Local work function on graphene nanoribbons

• Daniel Rothhardt,
• Amina Kimouche,
• Tillmann Klamroth and
• Regina Hoffmann-Vogel

Beilstein J. Nanotechnol. 2024, 15, 1125–1131, doi:10.3762/bjnano.15.91

• acquisition [21][22]. In this way, an image of the local contact potential difference between tip and sample is obtained. This has been shown not only for general surfaces, for example, insulating surfaces, but also for molecules and molecular layers [18][23][24][25]. Here, we study the local work function

Molecular assemblies on surfaces: towards physical and electronic decoupling of organic molecules

• Sabine Maier and
• Meike Stöhr

Beilstein J. Nanotechnol. 2021, 12, 950–956, doi:10.3762/bjnano.12.71

• . To a lesser extent, metal oxides have also been used, for which defects and charging often pose additional challenges [44][45][46]. On electronically insulating surfaces, non-contact atomic force microscopy (AFM) is the method of choice to study molecular assemblies and individual molecules in real

Calculating free energies of organic molecules on insulating substrates

• Julian Gaberle,
• David Z. Gao and
• Alexander L. Shluger

Beilstein J. Nanotechnol. 2017, 8, 667–674, doi:10.3762/bjnano.8.71

• status of NC-AFM studies of self-assembled films on insulating surfaces has recently been reviewed in [22]. However, theoretical modelling of the film growth processes still proves challenging. Most experiments are performed at room temperature, where entropic contributions can be significant [23][24

• an important role in the dynamic processes of large organic molecules on insulating surfaces. At these sites the molecules can interact with the atoms of the step layer as well as terrace layer and become more strongly bound [56]. Furthermore, they can exhibit one-dimensional motion when diffusing

Ordering of Zn-centered porphyrin and phthalocyanine on TiO₂(011): STM studies

• Piotr Olszowski,
• Lukasz Zajac,
• Szymon Godlewski,
• Bartosz Such,
• Rémy Pawlak,
• Antoine Hinaut,
• Res Jöhr,
• Thilo Glatzel,
• Ernst Meyer and
• Marek Szymonski

Beilstein J. Nanotechnol. 2017, 8, 99–107, doi:10.3762/bjnano.8.11

• by a grant from Switzerland through the Swiss Contribution to the enlarged European Union (Joint Polish-Swiss Research Program) no. PSPB-085/2010 “Molecular assemblies on semiconductors and insulating surfaces” (http://www.molSurf.eu), and in part also by COST Action MP1303.

Scanning probe microscopy studies on the adsorption of selected molecular dyes on titania

• Jakub S. Prauzner-Bechcicki,
• Lukasz Zajac,
• Piotr Olszowski,
• Res Jöhr,
• Antoine Hinaut,
• Thilo Glatzel,
• Bartosz Such,
• Ernst Meyer and
• Marek Szymonski

Beilstein J. Nanotechnol. 2016, 7, 1642–1653, doi:10.3762/bjnano.7.156

• semiconductors and insulating surfaces” (http://www.molSurf.eu).

Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices

• Urs Gysin,
• Thilo Glatzel,
• Thomas Schmölzer,
• Adolf Schöner,
• Sergey Reshanov,
• Holger Bartolf and
• Ernst Meyer

Beilstein J. Nanotechnol. 2015, 6, 2485–2497, doi:10.3762/bjnano.6.258

• potential difference VCPD can be determined. While this method works fine for metallic surfaces special care has to be taken on semiconducting or insulating surfaces. The main challenge arises from the fact that the tip–sample capacitance is no longer independent of the applied voltage such that higher

Electrospray deposition of organic molecules on bulk insulator surfaces

• Antoine Hinaut,
• Rémy Pawlak,
• Ernst Meyer and
• Thilo Glatzel

Beilstein J. Nanotechnol. 2015, 6, 1927–1934, doi:10.3762/bjnano.6.195

• the molecular structures adsorbed on the surface. We show that UHV-ESI, can be performed on insulating surfaces in the sub-monolayer regime and to single molecules which opens the possibility to study a variety of complex molecules. Keywords: adsorption; electrospray; insulating surface; large

• studies have shown the possibility to image molecular islands [21][22][23][24][25][26][27], small aggregates [28], single molecules [29] as well as trapped single molecules [30][31][32] at room temperature on insulating surfaces. The use of ESI now allows one to study even larger and more complex

• positive charging of the surface is in agreement with the estimated large negative bias voltages needed to compensate the surface potential of approximately −30 V. A major disadvantage of UHV-ESI for insulating surfaces is thus the surface charging of the crystals, increasing with the deposition time and

Transformations of PTCDA structures on rutile TiO₂ induced by thermal annealing and intermolecular forces

• Szymon Godlewski,
• Jakub S. Prauzner-Bechcicki,
• Thilo Glatzel,
• Ernst Meyer and
• Marek Szymoński

Beilstein J. Nanotechnol. 2015, 6, 1498–1507, doi:10.3762/bjnano.6.155

• semiconductors and insulating surfaces” (http://www.molSurf.eu).

Scanning reflection ion microscopy in a helium ion microscope

• Yuri V. Petrov and
• Oleg F. Vyvenko

Beilstein J. Nanotechnol. 2015, 6, 1125–1137, doi:10.3762/bjnano.6.114

• SEs, thus RIM of insulating surfaces is more straightforward. At the same time, RIM requires a special sample holder. One of the main disadvantages of RIM is the inability to image the whole surface of a sample. Part of a sample is always hidden by sample features. Thus, the potential advantage of RIM

Graphene on SiC(0001) inspected by dynamic atomic force microscopy at room temperature

• Mykola Telychko,
• Jan Berger,
• Zsolt Majzik,
• Pavel Jelínek and
• Martin Švec

Beilstein J. Nanotechnol. 2015, 6, 901–906, doi:10.3762/bjnano.6.93

• accompanied by any out-of-plane relaxations of carbon atoms. Keywords: AFM; electron scattering; graphene; SiC; STM; Introduction Graphene epitaxially grown on a substrate differs in many aspects from free-standing graphene or graphene exfoliated onto insulating surfaces. The influence of the substrate

Structural development and energy dissipation in simulated silicon apices

• Samuel Paul Jarvis,
• Lev Kantorovich and
• Philip Moriarty

Beilstein J. Nanotechnol. 2013, 4, 941–948, doi:10.3762/bjnano.4.106

• the order of electronvolts have been attributed to chain formation on insulating surfaces [36] and significant structural rearrangements of both the tip and sample over each oscillation of the AFM tip [16][37]. It has also been shown that in some cases the dissipation may be apparent – an instrumental

STM tip-assisted engineering of molecular nanostructures: PTCDA islands on Ge(001):H surfaces

• Amir A. Ahmad Zebari,
• Marek Kolmer and
• Jakub S. Prauzner-Bechcicki

Beilstein J. Nanotechnol. 2013, 4, 927–932, doi:10.3762/bjnano.4.104

• . Godlewski on the experimental procedures. This work was supported by a grant from Switzerland through the Swiss Contribution to the enlarged European Union (Joint Polish-Swiss Research Program) no PSPB-085/2010 “Molecular assemblies on semiconductors and insulating surfaces” (http://www.molsurf.eu).

Models of the interaction of metal tips with insulating surfaces

• Thomas Trevethan,
• Matthew Watkins and
• Alexander L. Shluger

Beilstein J. Nanotechnol. 2012, 3, 329–335, doi:10.3762/bjnano.3.37

An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001)

• Antoine Hinaut,
• Adeline Pujol,
• Florian Chaumeton,
• David Martrou,
• André Gourdon and
• Sébastien Gauthier

Beilstein J. Nanotechnol. 2012, 3, 221–229, doi:10.3762/bjnano.3.25

• strong intermolecular interaction due to π-stacking. Keywords: atomic force microscopy; insulating surfaces; Kelvin force probe microscopy; molecular adsorption; Introduction The study of molecular adsorption on atomically clean, well-defined surfaces of bulk insulators is progressing rapidly due to

• combined with NC-AFM [16][17][18][19] to investigate metallic or semiconducting surfaces, as well as adsorbates [20][21] or thin insulating films on metals [18][22][23]. But its application to bulk insulating surfaces [24][25][26] is only beginning, and studies of molecular adsorption on these surfaces are

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

• Maximilian Schneiderbauer,
• Daniel Wastl and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18

• -polarized tip and the spin-dependent local density of states of the sample (Figure 1b). STM is unable to probe insulating surfaces but AFM can be used: The antiferromagnetic surface structure of NiO (001) was imaged by Magnetic Exchange Force Microscopy (MExFM) [5]. In MExFM the magnetic exchange force

Oriented growth of porphyrin-based molecular wires on ionic crystals analysed by nc-AFM

• Thilo Glatzel,
• Lars Zimmerli,
• Shigeki Kawai,
• Ernst Meyer,
• Leslie-Anne Fendt and
• Francois Diederich

Beilstein J. Nanotechnol. 2011, 2, 34–39, doi:10.3762/bjnano.2.4

• Abstract The growth of molecular assemblies at room temperature on insulating surfaces is one of the main goals in the field of molecular electronics. Recently, the directed growth of porphyrin-based molecular wires on KBr(001) was presented. The molecule–surface interaction associated with a strong dipole

• molecules and the insulating surfaces which leads to diffusion on the surfaces and assembly of disordered aggregates. One possibility to overcome this barrier is the use of a specific end group which induces an adequate directed dipole moment within the molecule [26][30]. Moreover, high resolution

• measurements of molecules on insulating surfaces were scarce due to a lack of suitable imaging techniques. However, recent progress in high resolution nc-AFM has given the opportunity to verify the proposed concept of directed growth of molecular wires on insulators [31][32][33]. Alkali halides offer some

A collisional model for AFM manipulation of rigid nanoparticles

• Enrico Gnecco

Beilstein J. Nanotechnol. 2010, 1, 158–162, doi:10.3762/bjnano.1.19

• allowed the controlled manipulation of metal clusters on insulating surfaces [3] and even single atoms on semiconductors [4]. However, AFM manipulation tends to be time-consuming. A major issue is that nanoparticles are usually moved individually so that the AFM tip has to be properly positioned with