Electron beam-based direct writing of nanostructures using a palladium β-ketoesterate complex

• Chinmai Sai Jureddy,
• Krzysztof Maćkosz,
• Aleksandra Butrymowicz-Kubiak,
• Iwona B. Szymańska,
• Patrik Hoffmann and
• Ivo Utke

Beilstein J. Nanotechnol. 2025, 16, 530–539, doi:10.3762/bjnano.16.41

• effective dwell time with a 600 nm FWHM of the electron beam), and 2000 cycles. For deposit morphology observation, a high-resolution Hitachi S4800 FESEM was used. The chemical composition of the deposits was confirmed through energy-dispersive X-ray spectroscopy (EDX) using a silicon drift detector from

• prepared on an ultrathin carbon support film spanning a lacey carbon membrane (Figure 2c). The deposit appears smeared because of drift caused by charging effects during the deposition process. High-resolution STEM imaging (Figure 2d,e) revealed a granular nanostructure with nanograins of around 2 nm in

Pulsed laser in liquid grafting of gold nanoparticle–carbon support composites

• Madeleine K. Wilsey,
• Teona Taseska,
• Qishen Lyu,
• Connor P. Cox and
• Astrid M. Müller

Beilstein J. Nanotechnol. 2025, 16, 349–361, doi:10.3762/bjnano.16.26

• scanning electron microscope with a Schottky field-emission emitter was operated at 20.00 kV with a working distance of 4.9 mm. Energy-dispersive X-ray (EDX) spectroscopy data were collected using an SEM-integrated EDAX Octane elect plus spectrometer with a with silicon drift detector. Double sided carbon

Advanced atomic force microscopy techniques V

• Philipp Rahe,
• Ilko Bald,
• Nadine Hauptmann,
• Regina Hoffmann-Vogel,
• Harry Mönig and
• Michael Reichling

Beilstein J. Nanotechnol. 2025, 16, 54–56, doi:10.3762/bjnano.16.6

• 10.3762/bjnano.16.6 Keywords: AFM; atomic force microscopy; conductivity; drift correction; force spectroscopy; NC-AFM; non-contact atomic force microscopy; resistivity; tip–surface interaction; With the restrictions on travelling and social distancing lifted, we were delighted to continue two series of

• precision of scanning probe microscopy experiments by introducing a software for lateral drift correction [1]. Post-data acquisition drift correction for longer series of consecutively recorded image sets can be cumbersome and extremely time consuming. Here, the authors develop an easy-to-use and robust

• software tool (”unDrift”), which allows reliable and fast drift correction. Dickbreder et al. demonstrate the robust performance of the software tool by AFM data recorded under varying conditions (vacuum or liquid environment) on calcite surfaces with recording times up to several hours. The work by Nony

Precursor sticking coefficient determination from indented deposits fabricated by electron beam induced deposition

• Alexander Kuprava and
• Michael Huth

Beilstein J. Nanotechnol. 2025, 16, 35–43, doi:10.3762/bjnano.16.4

• 60° with the identical positioning. The background pressure was 4 × 10−7 mbar and rose to 5 × 10−7 mbar for Cr(C6H6)2 and 6 × 10−6 mbar for Me3CpPtMe during deposition at room temperature. To prevent any mechanical or beam drift, a waiting time of 10 min was introduced right before the start of the

Orientation-dependent photonic bandgaps in gold-dust weevil scales and their titania bioreplicates

• Norma Salvadores Farran,
• Limin Wang,
• Primoz Pirih and
• Bodo D. Wilts

Beilstein J. Nanotechnol. 2025, 16, 1–10, doi:10.3762/bjnano.16.1

• in-lens secondary electron detector at 5 kV acceleration voltage. These samples were coated with gold using a Cressington 208 HR sputter coater. Elemental analysis was performed with 8 kV acceleration voltage, using an EDX detector attached to the Zeiss SEM (X-Max silicon drift energy-dispersive

Out-of-plane polarization induces a picosecond photoresponse in rhombohedral stacked bilayer WSe₂

• Guixian Liu,
• Yufan Wang,
• Zhoujuan Xu,
• Zhouxiaosong Zeng,
• Lanyu Huang,
• Cuihuan Ge and
• Xiao Wang

Beilstein J. Nanotechnol. 2024, 15, 1362–1368, doi:10.3762/bjnano.15.109

• scanning photocurrent map under zero bias. In addition, the OOP polarization accelerates the drift of photogenerated carriers, giving the heterojunction region an ultrafast intrinsic response time of approximately 3 ps, surpassing that of graphene under the same conditions. Despite variations in probe

• the graphene region. This finding not only confirms the stability of the device but also demonstrates the acceleration effect of OOP polarization in 3R WSe2 on carrier drift. Although the power change does not affect the response time of the device, the increase in power generates more photogenerated

Quantum-to-classical modeling of monolayer Ge₂Se₂ and its application in photovoltaic devices

• Anup Shrivastava,
• Shivani Saini,
• Dolly Kumari,
• Sanjai Singh and
• Jost Adam

Beilstein J. Nanotechnol. 2024, 15, 1153–1169, doi:10.3762/bjnano.15.94

• astonishing device performance. We use ab initio modeling for the material prediction, while classical drift–diffusion drives the device simulations. Hybrid functionals calculate electronic and optical properties to maintain high accuracy. The structural stability has been verified using phonon spectra. The E

• the proposed solar cell, we performed a numerical simulation using SCAPS-1D, which solves the fundamental semiconductor equations such as drift–diffusion, Poisson’s equation, and continuity equations as: and where and are the electron and hole current densities at the Fermi levels EFn and EFp

Signal generation in dynamic interferometric displacement detection

• Knarik Khachatryan,
• Simon Anter,
• Michael Reichling and
• Alexander von Schmidsfeld

Beilstein J. Nanotechnol. 2024, 15, 1070–1076, doi:10.3762/bjnano.15.87

• temperature stabilisation of the laboratory and the scan head, care is taken to avoid any thermal drift of the cantilever eigenfrequency that might compromise measurements. A model MDO3000 oscilloscope (Tektronix Inc., Beaverton, OR, USA) is used to record the AC output signal of the photoreceiver, Vsig

Water-assisted purification during electron beam-induced deposition of platinum and gold

• Cristiano Glessi,
• Fabian A. Polman and
• Cornelis W. Hagen

Beilstein J. Nanotechnol. 2024, 15, 884–896, doi:10.3762/bjnano.15.73

• experiment is quite low, the deposits only become visible at intermediate exposure times (100–500 passes). At higher exposure times, the deposits start broadening when the halo starts to develop; at the highest exposure times, deformation of the deposits is seen, which is ascribed to stage drift. In the etch

Synthesis of silver–palladium Janus nanoparticles using co-sputtering of independent sources: experimental and theorical study

• Maria J. Martínez-Carreón,
• Francisco Solís-Pomar,
• Abel Fundora,
• Claudio D. Gutiérrez-Lazos,
• Sergio Mejía-Rosales,
• Hector N. Fernández-Escamilla,
• Jonathan Guerrero-Sánchez,
• Manuel F. Meléndrez and
• Eduardo Pérez-Tijerina

Beilstein J. Nanotechnol. 2024, 15, 808–816, doi:10.3762/bjnano.15.67

• drift”. Figure 4b presents the spectrum of elementary analysis; the two elements silver and palladium appear. All characterization techniques, as well as the calculation of the interplanar distances, showed only the presence of silver and palladium without any contaminants or other metals, which

Effect of repeating hydrothermal growth processes and rapid thermal annealing on CuO thin film properties

• Monika Ozga,
• Eunika Zielony,
• Aleksandra Wierzbicka,
• Anna Wolska,
• Marcin Klepka,
• Marek Godlewski,
• Bogdan J. Kowalski and
• Bartłomiej S. Witkowski

Beilstein J. Nanotechnol. 2024, 15, 743–754, doi:10.3762/bjnano.15.62

• characterized using an analytical scanning electron microscope (SEM) Hitachi SU-70 with the X-ray microanalysis system (EDX) enabling composition analysis (Thermo Fisher Pathfinder system with a silicon drift detector). Additionally, in the study, a scanning probe microscope (Dimension Icon, Bruker) was used

Level set simulation of focused ion beam sputtering of a multilayer substrate

• Alexander V. Rumyantsev,
• Nikolai I. Borgardt,
• Roman L. Volkov and
• Yuri A. Chaplygin

Beilstein J. Nanotechnol. 2024, 15, 733–742, doi:10.3762/bjnano.15.61

• -quadrant silicon drift detector installed within the microscope. BCA Monte Carlo simulation Angular and energy distributions of sputtered atoms and backscattered ions were studied numerically employing the SDTrimSP software package [40]. The calculations were carried out in the static mode using the

Photocatalytic degradation of methylene blue under visible light by cobalt ferrite nanoparticles/graphene quantum dots

• Vo Chau Ngoc Anh,
• Le Thi Thanh Nhi,
• Le Thi Kim Dung,
• Dang Thi Ngoc Hoa,
• Nguyen Truong Son,
• Nguyen Thi Thao Uyen,
• Nguyen Ngoc Uyen Thu,
• Le Van Thanh Son,
• Le Trung Hieu,
• Tran Ngoc Tuyen and
• Dinh Quang Khieu

Beilstein J. Nanotechnol. 2024, 15, 475–489, doi:10.3762/bjnano.15.43

• heterojunctions limit the recombination of photo-induced electron–hole pairs and, thus, enhance catalytic decolourisation. Therefore, the CF/GQDs-200 sample was selected for further studies. The point of zero charge (pzc) of CF/GQDs-200 obtained by the pH drift method is 6.6 (see the inset of Figure 7b

Influence of conductive carbon and MnCo₂O₄ on morphological and electrical properties of hydrogels for electrochemical energy conversion

• Sylwia Pawłowska,
• Karolina Cysewska,
• Yasamin Ziai,
• Jakub Karczewski,
• Piotr Jasiński and
• Sebastian Molin

Beilstein J. Nanotechnol. 2024, 15, 57–70, doi:10.3762/bjnano.15.6

• an accelerating voltage of 10 kV. Before imaging, the hydrogel samples were freeze-dried and coated with a 10 nm gold layer. The chemical composition of the hydrogel was analysed with a Thermo Fisher Scientific silicon drift detector energy-dispersive X-ray spectroscope. For characterisation of the

unDrift: A versatile software for fast offline SPM image drift correction

• Tobias Dickbreder,
• Franziska Sabath,
• Lukas Höltkemeier,
• Ralf Bechstein and
• Angelika Kühnle

Beilstein J. Nanotechnol. 2023, 14, 1225–1237, doi:10.3762/bjnano.14.101

• properties of surfaces and interfaces across a variety of disciplines in chemistry and physics. One of the major artifacts in SPM is (thermal) drift, an unintended movement between sample and probe, which causes a distortion of the recorded SPM data. Literature holds a multitude of strategies to compensate

• for drift during the measurement (online drift correction) or afterwards (offline drift correction). With the currently available software tools, however, offline drift correction of SPM data is often a tedious and time-consuming task. This is particularly disadvantageous when analyzing long image

• series. Here, we present unDrift, an easy-to-use scientific software for fast and reliable drift correction of SPM images. unDrift provides three different algorithms to determine the drift velocity based on two consecutive SPM images. All algorithms can drift-correct the input data without any

Dual-heterodyne Kelvin probe force microscopy

• Benjamin Grévin,
• Fatima Husainy,
• Dmitry Aldakov and
• Cyril Aumaître

Beilstein J. Nanotechnol. 2023, 14, 1068–1084, doi:10.3762/bjnano.14.88

• drift [2][3]. Another issue is that some of the SPV components – related to dynamical processes – can remain hidden to this “conventional” SPV imaging [4]. To mitigate the effects of thermal drift, a first alternative consists in performing a data cube acquisition of CPD curves synchronously recorded

• dynamics is indeed the effective mobility of holes and electrons (under the effect of drift diffusion) in the donor and acceptor networks. After the application of a light pulse – and during the duration of the pulse – the charge mobility limits the rate at which an electrostatic equilibrium can be reached

Spatial mapping of photovoltage and light-induced displacement of on-chip coupled piezo/photodiodes by Kelvin probe force microscopy under modulated illumination

• Zeinab Eftekhari,
• Nasim Rezaei,
• Hidde Stokkel,
• Jian-Yao Zheng,
• Andrea Cerreta,
• Ilka Hermes,
• Minh Nguyen,
• Guus Rijnders and
• Rebecca Saive

Beilstein J. Nanotechnol. 2023, 14, 1059–1067, doi:10.3762/bjnano.14.87

• for the micrometric measurement is comparable to the locally measured photovoltage. However, we were not able to quantify precisely the displacement of the membrane by conventional imaging since a temperature-induced drift occurs under illumination. Therefore, we modified the method in the point scan

Exploring internal structures and properties of terpolymer fibers via real-space characterizations

• Michael R. Roenbeck and
• Kenneth E. Strawhecker

Beilstein J. Nanotechnol. 2023, 14, 1004–1017, doi:10.3762/bjnano.14.83

• extracted from a 65 decitex yarn. Fibers were mounted onto cardstock specimen holders, fixed with adhesive at two points approximately 15 mm apart from one another, and conductively coated with a gold–palladium mixture to mitigate sample drift, for example, due to sample charging effects inside the FIB

Cross-sectional Kelvin probe force microscopy on III–V epitaxial multilayer stacks: challenges and perspectives

• Mattia da Lisca,
• José Alvarez,
• James P. Connolly,
• Nicolas Vaissiere,
• Karim Mekhazni,
• Jean Decobert and
• Jean-Paul Kleider

Beilstein J. Nanotechnol. 2023, 14, 725–737, doi:10.3762/bjnano.14.59

• KELSCAN [13], which evaluates the contact potential and surface photovoltage as a function of the position. The Silvaco ATLAS model solves the Poisson equation self-consistently coupled to carrier continuity and transport equations in the well-known drift diffusion model, which is given detail in [22] and

• formation of a depletion (or inversion) space charge layer imposed by the charge neutrality condition [32][35]. By illuminating the sample, a SPV is generated by the drift and diffusion of photogenerated carriers towards the surface, which counteracts the defect-induced band bending energy variations [20

Nanoarchitectonics to entrap living cells in silica-based systems: encapsulations with yolk–shell and sepiolite nanomaterials

• Celia Martín-Morales,
• Jorge Fernández-Méndez,
• Pilar Aranda and
• Eduardo Ruiz-Hitzky

Beilstein J. Nanotechnol. 2023, 14, 522–534, doi:10.3762/bjnano.14.43

• without staining. Electron microscopy imaging was conducted using a field-emission scanning electron microscope FEI-NOVA NanoSEM 230 equipped with an Apollo XL silicon drift detector from EDAX-Ametek or using a high-resolution JEOL IT500HR/LA microscope equipped with an energy dispersive X-ray

Intermodal coupling spectroscopy of mechanical modes in microcantilevers

• Ioan Ignat,
• Bernhard Schuster,
• Jonas Hafner,
• MinHee Kwon,
• Daniel Platz and
• Ulrich Schmid

Beilstein J. Nanotechnol. 2023, 14, 123–132, doi:10.3762/bjnano.14.13

• hybridized eigenmodes in lieu of the original. Increasing it further ensures that the two peaks are resolved, as the local minimum in the middle decreases and the two maxima drift further apart. The coupling strength is estimated using the frequency difference between the two peaks, as in the approximation

• repeating lock-in measurements of the eigenmodes whenever necessary to avoid any issues caused by daily thermal drift. The applications we envision for AFM benefit from stronger coupling rates. Therefore, we extend these measurements to the first nine modes of the cantilever under test. Figure 4 shows both

From a free electron gas to confined states: A mixed island of PTCDA and copper phthalocyanine on Ag(111)

• Alfred J. Weymouth,
• Emily Roche and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2022, 13, 1572–1577, doi:10.3762/bjnano.13.131

• to images taken with a CO-terminated tip [23]. However, it could be due to another molecule at the tip apex leading to similar contrast as has been previously discussed in the literature [24]. As there was a slight drift in the vertical direction, the AFM data was plane-subtracted to enhance the

Double-layer symmetric gratings with bound states in the continuum for dual-band high-Q optical sensing

• Chaoying Shi,
• Jinhua Hu,
• Xiuhong Liu,
• Junfang Liang,
• Jijun Zhao,
• Haiyan Han and
• Qiaofen Zhu

Beilstein J. Nanotechnol. 2022, 13, 1408–1417, doi:10.3762/bjnano.13.116

• , which are defined as the ratio of the resonant wavelength drift to the change in refractive index of the surrounding environment (S = Δλres/Δnc) and the ratio of sensitivity to the FWHM (FOM = S/FWHM), respectively [55]. Taking the structural parameters previously mentioned as an example, the proposed

Enhanced electronic transport properties of Te roll-like nanostructures

• E. R. Viana,
• N. Cifuentes and
• J. C. González

Beilstein J. Nanotechnol. 2022, 13, 1284–1291, doi:10.3762/bjnano.13.106

• mode. EDS point acquisitions were also performed during TEM analysis by using a silicon drift detector (SDD) from Oxford Instruments. Electronic transport The electronic transport properties of the sample were investigated by acquiring and modeling the transfer and gate curves of Te roll-like single

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

• Hao Liu,
• Zuned Ahmed,
• Sasa Vranjkovic,
• Manfred Parschau,
• Andrada-Oana Mandru and
• Hans J. Hug

Beilstein J. Nanotechnol. 2022, 13, 1120–1140, doi:10.3762/bjnano.13.95

• minimized and the design has to be kept as symmetrical as possible to reduce thermal drift; third, the design must allow for a precise adjustment of the pressure of the sliders towards the sapphire rails for the xy-directions. All these conditions can be fulfilled with a concentric design, where the shear

• stacks and sliders with temperature are at least partially compensated by those of the scan piezo. Together with the highly symmetric design along the x and y axes, this further reduces the thermal drift. Moreover, any mechanical excitation of the instrument, for example, from floor or acoustic