Pulsed laser in liquid grafting of gold nanoparticle–carbon support composites

• Madeleine K. Wilsey,
• Teona Taseska,
• Qishen Lyu,
• Connor P. Cox and
• Astrid M. Müller

Beilstein J. Nanotechnol. 2025, 16, 349–361, doi:10.3762/bjnano.16.26

• scattering by the carbon fibers. The pulsed laser-grafted gold nanoparticles exhibited cauliflower morphology with approximately 200 nm diameter and no detectable carbonaceous shells (Figure 2B and cf. X-ray photoelectron spectroscopy (XPS) data below). Assembly of gold nanoparticles by nanosecond laser

• pulses in liquids has been reported [43]. A generation of similar concave edges occurs in twinning. Twinned gold nanoparticles have been found to exhibit enhanced electrocatalytic activity in reductions because of an increased number of undercoordinated surface sites [44]. XPS data corroborate the

• fit the data, including an asymmetric peak and a shake-up peak, in keeping with previously reported XPS data of graphitic carbon [45][46][47][48]. The asymmetric peak with a central binding energy range of 284.5 to 285.0 eV was assigned to graphitic carbon, in agreement with reported values [49][50

Graphene oxide–chloroquine conjugate induces DNA damage in A549 lung cancer cells through autophagy modulation

• Braham Dutt Arya,
• Sandeep Mittal,
• Prachi Joshi,
• Alok Kumar Pandey,
• Jaime E. Ramirez-Vick,
• Govind Gupta and
• Surinder P. Singh

Beilstein J. Nanotechnol. 2025, 16, 316–332, doi:10.3762/bjnano.16.24

• GO and GO–Chl nanoconjugate via UV–vis, FTIR, Raman Spectroscopy, FESEM, and HRTEM. Figure S2 shows the atomic force microscopy-based topographical analysis of GO nanosheets. Figure S3 represents the XPS survey spectra of GO, GO–Chl, and Chl. Table S1 shows the summary of fitting parameters for the

Correction: AFM-IR investigation of thin PECVD SiO_x films on a polypropylene substrate in the surface-sensitive mode

• Hendrik Müller,
• Hartmut Stadler,
• Teresa de los Arcos,
• Adrian Keller and
• Guido Grundmeier

Beilstein J. Nanotechnol. 2025, 16, 252–253, doi:10.3762/bjnano.16.19

• /bjnano.16.19 Keywords: AFM-IR; polypropylene; surface-sensitive mode; silicon oxide; thin films; XPS; The authors regret that the acknowledgement in the publication is unfortunately not complete. The following sentence in the Funding section is missing: This work was supported by the German Research

A review of metal-organic frameworks and polymers in mixed matrix membranes for CO₂ capture

• Charlotte Skjold Qvist Christensen,
• Nicholas Hansen,
• Mahboubeh Motadayen,
• Nina Lock,
• Martin Lahn Henriksen and
• Jonathan Quinson

Beilstein J. Nanotechnol. 2025, 16, 155–186, doi:10.3762/bjnano.16.14

• MOF-based MMM system that perturb the crystallinity in the membrane will be discernable through XRD [121][129]. Energy-dispersive X-ray spectroscopy (EDX), and X-ray photoelectron spectroscopy (XPS) are commonly used to supplement the chemical analysis of MOF-based MMMs [113][137][143]. EDX can

• integration of MOFs in the polymeric membrane [113][137][143][146][147]. XPS is commonly used for obtaining spectra of the chemical composition of the outermost 10 nm of a surface. Specifically, XPS provides a spectral representation of binding energies on the surface, which can be referenced to specific

• chemical states [148]. In MOF-based MMMs, XPS can help elucidate unique chemical coordination within the membrane [143]. Physical properties such as the surface area and pore size distribution are commonly determined through Brunauer–Emmett–Teller (BET) analysis [121][124][125][129][130][131], where the

Clays enhanced with niobium: potential in wastewater treatment and reuse as pigment with antibacterial activity

• Silvia Jaerger,
• Patricia Appelt,
• Mario Antônio Alves da Cunha,
• Fabián Ccahuana Ayma,
• Ricardo Schneider,
• Carla Bittencourt and
• Fauze Jacó Anaissi

Beilstein J. Nanotechnol. 2025, 16, 141–154, doi:10.3762/bjnano.16.13

• mode. Powder and paint-applied samples were analyzed by colorimetry, based on the CIEL*a*b* system, using a portable colorimeter (NR60CP – 3NH). The oxidation state and elemental composition of the samples were evaluated using X-ray photoelectron spectroscopy (XPS) with a PHI Genesis instrument from

• -BEOxP samples exhibit a set of bands in the region from 1477 to 1277 cm−1 typical for the identification of the MB dye, indicating the presence of the dye in the clay structure [18]. Figure 5 shows the XPS analysis of niobium in BEOx and BEPh samples (Figure 4a and Figure 4b, respectively). The Nb 3d

• spectra exhibit two distinct peaks centered at 207.5 and 210.2 eV, corresponding to Nb 3d5/2 and Nb 3d3/2, respectively, indicative of niobium +5. The O 1s XPS spectra are shown in Figure 5c for BEOx and Figure 5d for BEPh. The spectra of samples BEOx and BEPh are reproduced with two components centered

TiO₂ immobilized on 2D mordenite: effect of hydrolysis conditions on structural, textural, and optical characteristics of the nanocomposites

• Marina G. Shelyapina,
• Rosario Isidro Yocupicio-Gaxiola,
• Gleb A. Valkovsky and
• Vitalii Petranovskii

Beilstein J. Nanotechnol. 2025, 16, 128–140, doi:10.3762/bjnano.16.12

• complementary characterization techniques, including XRD, SEM-EDX, TGA, N2 sorption, NMR, XPS and UV–vis spectrometry. It was observed that treatment in 70% ethanol solution preserves the ordered layered structure of 2D mordenite because TEOT hydrolysis is slowed down. This, in turn, leads to higher

• and TEOT, studied in our previous work [5], for which even after hydrolysis for 12 h in water the long-range order of the lamellae was preserved. The results of the elemental analysis using energy dispersive X-ray (EDX) and X-ray photoelectron spectroscopy (XPS) of the parent lamellar sample and TiO2

• -loaded samples are summarized in Table 1. Upon formation of TiO2 nanoparticles, a partial dealumination of mordenite occurs. However, the Al distribution over the sample depth is not homogenous. XPS shows that Al is accumulated on the sample surface. The hydrolysis medium does not significantly affect

Electrochemical nanostructured CuBTC/FeBTC MOF composite sensor for enrofloxacin detection

• Thi Kim Ngan Nguyen,
• Tien Dat Doan,
• Huy Hieu Luu,
• Hoang Anh Nguyen,
• Thi Thu Ha Vu,
• Quang Hai Tran,
• Ha Tran Nguyen,
• Thanh Binh Dang,
• Thi Hai Yen Pham and
• Mai Ha Hoang

Beilstein J. Nanotechnol. 2024, 15, 1522–1535, doi:10.3762/bjnano.15.120

• , average pore diameter, and surface area of FeBTC are 1.46 cm3/g, 2.38 nm, and 1211 m2/g, respectively [37]. Surface area, total pore volume, and average pore diameter of CuBTC are 1134 m2/g, 0.49 cm3/g, and 1.74 nm, respectively [38]. The full-scan XPS spectrum of (Cu)(Fe)BTC (Figure 2a) shows the

• existence of C (284 eV), O (532 eV), Fe (712 and 726 eV), and Cu (935 eV). The C 1s XPS spectrum of the (Cu)(Fe)BTC sample (Figure 2b) reveals four peaks attributed to C=C/C–C (284.78 eV), C–O (285.42 eV), C=O (286.11 eV), and O–C=O (288.62 eV) [39]. The high-resolution O 1s XPS spectrum (Figure 2c) can be

• decomposed into oxygen in carboxyl groups (531.74 eV) and physically adsorbed –OH groups (533.30 eV) [40]. In the Fe 2p XPS spectra (Figure 2d), the binding energy peaks of Fe 2p3/2 correspond to Fe2+ and Fe3+ with peak positions at 711.42 and 713.35 eV, respectively. The Fe 2p1/2 peaks correspond to Fe2

Ion-induced surface reactions and deposition from Pt(CO)₂Cl₂ and Pt(CO)₂Br₂

• Mohammed K. Abdel-Rahman,
• Patrick M. Eckhert,
• Atul Chaudhary,
• Johnathon M. Johnson,
• Jo-Chi Yu,
• Lisa McElwee-White and
• D. Howard Fairbrother

Beilstein J. Nanotechnol. 2024, 15, 1427–1439, doi:10.3762/bjnano.15.115

• under steady-state conditions. X-ray photoelectron spectroscopy (XPS) and mass spectrometry data from monolayer thick films of Pt(CO)2Cl2 and Pt(CO)2Br2 exposed to 3 keV Ar+, He+, and H2+ ions indicate that deposition is initiated by the desorption of both CO ligands, a process ascribed to momentum

• elementary reaction steps is invariant, although the rates of CO desorption and subsequent physical sputtering were greatest for the heaviest (Ar+) ions. The ability of IBID to produce pure Pt films was confirmed by AES and XPS analysis of thin film deposits created by Ar+/Pt(CO)2Cl2, demonstrating the

• leads to a corresponding increase in the fractions of Pt and halogen in the films (Figure 5). For higher ion doses, XPS data (Figure 2) shows that both halogen and Pt atoms are removed from the film, but the rate of halogen removal is noticeably faster. Consequently, after a (scaled) ion dose of ca. 4

A biomimetic approach towards a universal slippery liquid infused surface coating

• Ryan A. Faase,
• Madeleine H. Hummel,
• AnneMarie V. Hasbrook,
• Andrew P. Carpenter and
• Joe E. Baio

Beilstein J. Nanotechnol. 2024, 15, 1376–1389, doi:10.3762/bjnano.15.111

• force microscopy (AFM), sum frequency generation spectroscopy (SFG), and X-ray photoelectron spectroscopy (XPS). Measuring static water contact angles is a straightforward method to determine the relative wettability of a material and allows for a quick check if our surface modifications were successful

• , which has the ability to probe vibrational modes at an interface, thereby, providing insight into the order and confirmation of molecules at an interface [26][27]. XPS is a surface-sensitive technique to determine the atomic composition of the outer ca. 10 nm of a surface [28]. As mentioned above, SLIPS

• composition of the layer was determined by XPS. Surface roughness was evaluated using AFM to confirm successful formation of a porous structure. Finally, ordering of specific chemical groups within our PDA SLIPS layer was explored via SFG spectroscopy. Initially, each functionalization step was assessed

Green synthesis of carbon dot structures from Rheum Ribes and Schottky diode fabrication

• Muhammed Taha Durmus and
• Ebru Bozkurt

Beilstein J. Nanotechnol. 2024, 15, 1369–1375, doi:10.3762/bjnano.15.110

• synthesis, which is commonly used in the literature. TEM and zeta potential measurements were used to determine morphology and sizes of the CDs, and XRD, XPS, and FTIR and micro-Raman spectroscopy were used for structural characterization. Optical characterization of the CDs was done by absorption and

• Cary Eclipse fluorescence spectrophotometer were used for transmission electron microscopy (TEM), zeta potential measurements, X-ray diffractometry (XRD), Fourier-transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS), micro-Raman spectroscopy, PVD thermal evaporation, scanning

• and the thickness of coated CDs film were 1 cm2 and ca. 566 nm, respectively. Results and Discussion Structural and optical characterization of synthesized CDs The morphological and chemical structures of the CDs obtained from Rheum ribes were determined by TEM, FTIR, XRD, and XPS analyses. TEM shows

Interaction of graphene oxide with tannic acid: computational modeling and toxicity mitigation in C. elegans

• Romana Petry,
• James M. de Almeida,
• Francine Côa,
• Felipe Crasto de Lima,
• Diego Stéfani T. Martinez and
• Adalberto Fazzio

Beilstein J. Nanotechnol. 2024, 15, 1297–1311, doi:10.3762/bjnano.15.105

• complete characterization of the GO sample is available in [36]. Atomic force microscopy (AFM), Raman spectroscopy, and X-ray photoelectron spectroscopy (XPS) were used to assess size, morphology, number of layers, and surface chemistry of GO. The GO sample used in this study consists of single layers with

• composition analyzed by X-ray photoelectron spectroscopy (XPS) is 68% of carbon and 32% of oxygen. The functional groups and bonds of carbon are distributed among epoxy/hydroxy (C–O) (52%), carboxyl/esters (C=O) (9.4%), and π–π* (4.2%) moieties, besides graphitic/aromatic carbon (C sp2) (5.7%) and aliphatic

• , to 1.02 ± 0.01 and 1.05 ± 0.005 when the material was incubated in EPA medium without and with TA, respectively (Figure 2b). All Raman spectra were normalized to the intensity of the respective G bands. X-ray photoelectron spectroscopy (XPS) presented the composition of GO surface in the presence of

Dual-functionalized architecture enables stable and tumor cell-specific SiO₂NPs in complex biological fluids

• Iris Renata Sousa Ribeiro,
• Raquel Frenedoso da Silva,
• Romênia Ramos Domingues,
• Adriana Franco Paes Leme and
• Mateus Borba Cardoso

Beilstein J. Nanotechnol. 2024, 15, 1238–1252, doi:10.3762/bjnano.15.100

• at 100 °C and the percentages of carbon, nitrogen, and hydrogen were obtained. It is noteworthy that only the nitrogen percentages were considered for the calculations. The elemental composition of the NP surface was obtained using a K-Alpha XPS (Thermo Fisher Scientific) which operates with Al Kα X

• degree of SiO2NPs-ZW-FO aggregation or even the possibility of folate hiding some negative charges on the NP surface. In short, it was impossible to confirm the steps of the SiO2NP functionalization process through zeta potential measurements. Elemental analysis and XPS techniques were further used to

• . According to the XPS measurements, no peaks were identified in the non-functionalized SiO2NPs (Supporting Information File 1, Figure S4a). On the other hand, two peaks were observed for SiO2NPs-ZW (Supporting Information File 1, Figure S4b), which correspond to the N+(CH3)3 (402 eV) and N–C (400 eV) bonds

Facile synthesis of Fe-based metal–organic frameworks from Fe₂O₃ nanoparticles and their application for CO₂/N₂ separation

• Van Nhieu Le,
• Hoai Duc Tran,
• Minh Tien Nguyen,
• Hai Bang Truong,
• Toan Minh Pham and
• Jinsoo Kim

Beilstein J. Nanotechnol. 2024, 15, 897–908, doi:10.3762/bjnano.15.74

• (XPS). Subsequently, the gas separation performance of the as-prepared MIL-100(Fe) samples was assessed by studies regarding CO2 and N2 adsorption isotherms at various temperatures with pressures up to 1 bar. Experimental Materials Iron(III) oxide (Fe2O3, 96%) and benzene-1,3,5-tricarboxylic acid

• , MIL-100(Fe), and M-100Fe@Fe2O3 samples. XPS spectra of Fe2O3 and M-100Fe@Fe2O3#1.80 samples: (a) Fe 2p region and (b) O 1 s region. Adsorption isotherms of M-100Fe@Fe2O3 and reference MIL-100(Fe) samples at 298 K: (a) CO2 adsorption isotherms, (b) N2 adsorption isotherms. IAST-derived CO2/N2

Intermixing of MoS₂ and WS₂ photocatalysts toward methylene blue photodegradation

• Maryam Al Qaydi,
• Nitul S. Rajput,
• Michael Lejeune,
• Abdellatif Bouchalkha,
• Mimoun El Marssi,
• Steevy Cordette,
• Chaouki Kasmi and
• Mustapha Jouiad

Beilstein J. Nanotechnol. 2024, 15, 817–829, doi:10.3762/bjnano.15.68

• additional peaks observed in all XRD diagrams at ≈37° and ≈69° positions are due to the silicon substrate. The X-ray photoelectron spectroscopy (XPS) survey scans and high-resolution scans for all samples are presented in Figure 3a–j. All XPS analyses were first calibrated using the C 1s peak of carbon at

• the W 4f doublet (W 4f7/2 and W 4f5/2) [31]. An additional minor peak appearing at ≈38.7 eV is identified as W 5p3/2 [31]. The XPS analysis of the composite sample indicates the presence of the Mo 3d doublet peaks and S 2s peaks as well as the W 4f doublets, in addition to a peak appearing at ≈36.2 eV

• ascribed to W–O bonding [31]. This suggests the presence of minor oxidation of the flakes. Further quantitative analysis of XPS data indicates the following atomic compositions: Mo: 34.68%, S: 65.32%, W: 33.98%, S: 66.02%, and Mo: 14.06%, W: 23.70, S: 62.24%, respectively for MoS2, WS2, and MoS2/WS2

Electron-induced ligand loss from iron tetracarbonyl methyl acrylate

• Hlib Lyshchuk,
• Atul Chaudhary,
• Thomas F. M. Luxford,
• Miloš Ranković,
• Jaroslav Kočišek,
• Juraj Fedor,
• Lisa McElwee-White and
• Pamir Nag

Beilstein J. Nanotechnol. 2024, 15, 797–807, doi:10.3762/bjnano.15.66

• surface-based investigations, where the electron-induced ligand loss has been probed by XPS [13], ion desorption [14], IR spectroscopy [15], or cluster-beam studies [16][17][18]. The ligand loss has also been probed by ion impact, both in the gas phase [19] and on the surface [13], and, theoretically, by

Effect of repeating hydrothermal growth processes and rapid thermal annealing on CuO thin film properties

• Monika Ozga,
• Eunika Zielony,
• Aleksandra Wierzbicka,
• Anna Wolska,
• Marcin Klepka,
• Marek Godlewski,
• Bogdan J. Kowalski and
• Bartłomiej S. Witkowski

Beilstein J. Nanotechnol. 2024, 15, 743–754, doi:10.3762/bjnano.15.62

• underwent structural analysis using a high-resolution X-ray diffractometer X’Pert Pro MRD (Panalytical) equipped with a Cu anode (λ = 1.54060 Å). X-ray photoelectron spectroscopy (XPS) measurements were conducted utilizing a Scienta R4000 hemispherical analyzer with a pass energy of 200 eV and monochromatic

• Al Kα (1486.7 eV) excitation (Scienta MX-650) operating at 150 W. The energy scale was calibrated by setting the C–C bond at 285 eV. Analysis of the spectra was performed using the commercial CASA XPS software package (Casa Software Ltd., version 2.3.17) with Shirley background. The Gaussian

• content in the CuO films. The chemical composition of such thin films determined using EDX is only an approximation. However, the obtained results demonstrate a clear trend of decreasing carbon content in the material with successive HT+RTA cycles. To validate those findings, additional XPS analyses were

Laser synthesis of nanoparticles in organic solvents – products, reactions, and perspectives

• Theo Fromme,
• Sven Reichenberger,
• Katharine M. Tibbetts and
• Stephan Barcikowski

Beilstein J. Nanotechnol. 2024, 15, 638–663, doi:10.3762/bjnano.15.54

AFM-IR investigation of thin PECVD SiO_x films on a polypropylene substrate in the surface-sensitive mode

• Hendrik Müller,
• Hartmut Stadler,
• Teresa de los Arcos,
• Adrian Keller and
• Guido Grundmeier

Beilstein J. Nanotechnol. 2024, 15, 603–611, doi:10.3762/bjnano.15.51

• signal of the substrate material could be significantly reduced. Even layers that are so thin that they could hardly be measured in the contact mode can be analyzed with the surface-sensitive mode. Keywords: AFM-IR; polypropylene; surface-sensitive mode; silicon oxide; thin films; XPS; Introduction

• spectroscopy (NAP-XPS) using a NAP-XPS system with a Phoibos150 NAP analyzer from Specs Surface Nano Analysis GmbH. The setup has a µ-FOCUS 600 X-ray monochromator NAP source working with monochromatic Al Kα radiation at 1468.7 eV. The power was set to 50 W for all measurements. For the environmental charge

• level spectra, a Shirley type background was used. The Si 2p peak was fitted with doublet peaks with a Si 2p3/2-1/2 splitting of 0.6 eV [18]. Results and Discussion XPS analysis The XPS data in Figure 2 and Figure 3 show that the deposition of silicon oxide thin films was successful. In the survey

Controllable physicochemical properties of WO_x thin films grown under glancing angle

• Rupam Mandal,
• Aparajita Mandal,
• Alapan Dutta,
• Rengasamy Sivakumar,
• Sanjeev Kumar Srivastava and
• Tapobrata Som

Beilstein J. Nanotechnol. 2024, 15, 350–359, doi:10.3762/bjnano.15.31

• identified using X-ray photoelectron spectroscopy (XPS) measurements (PHI 5000 VersaProbeII, ULVAC – PHI, INC) with a monochromatic Al Kα source (hν = 1486.6 eV), and a microfocus (100 µm, 15 kV, 25 W) arrangement along with a multichannel detector and a hemispherical analyser. The microstructure of the WOx

• , chemical analysis on the NS-WOx films is conducted using XPS measurements. Figure 3a–d depicts the XPS core-level spectra of W 4f and O 1s for as-deposited and annealed films, each having a thickness of 6 nm. The W 4f spectra are deconvoluted into two major and two minor peaks using Gaussian–Lorentzian

• annealed WOx films [40]. The results suggest that the relative OV concentration in the WOx films increases from 19 to 25% after vacuum annealing; consequently, a rise in the W5+ component is also observed. In contrast, XPS analysis on a 30 nm as-deposited film (Figure S2a,b in Supporting Information File 1

CdSe/ZnS quantum dots as a booster in the active layer of distributed ternary organic photovoltaics

• Gabriela Lewińska,
• Piotr Jeleń,
• Zofia Kucia,
• Maciej Sitarz,
• Łukasz Walczak,
• Bartłomiej Szafraniak,
• Jerzy Sanetra and
• Konstanty W. Marszalek

Beilstein J. Nanotechnol. 2024, 15, 144–156, doi:10.3762/bjnano.15.14

• pressure of approximately 8 × 10−10 mbar, using the XPS/UPS/ARPES PREVAC setup. The analysis chamber was equipped with a PREVAC Ea15 hemispherical analyzer and a PREVAC EA15 40B source (UV power U = 0.56 kV, PUV = 55 W, He I). The beam energy scale was calibrated at the Fermi level of 16.87 eV. The samples

Study of the reusability and stability of nylon nanofibres as an antibody immobilisation surface

• Inés Peraile,
• Matilde Gil-García,
• Laura González-López,
• Nushin A. Dabbagh-Escalante,
• Juan C. Cabria-Ramos and
• Paloma Lorenzo-Lozano

Beilstein J. Nanotechnol. 2024, 15, 83–94, doi:10.3762/bjnano.15.8

• . The fluorescence signals were measured using a Gemini XPS Microplate Reader (Molecular Devices) in RFU. Anchored antibody was measured as FITC-fluorescence (λemission = 490 nm and λexcitation = 521 nm) after incubation and subsequent wash, divided by the FITC fluorescence obtained just before antibody

A combined gas-phase dissociative ionization, dissociative electron attachment and deposition study on the potential FEBID precursor [Au(CH₃)₂Cl]₂

• Elif Bilgilisoy,
• Ali Kamali,
• Thomas Xaver Gentner,
• Gerd Ballmann,
• Sjoerd Harder,
• Hans-Peter Steinrück,
• Hubertus Marbach and
• Oddur Ingólfsson

Beilstein J. Nanotechnol. 2023, 14, 1178–1199, doi:10.3762/bjnano.14.98

• and through reductive halogen removal using atomic hydrogen [58]. In an early study by Spencer et al. [57], 0.7 nm layers of Pt(CO)2Cl2 were exposed to 500 eV electrons and desorbing ligands were monitored by mass spectrometry, while the development of the deposit was monitored using XPS. It was found

Properties of tin oxide films grown by atomic layer deposition from tin tetraiodide and ozone

• Kristjan Kalam,
• Peeter Ritslaid,
• Tanel Käämbre,
• Aile Tamm and
• Kaupo Kukli

Beilstein J. Nanotechnol. 2023, 14, 1085–1092, doi:10.3762/bjnano.14.89

• grazing incidence X-ray diffractometry (GIXRD), using an X-ray diffractometer SmartLab Rigaku with Cu Kα radiation, which corresponds to an X-ray wavelength of 0.15406 nm. X-ray photoelectron emission and X-ray absorption spectroscopy (XPS and XAS, respectively) measurements were made at the FinEstBeAMS

• beamline [18] at a solids research endstation [19]. XPS was carried out using a SPECS Phoibos150 hemispherical photoelectron kinetic energy analyser at an overall spectral resolution of 0.3 eV. XAS was carried out at 0.1 eV spectral resolution in total electron yield (TEY) mode by measuring sample

• ]. The SnO2 films grown at 300 and 500 °C, that is, those with low residual iodine content, were analysed ex situ in terms of surface chemistry using soft X-ray spectroscopy methods. The Sn 3d XPS data (Figure 10a) show almost identical spectra for the samples deposited at 300 and 500 °C, and the narrow

Experimental investigation of usage of POE lubricants with Al₂O₃, graphene or CNT nanoparticles in a refrigeration compressor

• Kayhan Dağıdır and
• Kemal Bilen

Beilstein J. Nanotechnol. 2023, 14, 1041–1058, doi:10.3762/bjnano.14.86

• hybridisation in the chemical structure of the material. The chemical states of the elements for the graphene nanoplatelets were evaluated by XPS. Figure 16a shows a graphitic C 1s peak at 284.27 eV and a weak O 1s peak at 532.09 eV. Figure 16b shows that the graphene has a single intense peak at 284.19 eV

• corresponding to the sp2-hybridised C–C system. The XPS data obtained are also consistent with previous studies [41][42]. As a result, the high purity and low defect structures of graphene nanoplatelets used in this study are understood. This supports the fact that the best improvement occurs in the graphene

• compressor electrical power for the usage of nanolubricants with a) Al2O3, b) graphene, and c) CNTs. Required compressor electrical power for nanolubricants with optimum mass fraction of nanoparticles. Raman spectroscopy of the graphene nanoplatelets. XPS of the graphene nanoplatelets. Kinematic viscosity of

Low temperature atomic layer deposition of cobalt using dicobalt hexacarbonyl-1-heptyne as precursor

• Mathias Franz,
• Mahnaz Safian Jouzdani,
• Lysann Kaßner,
• Marcus Daniel,
• Frank Stahr and
• Stefan E. Schulz

Beilstein J. Nanotechnol. 2023, 14, 951–963, doi:10.3762/bjnano.14.78

• -temperature ALD; PEALD; plasma-enhanced ALD; XPS; Introduction The atomic layer deposition (ALD) of cobalt films is an ongoing topic of interest [1]. Cobalt thin and ultrathin films play an important role in current generations of integrated circuits [2]. Compared to copper, the metal offers a greater

• metallic cobalt according to Ward [24] combined with a Tauc–Lorentzian model for possible occurrences of oxidised cobalt [25][26]. The film compositions were measured ex situ by X-ray photoelectron spectroscopy (XPS) on a PRECAV sp. Z. o. o. XPS system using a MX-650 Al X-ray source and a R3000 analyser

• from VG Scienta using a fixed pass energy of 200 eV. The sample was pre-cleaned by argon sputtering for 2 min with 4.0 keV acceleration energy to remove surface adsorbents and contaminations. The data were analysed using MATPLOTLIB [27][28] and LMFIT [29]. The XPS spectra were corrected using the