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Search for "tapping mode" in Full Text gives 181 result(s) in Beilstein Journal of Nanotechnology.

Dense lying self-organized GaAsSb quantum dots on GaAs for efficient lasers

  • Thomas H. Loeber,
  • Dirk Hoffmann and
  • Henning Fouckhardt

Beilstein J. Nanotechnol. 2011, 2, 333–338, doi:10.3762/bjnano.2.39

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  • GaSb QDs were grown on an As-rich surface. The nominal coverage for all samples was 3 monolayers (ML) with a growth rate of ≈0.3 ML/s. The samples were cooled down to room temperature under the adjusted Sb flux immediately after the QD growth for topographic tapping-mode measurements with a Park XE-70
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Published 30 Jun 2011

Recrystallization of tubules from natural lotus (Nelumbo nucifera) wax on a Au(111) surface

  • Sujit Kumar Dora and
  • Klaus Wandelt

Beilstein J. Nanotechnol. 2011, 2, 261–267, doi:10.3762/bjnano.2.30

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  • (XRD) and electron diffraction (ED) techniques [10][11]. Koch and co-workers applied tapping mode AFM to study the continuous growth of nonacosan-10-ol tubules on HOPG [8]. By applying a 10 µL droplet of natural wax molecules derived from nasturtium (Tropaeolum majus) and lotus (Nelumbo nucifera
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Published 25 May 2011

Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle–substrate chemistry and morphology, and of operating conditions

  • Samer Darwich,
  • Karine Mougin,
  • Akshata Rao,
  • Enrico Gnecco,
  • Shrisudersan Jayaraman and
  • Hamidou Haidara

Beilstein J. Nanotechnol. 2011, 2, 85–98, doi:10.3762/bjnano.2.10

Graphical Abstract
  • intermittent tapping mode. The first mode used in AFM was the contact mode. Manipulation of large C60 islands on NaCl was performed by Lüthi et al. using contact AFM [11]. Even if the shear between islands and crystal surface can be derived from the frictional forces experienced by the AFM tip while scanning
  • lateral force threshold, particle sliding was observed, which has allowed the transition from static to kinetic friction to be quantified [18]. A compromise between the contact and non-contact AFM techniques is the intermittent mode, the so called tapping mode. In this mode the phase shift of the
  • nanoparticles deposited on highly oriented pyrolitic graphite using AFM in tapping mode. NPs were selectively moved as a function of their size varying from 24 up to 42 nm in diameter and the energy detachment threshold of NPs was estimated accordingly [19]. Sitti and coworkers have also manipulated nanoscale
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Published 04 Feb 2011

Biomimetics inspired surfaces for drag reduction and oleophobicity/philicity

  • Bharat Bhushan

Beilstein J. Nanotechnol. 2011, 2, 66–84, doi:10.3762/bjnano.2.9

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Published 01 Feb 2011

A collisional model for AFM manipulation of rigid nanoparticles

  • Enrico Gnecco

Beilstein J. Nanotechnol. 2010, 1, 158–162, doi:10.3762/bjnano.1.19

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  • is possible in simple cases of practical interest. Specifically, we assume that the AFM is operated in tapping mode (although some conclusions may be extended to contact mode), the particles are rigid and the frictional forces between particles and substrate can be neglected when the particles collide
  • where rP defines the position of the point of contact P with respect to the COM. The direction of the force F depends on the operating mode of the AFM. In tapping mode the tip oscillates in the z direction with a frequency in the order of 100 kHz with an amplitude of some tens of nm. This corresponds to
  • and r' is the first derivative of r(φ) with respect to φ (Figure 1b). In contact mode the tip hits the particle along the x direction and the force F can be oriented as in tapping mode only if the static friction force f between tip and particle is high enough to prevent sliding along the island profile
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Published 22 Dec 2010

Scanning probe microscopy and related methods

  • Ernst Meyer

Beilstein J. Nanotechnol. 2010, 1, 155–157, doi:10.3762/bjnano.1.18

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  • Microscopy, FMM: Force Modulation Microscopy, ic-AFM: intermittent contact AFM, TMAFM: tapping mode AFM, nc-AFM: non-contact AFM, KPFM: Kelvin probe force microscopy, EFM: Electrostatic force microscopy, MFM: Magnetic force microscopy, MRFM: Magnetic resonance force microscopy, NSOM: Near-field scanning
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Published 22 Dec 2010
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