High-resolution dynamic atomic force microscopy in liquids with different feedback architectures

• John Melcher,
• David Martínez-Martín,
• Miriam Jaafar,
• Julio Gómez-Herrero and
• Arvind Raman

Beilstein J. Nanotechnol. 2013, 4, 153–163, doi:10.3762/bjnano.4.15

• can be limited by the bandwidth of the amplitude and phase measurements, or the transient response, or the response of the oscillating probe. Drift in dAFM, for example arising from the piezo actuators controlling the image raster, imposes a minimum scan speed and corresponding detection bandwidth

Nanostructure-directed chemical sensing: The IHSAB principle and the dynamics of acid/base-interface interaction

• James L. Gole and
• William Laminack

Beilstein J. Nanotechnol. 2013, 4, 20–31, doi:10.3762/bjnano.4.3

• decreasing resistance. While the response to NH3 is rapid [1][3][8][11] in this unsaturated mode, the system recovery is slowed as NH3, a sticky gas, results in a drift in baseline (see Experimental section). NO2, as a moderate acid, is found to extract electrons from a PS interface [7][29] increasing

• form of an increased resistance. In contrast, at higher fractional TiO2−xNx depositions, Figure 7 demonstrates that white light now increases the sensor response in the form of an increased conductance as the TiO2−xNx [11] decorated interface is found to extract electrons. (Note that the baseline drift

Diamond nanophotonics

• Katja Beha,
• Helmut Fedder,
• Marco Wolfer,
• Merle C. Becker,
• Petr Siyushev,
• Mohammad Jamali,
• Anton Batalov,
• Christopher Hinz,
• Jakob Hees,
• Lutz Kirste,
• Harald Obloh,
• Etienne Gheeraert,
• Boris Naydenov,
• Ingmar Jakobi,
• Florian Dolde,
• Sébastien Pezzagna,
• Daniel Twittchen,
• Matthew Markham,
• Daniel Dregely,
• Harald Giessen,
• Jan Meijer,
• Fedor Jelezko,
• Christoph E. Nebel,
• Rudolf Bratschitsch,
• Alfred Leitenstorfer and
• Jörg Wrachtrup

Beilstein J. Nanotechnol. 2012, 3, 895–908, doi:10.3762/bjnano.3.100

• high precision. The accuracy of this imaging method is limited only by the applicable laser power and ultimately by instrument drift of the sample scanning unit. The mica mask implantation and GSD imaging method are suitable to create and characterize one or more color centers in diamond with sub 100

Controlled positioning of nanoparticles on a micrometer scale

• Fabian Enderle,
• Oliver Dubbers,
• Alfred Plettl and
• Paul Ziemann

Beilstein J. Nanotechnol. 2012, 3, 773–777, doi:10.3762/bjnano.3.86

• drift, which in the present case of 100 nm disks arranged in squares added up to approximately 50 nm. Added to this error is the uncertainty of the exact position of the Au NP within any disk. Due to the finite hexagonal order, over larger areas this position can be assumed as random within the disk

Effect of spherical Au nanoparticles on nanofriction and wear reduction in dry and liquid environments

• Dave Maharaj and
• Bharat Bhushan

Beilstein J. Nanotechnol. 2012, 3, 759–772, doi:10.3762/bjnano.3.85

• , can prevent nanoparticles from reaching their intended target [7]. Smaller nanoparticles can diffuse through surfaces and avoid detection by the RES. Studies have shown that forces such as hydrodynamic and van der Waals forces along with the nanoparticle size influence lateral drift (margination) and

The memory effect of nanoscale memristors investigated by conducting scanning probe microscopy methods

• César Moreno,
• Carmen Munuera,
• Xavier Obradors and
• Carmen Ocal

Beilstein J. Nanotechnol. 2012, 3, 722–730, doi:10.3762/bjnano.3.82

• correlation of device rectification (reset) with the voltage employed to induce each particular state. Analytical simulations by using a nonlinear dopant drift within a memristor device explain the experimental I–V bipolar cycles. Keywords: conductive scanning probe micoscopy; memristor; 3-D modes; resistive

• any frequency, implies that the device is a memristor [5]. A basic mathematical definition of a memristor, assuming an ohmic electron conduction and linear ionic drift in a uniform field, is given by the following equations [2]: where M is the memristance, w is the size of the doped region, D is the

• thickness of the film, RON and ROFF correspond to the resistance of the memristor for completely uniformly doped or undoped cases, respectively, and µ is the drift velocity of the dopants under an electric field E across the doped region in the presence of a current I(t). The switching characteristic

Dimer/tetramer motifs determine amphiphilic hydrazine fibril structures on graphite

• Loji K. Thomas,
• Nadine Diek,
• Uwe Beginn and
• Michael Reichling

Beilstein J. Nanotechnol. 2012, 3, 658–666, doi:10.3762/bjnano.3.75

• locating them on a millimetre area substrate; thermal drift; movement/perturbation induced by tip motion and tip contamination [21]; the nonplanar nature of components within individual fibril units; and the presence of dangling alkyl chains. High-resolution STM imaging of 1-D structures has been

• bare HOPG substrate was imaged to ensure the quality of the STM tip and the cleanliness of the substrate surface. By imaging the atomic structure of the bare graphite, the scanner was calibrated at regular time intervals so that the precision of measurements was solely limited by thermal drift. The

• entire scan area was also imaged before molecules were deposited, to check for graphite artefacts. The ambient temperature was stabilized to be within ±1.0 °C of room temperature, and the scanner was always given time to thermally equilibrate and mechanically relax, to reduce thermal drift and piezo

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

• Mehmet Z. Baykara,
• Omur E. Dagdeviren,
• Todd C. Schwendemann,
• Harry Mönig,
• Eric I. Altman and
• Udo D. Schwarz

Beilstein J. Nanotechnol. 2012, 3, 637–650, doi:10.3762/bjnano.3.73

• function of the three spatial dimensions, with picometer and piconewton accuracy. Since the results of such measurements may be affected by piezo nonlinearities, thermal and electronic drift, tip asymmetries, and elastic deformation of the tip apex, these effects need to be considered during image

• quantitatively and qualitatively, including: thermal and electronic drift during the measurement, nonlinearities and creep associated with piezoelectric scan elements used in the microscope, variability of tip-apex structure and chemistry between different experiments, and elastic deformations of the tip under

• to obtain information on the investigated sample with as little ambiguity, uncertainty, and irreproducibility due to technique-inherent practical limitations as possible. In the case of NC-AFM, drift, piezo nonlinearities, and piezo creep result in an apparent spatial misalignment and distortion of

Nanolesions induced by heavy ions in human tissues: Experimental and theoretical studies

• Marcus Bleicher,
• Lucas Burigo,
• Marco Durante,
• Maren Herrlitz,
• Michael Krämer,
• Igor Mishustin,
• Iris Müller,
• Francesco Natale,
• Igor Pshenichnov,
• Stefan Schramm,
• Gisela Taucher-Scholz and
• Cathrin Wälzlein

Beilstein J. Nanotechnol. 2012, 3, 556–563, doi:10.3762/bjnano.3.64

• the billowing motion of the damaged domain (XRCC1, green; appears yellow due to HP1α overlap in heterochromatin) and a drift toward the chromocenter periphery. Acknowledgements This work was supported by the Beilstein-Institut, Frankfurt am Main, Germany (NanoBiC collaboration).

Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism

• Gregor Hlawacek,
• Vasilisa Veligura,
• Stefan Lorbek,
• Tijs F. Mocking,
• Antony George,
• Raoul van Gastel,
• Harold J. W. Zandvliet and
• Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 507–512, doi:10.3762/bjnano.3.58

• recorded on an ultrahigh vacuum (UHV) Orion Plus helium ion microscope from Zeiss [5]. The microscope is equipped with an Everhardt–Thornley (ET) detector to record SE images, and a microchannel plate situated in the beam path below the final lens to record BSHe images. A silicon drift detector to measure

Channeling in helium ion microscopy: Mapping of crystal orientation

• Vasilisa Veligura,
• Gregor Hlawacek,
• Raoul van Gastel,
• Harold J. W. Zandvliet and
• Bene Poelsema

Beilstein J. Nanotechnol. 2012, 3, 501–506, doi:10.3762/bjnano.3.57

• the last lens, is used to record BSHe images. A silicon drift detector measures the energy of backscattered helium atoms and a Gatan MonoCL4 Elite detector measures ionoluminescence. The base pressure of 2 × 10−9 mbar allows for extended exposure of the same sample area to the He+ ion beam. The near

Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM

• Fabien Castanié,
• Laurent Nony,
• Sébastien Gauthier and
• Xavier Bouju

Beilstein J. Nanotechnol. 2012, 3, 301–311, doi:10.3762/bjnano.3.34

• , the XY-scan is engaged and the Δf variations around Δfset are recorded. In this situation, the scan is therefore performed at nearly constant height, Hset (subject to vertical drift, which is obviously to be reduced as much as possible). Conversely, in constant-Δf mode, the DC remains engaged. Then

Dipole-driven self-organization of zwitterionic molecules on alkali halide surfaces

• Laurent Nony,
• Franck Bocquet,
• Franck Para,
• Frédéric Chérioux,
• Eric Duverger,
• Frank Palmino,
• Vincent Luzet and
• Christian Loppacher

Beilstein J. Nanotechnol. 2012, 3, 285–293, doi:10.3762/bjnano.3.32

• acquired. All images were drift corrected and evaluated in order to give the most accurate values for the experimentally determined lattice constant of MSPS cmsps,exp as well as for the Moiré pattern lMoiré,exp. Figure 3a shows the topography image of ≈1 ML of MSPS on KCl. The image was taken after the

Pulse-response measurement of frequency-resolved water dynamics on a hydrophilic surface using a Q-damped atomic force microscopy cantilever

• Masami Kageshima

Beilstein J. Nanotechnol. 2012, 3, 260–266, doi:10.3762/bjnano.3.29

• data acquisition. There is no insurance against fluctuation of the true tip–sample distance due to thermal or mechanical drift, although it was confirmed after data acquisition that the tip had not drifted into contact with the substrate. For further progress it is necessary to combine the present

Molecular-resolution imaging of pentacene on KCl(001)

• Julia L. Neff,
• Jan Götzen,
• Enhui Li,
• Michael Marz and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2012, 3, 186–191, doi:10.3762/bjnano.3.20

• temperatures. For the data shown here the sample was cooled to below 28 K and investigated under conditions of a nonconstant thermal drift smaller than 0.1 Å/s. The piezo-scanner calibration was double checked by performing high-resolution measurements on the Si(111) surface. To reduce the influence of long

• observed alignment and the expected one is consistent with thermal drift. In Figure 2c two possible molecular arrangements are displayed. For both arrangements the molecules have been associated with the dark features of the image, as is typical for inverted contrast, but an association with the bright

Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)

• Christian Held,
• Thomas Seyller and
• Roland Bennewitz

Beilstein J. Nanotechnol. 2012, 3, 179–185, doi:10.3762/bjnano.3.19

• two-dimensional histograms. The contact potential signal recorded in KPFM shows only a little noise and drift, and can be directly processed in the form of histograms. In contrast, the topography signal needs to be processed to correct for the effects of drift, piezo creep, and piezo hysteresis [26

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

• Maximilian Schneiderbauer,
• Daniel Wastl and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18

• this tip, and with an amplitude of 20 nm in both paths and a lift height of 45 nm, we imaged the bit structure of the hard-disc sample. The topographic image shows the typical surface texture of a hard disc (Figure 2a). The sizeable drift in both images is due to long measuring times, which were

• a small magnetic moment reduce the interaction energy (Equation 5) and thus the signal strength, bringing the signal close to its noise floor. Here a trade-off has to be made between increased sensitivity due to decreased measurement bandwidth and large thermal drift at room temperature due to long

• to be set to relatively slow values, allowing for a small bandwidth, but leading to sizeable drift, as seen in both sets of Figure 3. The frequency-shift data set in the second (MFM) path was flattened by applying a simple parabolic fit and shows an image contrast of ±10 mHz (Figure 3b). Along the

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe

• Adam Sweetman,
• Sam Jarvis,
• Rosanna Danza and
• Philip Moriarty

Beilstein J. Nanotechnol. 2012, 3, 25–32, doi:10.3762/bjnano.3.3

• ), which is suggestive of two atoms terminating the tip and exhibiting radically different interactions with the surface, either due to different elemental composition, or a structurally distorted charge density. It should be noted that thermal drift during these scans was negligible (much less than one

• atomic diameter per scan), and therefore drift is not an issue in the assignment of atomic position. This assignment is confirmed by analysis of other images with similar contrast in which the presence of dopant-related defects [22][28] allows unambiguous identification of true contrast inversion

STM visualisation of counterions and the effect of charges on self-assembled monolayers of macrocycles

• Tibor Kudernac,
• Natalia Shabelina,
• Wael Mamdouh,
• Sigurd Höger and
• Steven De Feyter

Beilstein J. Nanotechnol. 2011, 2, 674–680, doi:10.3762/bjnano.2.72

• the liquid–solid interface within 1.5 h of the initial dropcasting of the solution. The HOPG lattice was recorded by lowering the bias immediately after obtaining images of the 2D structure. Images were corrected for drift effects using the HOPG lattice as calibration grid (Scanning Probe Image

Distinction of nucleobases – a tip-enhanced Raman approach

• Regina Treffer,
• Xiumei Lin,
• Elena Bailo,
• Tanja Deckert-Gaudig and
• Volker Deckert

Beilstein J. Nanotechnol. 2011, 2, 628–637, doi:10.3762/bjnano.2.66

• identical. This clearly indicates that the tip was positioned reliably at the selected positions and that sample drift was negligible during the measurement. The results also suggest that minute changes of the tip position can affect the spectral appearance as different parts of the molecule/strand

• the band 1590 cm−1 (Figure 2, tip position 4a and 4b), must then be attributed either to a drift of the instrument in the subnanometre range or to molecular orientation changes, e.g., rotation. An assignment for the TERS spectra measured at positions 3 and 4 is given in Table 1. For the band

Femtosecond time-resolved photodissociation dynamics of methyl halide molecules on ultrathin gold films

• Mihai E. Vaida,
• Robert Tchitnga and
• Thorsten M. Bernhardt

Beilstein J. Nanotechnol. 2011, 2, 618–627, doi:10.3762/bjnano.2.65

• spectrometer. The ions pass a field free drift tube with different velocities according to their mass-to-charge ratio and are finally detected by a multichannel plate amplifier arrangement as a function of their flight time. To obtain the transient evolution of the product ion mass signals, the mass peaks were

Nanostructured, mesoporous Au/TiO₂ model catalysts – structure, stability and catalytic properties

• Matthias Roos,
• Dominique Böcking,
• Kwabena Offeh Gyimah,
• Gabriela Kucerova,
• Joachim Bansmann,
• Johannes Biskupek,
• Ute Kaiser,
• Nicola Hüsing and
• R. Jürgen Behm

Beilstein J. Nanotechnol. 2011, 2, 593–606, doi:10.3762/bjnano.2.63

• . Scanning electron microscopy was carried out on a Zeiss NVision 040 equipped with in-lens secondary electron detector and back-scatter detector and an EDAX energy dispersive silicon drift X-ray detector. For imaging, a voltage of 1 kV was used, and for EDX spectroscopy an energy of 5 kV was used. CO

Terthiophene on Au(111): A scanning tunneling microscopy and spectroscopy study

• Berndt Koslowski,
• Anna Tschetschetkin,
• Norbert Maurer,
• Elena Mena-Osteritz,
• Peter Bäuerle and
• Paul Ziemann

Beilstein J. Nanotechnol. 2011, 2, 561–568, doi:10.3762/bjnano.2.60

• ). The corresponding conductivity maps are shown in the second column of Figure 4 for the HOMO (Figure 4(b)) and for the LUMO (Figure 4(f)). The lateral drift is negligible resulting in a excellent reproducibility of the lateral position during consecutive scans. The contour of the topography (half

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• atomic force microscopy (FM-AFM) or dynamic force microscopy (DFM). For the stability of tip and sample as well as for the reduction of piezo creep, piezo hysteresis, thermal drift and noise level, the setup was operated in ultrahigh vacuum (UHV) at low temperature (5 K). The resulting high stability

Sensing surface PEGylation with microcantilevers

• Natalija Backmann,
• Natascha Kappeler,
• Thomas Braun,
• François Huber,
• Hans-Peter Lang,
• Christoph Gerber and
• Roderick Y. H. Lim

Beilstein J. Nanotechnol. 2010, 1, 3–13, doi:10.3762/bjnano.1.2

• any signal drift caused by external influences such as buffer mixing effects, non-specific binding on the lower side of the microcantilever as well as temperature and refractive index changes [30]. To study surface PEGylation on the remaining six microcantilevers, the array was mounted into the

• (i.e., substrates), were functionalized by immersion in a mPEG–SH dilution (500 μM) in PBS for two hours at +20 °C. Prior to each measurement the system was allowed to equilibrate for 1 h after which the drift observed within individual force measurements (single approach-retract cycles) was negligible