Time-resolved probing of laser-induced nanostructuring processes in liquids

• Maximilian Spellauge,
• David Redka,
• Mianzhen Mo,
• Changyong Song,
• Heinz Paul Huber and
• Anton Plech

Beilstein J. Nanotechnol. 2025, 16, 968–1002, doi:10.3762/bjnano.16.74

• nanosecond laser pulses, resulting in a high- to low-spin transition accompanied by morphological deformations coupled with lattice dynamics. Femtosecond X-ray laser pulses from X-ray free-electron lasers (XFELs) have further revolutionized dynamic X-ray imaging. Coherent diffraction imaging (CDI) [68][69

Insights into the electronic and atomic structures of cerium oxide-based ultrathin films and nanostructures using high-brilliance light sources

• Paola Luches and
• Federico Boscherini

Beilstein J. Nanotechnol. 2025, 16, 860–871, doi:10.3762/bjnano.16.65

• light sources, such as synchrotrons and free-electron lasers, allow researchers to probe the structural, electronic, and dynamic properties of functional materials at an unprecedented level of detail. Techniques like X-ray photoelectron spectroscopy and X-ray absorption spectroscopy, can reveal atomic

• perspectives offered by the ultrahigh brilliance and ultrashort free-electron laser pulses for dynamic studies of the processes that take place upon photoexcitation are discussed. Keywords: cerium oxide; free-electron lasers; thin films; X-ray absorption spectroscopy; X-ray photoelectron spectroscopy

• under operating conditions. Furthermore, free-electron lasers (FELs), with orders-of-magnitude higher peak brilliance than synchrotrons, have made it possible to achieve temporal resolution of the order of a few tens of femtoseconds, facilitating an ultrafast, element-sensitive characterization of the

Extended X-ray absorption fine structure of bimetallic nanoparticles

• Carolin Antoniak

Beilstein J. Nanotechnol. 2011, 2, 237–251, doi:10.3762/bjnano.2.28

• bandpass (usually 0.1%). The increase in average brilliance of X-rays available from artificial sources, from the first X-ray tubes to synchrotron radiation sources of the third generation, is a remarkable factor of about 1013. For next generation free electron lasers an additional increase in the peak