Exploring surface charge dynamics: implications for AFM height measurements in 2D materials

• Mario Navarro-Rodriguez,
• Andres M. Somoza and
• Elisa Palacios-Lidon

Beilstein J. Nanotechnol. 2024, 15, 767–780, doi:10.3762/bjnano.15.64

• of surface charges and their intricate interaction with the tip. Keywords: 2D materials; incorrect height measurements; Joule dissipation; surface conductivity; tip influence; Introduction Two-dimensional (2D) materials have emerged as a promising platform for next-generation electronic devices [1

• oscillation amplitudes, the tip mechanically touches the surface during part of the oscillation. This mode is known as “intermittent contact” or tapping mode, and incorrect height measurements are usually ascribed to variations in the local elasticity [32][33] or differences in the local adhesion, related to

• ][56][57]. The origin of incorrect height measurements in 2D materials has been ascribed to the same sources as those mentioned above, including capillary forces and adhesion [8][46], electrostatic forces [58][59][60], or residues of the solvent [8]. However, in many cases, this is not enough to fully