Unveiling the nature of atomic defects in graphene on a metal surface

• Karl Rothe,
• Nicolas Néel and
• Jörg Kröger

Beilstein J. Nanotechnol. 2024, 15, 416–425, doi:10.3762/bjnano.15.37

• bond with the microscope probe is reflected by the strongest attraction at the vacancy center as well as by hysteresis effects in force traces recorded for tip approach to and retraction from the Pauli repulsion range of vertical distances. Keywords: atomic force microscopy and spectroscopy; graphene

• following. Atomic force microscopy and spectroscopy findings Figure 2 compares constant-height AFM topographs of the defects (Figure 2a,c) with simultaneously recorded current maps of the same defects (Figure 2b,d). The tip–surface distance for the AFM and current maps was defined by the tip excursions