Cantilever signature of tip detachment during contact resonance AFM

• Devin Kalafut,
• Ryan Wagner,
• Maria Jose Cadena,
• Anil Bajaj and
• Arvind Raman

Beilstein J. Nanotechnol. 2021, 12, 1286–1296, doi:10.3762/bjnano.12.96

• connect the qualitative and quantitative behavior to experimental features. Keywords: atomic force microscopy (AFM); contact resonance; nonlinear normal mode (NNM); tip–sample detachment; photothermal excitation; Introduction Contact resonance atomic force microscopy (CR-AFM) [1][2], piezoresponse force

• nonlinear dynamics for an additional perspective on the behavior. In a recent unification of nonlinear normal mode (NNM) definitions, Haller and Ponsioen state that a NNM is a “recurrent motion with a discrete Fourier spectrum of […] frequencies” for general dissipative systems [29]. This is a relaxation of