Crystalline and amorphous structure selectivity of ignoble high-entropy alloy nanoparticles during laser ablation in organic liquids is set by pulse duration

• Robert Stuckert,
• Felix Pohl,
• Oleg Prymak,
• Ulrich Schürmann,
• Christoph Rehbock,
• Lorenz Kienle and
• Stephan Barcikowski

Beilstein J. Nanotechnol. 2025, 16, 1141–1159, doi:10.3762/bjnano.16.84

Deep learning for enhancement of low-resolution and noisy scanning probe microscopy images

• Samuel Gelman,
• Irit Rosenhek-Goldian,
• Nir Kampf,
• Marek Patočka,
• Maricarmen Rios,
• Marcos Penedo,
• Georg Fantner,
• Amir Beker,
• Sidney R. Cohen and
• Ido Azuri

Beilstein J. Nanotechnol. 2025, 16, 1129–1140, doi:10.3762/bjnano.16.83

• each low-resolution image, a corresponding AFM high-resolution image was measured and served as the GT. This enabled us to evaluate the 4× upscaled image fidelity with respect to its GT high-resolution AFM image. Due to drift between acquisition at the two different resolutions, it was often necessary

• image overlap across image pairs. Nevertheless, the overlap location is not perfect due to typical AFM drift. This is also projected on the corresponding images obtained by the traditional methods and SR deep learning models. Hence, it was necessary to first align the obtained images with respect to

Towards a quantitative theory for transmission X-ray microscopy

• James G. McNally,
• Christoph Pratsch,
• Stephan Werner,
• Stefan Rehbein,
• Andrew Gibbs,
• Jihao Wang,
• Thomas Lunkenbein,
• Peter Guttmann and
• Gerd Schneider

Beilstein J. Nanotechnol. 2025, 16, 1113–1128, doi:10.3762/bjnano.16.82

• (containing a silicon core). A sub-image (yellow box) around an isolated 60 nm gold nanosphere was extracted to produce a 3D volume, whose xy, xz, and yz cuts are shown (b). Stage jitter and drift were corrected (c) using the StackReg plugin in imagej applied to the 3D stack defined by the dotted blue

Shape, membrane morphology, and morphodynamic response of metabolically active human mitochondria revealed by scanning ion conductance microscopy

• Eric Lieberwirth,
• Anja Schaeper,
• Regina Lange,
• Ingo Barke,
• Simone Baltrusch and
• Sylvia Speller

Beilstein J. Nanotechnol. 2025, 16, 951–967, doi:10.3762/bjnano.16.73

• artefacts such as (mechanical) hysteresis effects caused by the elastic behaviour of the measuring tip or the mechanical components of the SPM setup, as well as repeated displacements of the object during the scan of each line. Drift phenomena are considerable, too, which are primarily caused by the lateral

• passive effects, such as drift phenomena, cannot account for the observed decreasing trend or the uneven edge distribution across the mitochondrion. To find a possible explanation for the edge memory effect, we will focus on a key feature of the SICM setup, that is, the nanopipette. Our hypothesis is that

• passed since preparation. The values can be grouped. The groups are labelled with different colours (blue and green). Data points labelled as a diamond are measurements, which show more than 90% but less than 100% of the mitochondrion due to drift and self-motion (TEV nominally greater than measured

Tendency in tip polarity changes in non-contact atomic force microscopy imaging on a fluorite surface

• Bob Kyeyune,
• Philipp Rahe and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 944–950, doi:10.3762/bjnano.16.72

• constant-height mode using an atom-tracking and feed-forward system for instantaneous drift compensation [29]. All frequency shift (Δf) images are presented with regions of strong attractive tip–sample interaction depicted as ‘bright’ and regions of weak attractive or repulsive interaction reproduced as

The impact of tris(pentafluorophenyl)borane hole transport layer doping on interfacial charge extraction and recombination

• Konstantinos Bidinakis and
• Stefan A. L. Weber

Beilstein J. Nanotechnol. 2025, 16, 678–689, doi:10.3762/bjnano.16.52

• for static KPFM, which allows us to evaluate the response of our cells under both applied voltages and under illumination. Kelvin probe force microscopy characterization with an applied voltage When charges get generated, they drift to the sides of the device to externally recombine, or in the case of

• perovskite dark CPD also exhibited an increase relative to the CPD of the HTL. When the illumination is turned on, the BCF-doped spiro-OMeTAD cell exhibits a linear CPD, indicative of a homogeneous electric field within the perovskite and a p-i-n junction, where charges can drift inside the perovskite to the

Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

• Chinmai Sai Jureddy,
• Krzysztof Maćkosz,
• Aleksandra Butrymowicz-Kubiak,
• Iwona B. Szymańska,
• Patrik Hoffmann and
• Ivo Utke

Beilstein J. Nanotechnol. 2025, 16, 530–539, doi:10.3762/bjnano.16.41

• effective dwell time with a 600 nm FWHM of the electron beam), and 2000 cycles. For deposit morphology observation, a high-resolution Hitachi S4800 FESEM was used. The chemical composition of the deposits was confirmed through energy-dispersive X-ray spectroscopy (EDX) using a silicon drift detector from

• prepared on an ultrathin carbon support film spanning a lacey carbon membrane (Figure 2c). The deposit appears smeared because of drift caused by charging effects during the deposition process. High-resolution STEM imaging (Figure 2d,e) revealed a granular nanostructure with nanograins of around 2 nm in

Pulsed laser in liquid grafting of gold nanoparticle–carbon support composites

• Madeleine K. Wilsey,
• Teona Taseska,
• Qishen Lyu,
• Connor P. Cox and
• Astrid M. Müller

Beilstein J. Nanotechnol. 2025, 16, 349–361, doi:10.3762/bjnano.16.26

• scanning electron microscope with a Schottky field-emission emitter was operated at 20.00 kV with a working distance of 4.9 mm. Energy-dispersive X-ray (EDX) spectroscopy data were collected using an SEM-integrated EDAX Octane elect plus spectrometer with a with silicon drift detector. Double sided carbon

Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• 10.3762/bjnano.16.6 Keywords: AFM; atomic force microscopy; conductivity; drift correction; force spectroscopy; NC-AFM; non-contact atomic force microscopy; resistivity; tip–surface interaction; With the restrictions on travelling and social distancing lifted, we were delighted to continue two series of

• precision of scanning probe microscopy experiments by introducing a software for lateral drift correction [1]. Post-data acquisition drift correction for longer series of consecutively recorded image sets can be cumbersome and extremely time consuming. Here, the authors develop an easy-to-use and robust

• software tool (”unDrift”), which allows reliable and fast drift correction. Dickbreder et al. demonstrate the robust performance of the software tool by AFM data recorded under varying conditions (vacuum or liquid environment) on calcite surfaces with recording times up to several hours. The work by Nony

Precursor sticking coefficient determination from indented deposits fabricated by electron beam induced deposition

• Alexander Kuprava and
• Michael Huth

Beilstein J. Nanotechnol. 2025, 16, 35–43, doi:10.3762/bjnano.16.4

• 60° with the identical positioning. The background pressure was 4 × 10−7 mbar and rose to 5 × 10−7 mbar for Cr(C6H6)2 and 6 × 10−6 mbar for Me3CpPtMe during deposition at room temperature. To prevent any mechanical or beam drift, a waiting time of 10 min was introduced right before the start of the

Orientation-dependent photonic bandgaps in gold-dust weevil scales and their titania bioreplicates

• Norma Salvadores Farran,
• Limin Wang,
• Primoz Pirih and
• Bodo D. Wilts

Beilstein J. Nanotechnol. 2025, 16, 1–10, doi:10.3762/bjnano.16.1

• in-lens secondary electron detector at 5 kV acceleration voltage. These samples were coated with gold using a Cressington 208 HR sputter coater. Elemental analysis was performed with 8 kV acceleration voltage, using an EDX detector attached to the Zeiss SEM (X-Max silicon drift energy-dispersive

Out-of-plane polarization induces a picosecond photoresponse in rhombohedral stacked bilayer WSe₂

• Guixian Liu,
• Yufan Wang,
• Zhoujuan Xu,
• Zhouxiaosong Zeng,
• Lanyu Huang,
• Cuihuan Ge and
• Xiao Wang

Beilstein J. Nanotechnol. 2024, 15, 1362–1368, doi:10.3762/bjnano.15.109

• scanning photocurrent map under zero bias. In addition, the OOP polarization accelerates the drift of photogenerated carriers, giving the heterojunction region an ultrafast intrinsic response time of approximately 3 ps, surpassing that of graphene under the same conditions. Despite variations in probe

• the graphene region. This finding not only confirms the stability of the device but also demonstrates the acceleration effect of OOP polarization in 3R WSe2 on carrier drift. Although the power change does not affect the response time of the device, the increase in power generates more photogenerated

Quantum-to-classical modeling of monolayer Ge₂Se₂ and its application in photovoltaic devices

• Anup Shrivastava,
• Shivani Saini,
• Dolly Kumari,
• Sanjai Singh and
• Jost Adam

Beilstein J. Nanotechnol. 2024, 15, 1153–1169, doi:10.3762/bjnano.15.94

• astonishing device performance. We use ab initio modeling for the material prediction, while classical drift–diffusion drives the device simulations. Hybrid functionals calculate electronic and optical properties to maintain high accuracy. The structural stability has been verified using phonon spectra. The E

• the proposed solar cell, we performed a numerical simulation using SCAPS-1D, which solves the fundamental semiconductor equations such as drift–diffusion, Poisson’s equation, and continuity equations as: and where and are the electron and hole current densities at the Fermi levels EFn and EFp

Signal generation in dynamic interferometric displacement detection

• Knarik Khachatryan,
• Simon Anter,
• Michael Reichling and
• Alexander von Schmidsfeld

Beilstein J. Nanotechnol. 2024, 15, 1070–1076, doi:10.3762/bjnano.15.87

• temperature stabilisation of the laboratory and the scan head, care is taken to avoid any thermal drift of the cantilever eigenfrequency that might compromise measurements. A model MDO3000 oscilloscope (Tektronix Inc., Beaverton, OR, USA) is used to record the AC output signal of the photoreceiver, Vsig

Water-assisted purification during electron beam-induced deposition of platinum and gold

• Cristiano Glessi,
• Fabian A. Polman and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 884–896, doi:10.3762/bjnano.15.73

• experiment is quite low, the deposits only become visible at intermediate exposure times (100–500 passes). At higher exposure times, the deposits start broadening when the halo starts to develop; at the highest exposure times, deformation of the deposits is seen, which is ascribed to stage drift. In the etch

Synthesis of silver–palladium Janus nanoparticles using co-sputtering of independent sources: experimental and theorical study

• Maria J. Martínez-Carreón,
• Francisco Solís-Pomar,
• Abel Fundora,
• Claudio D. Gutiérrez-Lazos,
• Sergio Mejía-Rosales,
• Hector N. Fernández-Escamilla,
• Jonathan Guerrero-Sánchez,
• Manuel F. Meléndrez and
• Eduardo Pérez-Tijerina

Beilstein J. Nanotechnol. 2024, 15, 808–816, doi:10.3762/bjnano.15.67

• drift”. Figure 4b presents the spectrum of elementary analysis; the two elements silver and palladium appear. All characterization techniques, as well as the calculation of the interplanar distances, showed only the presence of silver and palladium without any contaminants or other metals, which

Effect of repeating hydrothermal growth processes and rapid thermal annealing on CuO thin film properties

• Monika Ozga,
• Eunika Zielony,
• Aleksandra Wierzbicka,
• Anna Wolska,
• Marcin Klepka,
• Marek Godlewski,
• Bogdan J. Kowalski and
• Bartłomiej S. Witkowski

Beilstein J. Nanotechnol. 2024, 15, 743–754, doi:10.3762/bjnano.15.62

• characterized using an analytical scanning electron microscope (SEM) Hitachi SU-70 with the X-ray microanalysis system (EDX) enabling composition analysis (Thermo Fisher Pathfinder system with a silicon drift detector). Additionally, in the study, a scanning probe microscope (Dimension Icon, Bruker) was used

Level set simulation of focused ion beam sputtering of a multilayer substrate

• Alexander V. Rumyantsev,
• Nikolai I. Borgardt,
• Roman L. Volkov and
• Yuri A. Chaplygin

Beilstein J. Nanotechnol. 2024, 15, 733–742, doi:10.3762/bjnano.15.61

• -quadrant silicon drift detector installed within the microscope. BCA Monte Carlo simulation Angular and energy distributions of sputtered atoms and backscattered ions were studied numerically employing the SDTrimSP software package [40]. The calculations were carried out in the static mode using the

Photocatalytic degradation of methylene blue under visible light by cobalt ferrite nanoparticles/graphene quantum dots

• Vo Chau Ngoc Anh,
• Le Thi Thanh Nhi,
• Le Thi Kim Dung,
• Dang Thi Ngoc Hoa,
• Nguyen Truong Son,
• Nguyen Thi Thao Uyen,
• Nguyen Ngoc Uyen Thu,
• Le Van Thanh Son,
• Le Trung Hieu,
• Tran Ngoc Tuyen and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2024, 15, 475–489, doi:10.3762/bjnano.15.43

• heterojunctions limit the recombination of photo-induced electron–hole pairs and, thus, enhance catalytic decolourisation. Therefore, the CF/GQDs-200 sample was selected for further studies. The point of zero charge (pzc) of CF/GQDs-200 obtained by the pH drift method is 6.6 (see the inset of Figure 7b

Influence of conductive carbon and MnCo₂O₄ on morphological and electrical properties of hydrogels for electrochemical energy conversion

• Sylwia Pawłowska,
• Karolina Cysewska,
• Yasamin Ziai,
• Jakub Karczewski,
• Piotr Jasiński and
• Sebastian Molin

Beilstein J. Nanotechnol. 2024, 15, 57–70, doi:10.3762/bjnano.15.6

• an accelerating voltage of 10 kV. Before imaging, the hydrogel samples were freeze-dried and coated with a 10 nm gold layer. The chemical composition of the hydrogel was analysed with a Thermo Fisher Scientific silicon drift detector energy-dispersive X-ray spectroscope. For characterisation of the

unDrift: A versatile software for fast offline SPM image drift correction

• Tobias Dickbreder,
• Franziska Sabath,
• Lukas Höltkemeier,
• Ralf Bechstein and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2023, 14, 1225–1237, doi:10.3762/bjnano.14.101

• properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a distortion of the recorded SPM data. Literature holds a multitude of strategies to compensate

• for drift during the measurement (online drift correction) or afterwards (offline drift correction). With the currently available software tools, however, offline drift correction of SPM data is often a tedious and time-consuming task. This is particularly disadvantageous when analyzing long image

• series. Here, we present unDrift, an easy-to-use scientific software for fast and reliable drift correction of SPM images. unDrift provides three different algorithms to determine the drift velocity based on two consecutive SPM images. All algorithms can drift-correct the input data without any

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

• drift [2][3]. Another issue is that some of the SPV components – related to dynamical processes – can remain hidden to this “conventional” SPV imaging [4]. To mitigate the effects of thermal drift, a first alternative consists in performing a data cube acquisition of CPD curves synchronously recorded

• dynamics is indeed the effective mobility of holes and electrons (under the effect of drift diffusion) in the donor and acceptor networks. After the application of a light pulse – and during the duration of the pulse – the charge mobility limits the rate at which an electrostatic equilibrium can be reached

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

• Zeinab Eftekhari,
• Nasim Rezaei,
• Hidde Stokkel,
• Jian-Yao Zheng,
• Andrea Cerreta,
• Ilka Hermes,
• Minh Nguyen,
• Guus Rijnders and
• Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

• for the micrometric measurement is comparable to the locally measured photovoltage. However, we were not able to quantify precisely the displacement of the membrane by conventional imaging since a temperature-induced drift occurs under illumination. Therefore, we modified the method in the point scan

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• extracted from a 65 decitex yarn. Fibers were mounted onto cardstock specimen holders, fixed with adhesive at two points approximately 15 mm apart from one another, and conductively coated with a gold–palladium mixture to mitigate sample drift, for example, due to sample charging effects inside the FIB

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

• Mattia da Lisca,
• José Alvarez,
• James P. Connolly,
• Nicolas Vaissiere,
• Karim Mekhazni,
• Jean Decobert and
• Jean-Paul Kleider

Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59

• KELSCAN [13], which evaluates the contact potential and surface photovoltage as a function of the position. The Silvaco ATLAS model solves the Poisson equation self-consistently coupled to carrier continuity and transport equations in the well-known drift diffusion model, which is given detail in [22] and

• formation of a depletion (or inversion) space charge layer imposed by the charge neutrality condition [32][35]. By illuminating the sample, a SPV is generated by the drift and diffusion of photogenerated carriers towards the surface, which counteracts the defect-induced band bending energy variations [20