afspm: A framework for manufacturer-agnostic automation in scanning probe microscopy

• Nicholas J. Sullivan,
• Julio J. Valdés,
• Kirk H. Bevan and
• Peter Grutter

Beilstein J. Nanotechnol. 2026, 17, 653–667, doi:10.3762/bjnano.17.45

• (AM-AFM) or frequency-modulated atomic force microscopy (FM-AFM)) and spectroscopic mode (e.g., IV curves or force spectroscopy), which we believe is justifiable as part of the experimental setup. This base set of operations gives the user a reasonable degree of flexibility: One could design an image

Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

• Michael Klocke and
• Dietrich E. Wolf

Beilstein J. Nanotechnol. 2016, 7, 708–720, doi:10.3762/bjnano.7.63

• . It is shown how this may lead to a systematic shift between the periodic patterns obtained from the frequency and from the damping signal, respectively. Keywords: atomic force microscopy; frequency-modulated atomic force microscopy (FM-AFM); energy dissipation; Introduction The physical background

• of the dissipation signal in frequency-modulated atomic force microscopy (FM-AFM) was unclear for a long time, and different effects had been discussed, before it was shown that the main contribution comes from adhesion hysteresis [1][2][3]. However, agreement between theoretical predictions and

Length-extension resonator as a force sensor for high-resolution frequency-modulation atomic force microscopy in air

• Hannes Beyer,
• Tino Wagner and
• Andreas Stemmer

Beilstein J. Nanotechnol. 2016, 7, 432–438, doi:10.3762/bjnano.7.38

• ; frequency-modulation atomic force microscopy; high-resolution; length-extension resonator; Introduction Frequency-modulated atomic force microscopy (FM-AFM) is the method of choice to image nanoscale structures on surfaces down to the atomic level. Whereas atomic resolution is routinely achieved in ultra

Dissipation signals due to lateral tip oscillations in FM-AFM

• Michael Klocke and
• Dietrich E. Wolf

Beilstein J. Nanotechnol. 2014, 5, 2048–2057, doi:10.3762/bjnano.5.213

• force microscopy (AFM); frequency-modulated atomic force microscopy (FM-AFM); energy dissipation; Introduction The usage of scanning probe microscopes requires an understanding of the physical processes during the scan, otherwise images can be misinterpreted. Due to the importance of frequency

• -modulated atomic force microscopy (FM-AFM), the physical processes involved have been studied intensively in the past [1]. This includes the relation between tip–surface interaction and frequency-shift [2], as well as features such as the energy dissipation during the scan [3], which is an interesting side