact atomic force microscopy study of the spinel MgAl₂O₄(111) surface

• Morten K. Rasmussen,
• Kristoffer Meinander,
• Flemming Besenbacher and
• Jeppe V. Lauritsen

Beilstein J. Nanotechnol. 2012, 3, 192–197, doi:10.3762/bjnano.3.21

• and in particular a direct atomic-scale characterization of the surface structure is largely missing for a range of important metal oxides. In recent years, the noncontact atomic force microscope (NC-AFM) has been established as a unique tool to provide atomic-resolution real-space images of all types

Direct-write polymer nanolithography in ultra-high vacuum

• Woo-Kyung Lee,
• Minchul Yang,
• Arnaldo R. Laracuente,
• William P. King,
• Lloyd J. Whitman and
• Paul E. Sheehan

Beilstein J. Nanotechnol. 2012, 3, 52–56, doi:10.3762/bjnano.3.6

• onto atomic force microscope (AFM) probes that could be heated to control the ink viscosity. Then, the ink-coated probes were placed into an ultra-high vacuum (UHV) AFM and used to write polymer nanostructures on surfaces, including surfaces cleaned in UHV. Controlling the writing speed of the tip

Mechanical characterization of carbon nanomembranes from self-assembled monolayers

• Xianghui Zhang,
• André Beyer and
• Armin Gölzhäuser

Beilstein J. Nanotechnol. 2011, 2, 826–833, doi:10.3762/bjnano.2.92

•  nm that are fabricated by electron-induced crosslinking of aromatic self-assembled monolayers (SAMs). A novel type of in situ bulge test employing an atomic force microscope (AFM) is utilized to investigate their mechanical properties. A series of biphenyl-based molecules with different types of

• Discussion Figure 1a shows a schematic diagram of bulge test in an atomic force microscope. Loading of the membrane is achieved by applying a nitrogen gas pressure to the membrane. The pressure difference between the top and the bottom of the membrane is read by a pressure sensor, and the resulting

The atomic force microscope as a mechano–electrochemical pen

• Christian Obermair,
• Andreas Wagner and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2011, 2, 659–664, doi:10.3762/bjnano.2.70

• Karlsruhe, Germany 10.3762/bjnano.2.70 Abstract We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the

• current by the control-voltage-induced movement of just a single atom [4][5][6][7]. In this way, a single-atom transistor was demonstrated as a quantum electronic device operating reproducibly at room temperature. At the same time, the scanning tunneling microscope (STM) and the atomic force microscope

• the once-passivated copper structures described above. Conclusion To conclude, we have reported the controlled and site-selective electrochemical deposition of metallic nanopatterns, which were induced with the tip of an atomic force microscope used as a “mechano–electrochemical pen”. The deposition

Distance dependence of near-field fluorescence enhancement and quenching of single quantum dots

• Volker Walhorn,
• Jan Paskarbeit,
• Heinrich Gotthard Frey,
• Alexander Harder and
• Dario Anselmetti

Beilstein J. Nanotechnol. 2011, 2, 645–652, doi:10.3762/bjnano.2.68

• ][24], folding pathways [25] or micro environments [26]. Experimental TIRF–AFM Setup All experimental work was performed on a combined total internal reflection fluorescence microscopy (TIRFM) atomic force microscope (AFM) setup. The homebuilt AFM head is mounted on an inverted Microscope Axiovert 100

Distinction of nucleobases – a tip-enhanced Raman approach

• Regina Treffer,
• Xiumei Lin,
• Elena Bailo,
• Tanja Deckert-Gaudig and
• Volker Deckert

Beilstein J. Nanotechnol. 2011, 2, 628–637, doi:10.3762/bjnano.2.66

• with reasonable costs and expenditure of time [3]. Tip-enhanced Raman scattering (TERS) is the combination of Raman spectroscopy with a scanning probe microscope, most often an atomic force microscope (AFM). A metal nanoparticle at the apex of the AFM tip leads to a large enhancement of the

Studies towards synthesis, evolution and alignment characteristics of dense, millimeter long multiwalled carbon nanotube arrays

• Pitamber Mahanandia,
• Jörg J. Schneider,
• Martin Engel,
• Bernd Stühn,
• Somanahalli V. Subramanyam and
• Karuna Kar Nanda

Beilstein J. Nanotechnol. 2011, 2, 293–301, doi:10.3762/bjnano.2.34

• long CNTs can be detached easily from the aligned CNT bundle or mat like structure. Atomic force microscope (AFM) images of individual CNTs, synthesized at 650 °C and 1100 °C, are depicted in Figure 6. They confirm the uniform diameter as found by TEM. SAXS and small angle neutron scattering (SANS) are

Switching adhesion forces by crossing the metal–insulator transition in Magnéli-type vanadium oxide crystals

• Bert Stegemann,
• Matthias Klemm,
• Siegfried Horn and
• Mathias Woydt

Beilstein J. Nanotechnol. 2011, 2, 59–65, doi:10.3762/bjnano.2.8

• between the cleavage planes of various vanadium oxide Magnéli phases (n = 3 … 7) and spherical titanium atomic force microscope (AFM) tips by systematic force–distance measurements with a variable-temperature AFM under ultrahigh vacuum conditions (UHV). The results show, for all investigated samples, that

• and micro-electro-mechanical systems (MEMS). In this context, a great technological challenge in advancing miniaturization is to overcome the strong adhesive attractions between nanoscopic tribo-elements in order to realize technical systems with low friction [12][13]. The atomic force microscope (AFM

Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFM

• Thilo Glatzel,
• Lars Zimmerli,
• Shigeki Kawai,
• Ernst Meyer,
• Leslie-Anne Fendt and
• Francois Diederich

Beilstein J. Nanotechnol. 2011, 2, 34–39, doi:10.3762/bjnano.2.4

• their intermolecular π–π stacking. Experimental Experiments were performed under ultrahigh vacuum (UHV) conditions with a base pressure below 10−10 mbar using a home built non-contact atomic force microscope operated at rt [39]. In the nc-AFM mode, the tip-sample distance is usually controlled by

The description of friction of silicon MEMS with surface roughness: virtues and limitations of a stochastic Prandtl–Tomlinson model and the simulation of vibration-induced friction reduction

• W. Merlijn van Spengen,
• Viviane Turq and
• Joost W. M. Frenken

Beilstein J. Nanotechnol. 2010, 1, 163–171, doi:10.3762/bjnano.1.20

• sidewall surfaces of a MEMS device flipped upright in on-chip hinges with an AFM (atomic force microscope). The addition of a modulation term to the model allows us to also simulate the effect of vibration-induced friction reduction (normal-force modulation), as a function of both vibration amplitude and

• ], it has become possible to study the friction processes on the atomic scale that count as one of the fundamental aspects of everyday friction. The FFM (an atomic force microscope (AFM) that is sensitive to the lateral forces at the tip) can probe the interactions of an (almost) atomically sharp tip

Sensing surface PEGylation with microcantilevers

• Natalija Backmann,
• Natascha Kappeler,
• Thomas Braun,
• François Huber,
• Hans-Peter Lang,
• Christoph Gerber and
• Roderick Y. H. Lim

Beilstein J. Nanotechnol. 2010, 1, 3–13, doi:10.3762/bjnano.1.2

• how microcantilevers can be used to monitor conformational changes in the grafted PEG layer in different solvent conditions. This is supported by atomic force microscope (AFM) images and force–distance curve measurements of the microcantilever chip surface, which show that the grafted PEG undergoes a