Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFM

• Thilo Glatzel,
• Lars Zimmerli,
• Shigeki Kawai,
• Ernst Meyer,
• Leslie-Anne Fendt and
• Francois Diederich

Beilstein J. Nanotechnol. 2011, 2, 34–39, doi:10.3762/bjnano.2.4

• their intermolecular π–π stacking. Experimental Experiments were performed under ultrahigh vacuum (UHV) conditions with a base pressure below 10−10 mbar using a home built non-contact atomic force microscope operated at rt [39]. In the nc-AFM mode, the tip-sample distance is usually controlled by

Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

• Thomas König,
• Georg H. Simon,
• Lars Heinke,
• Leonid Lichtenstein and
• Markus Heyde

Beilstein J. Nanotechnol. 2011, 2, 1–14, doi:10.3762/bjnano.2.1

• atomic force microscopy (FM-AFM) or dynamic force microscopy (DFM). For the stability of tip and sample as well as for the reduction of piezo creep, piezo hysteresis, thermal drift and noise level, the setup was operated in ultrahigh vacuum (UHV) at low temperature (5 K). The resulting high stability