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Search for "grazing angle X-ray diffractometer" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

N2+-implantation-induced tailoring of structural, morphological, optical, and electrical characteristics of sputtered molybdenum thin films

  • Usha Rani,
  • Kafi Devi,
  • Divya Gupta and
  • Sanjeev Aggarwal

Beilstein J. Nanotechnol. 2025, 16, 495–509, doi:10.3762/bjnano.16.38

Graphical Abstract
  • the same nominal film thickness after implantation. Keywords: atomic force microscopy; grazing angle X-ray diffractometer; Keithley parametric analyzer; Mo thin films; RF sputtering; spectroscopic ellipsometry; Introduction Molybdenum thin films have garnered significant attention in diverse
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Published 01 Apr 2025
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