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Search for "scanning photoelectron spectromicroscopy" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.

Nanostructured materials characterized by scanning photoelectron spectromicroscopy

  • Matteo Amati,
  • Alexey S. Shkvarin,
  • Alexander I. Merentsov,
  • Alexander N. Titov,
  • María Taeño,
  • David Maestre,
  • Sarah R. McKibbin,
  • Zygmunt Milosz,
  • Ana Cremades,
  • Rainer Timm and
  • Luca Gregoratti

Beilstein J. Nanotechnol. 2025, 16, 700–710, doi:10.3762/bjnano.16.54

Graphical Abstract
  • , environmental reliability, and operando capabilities. Scanning photoelectron spectromicroscopy (SPEM) is one of the characterization tools that combine high spectral resolution X-ray photoelectron spectroscopy with submicron spatial resolution. In particular, the SPEM equipment hosted at the ESCA microscopy
  • ; operando; oxides; scanning photoelectron spectromicroscopy; semiconductor nanowires; transition metal dichalcogenides; XPS; Introduction Nanometer or micrometer-sized materials play a key role in modern technologies in the search of new routes for unforeseen performances generating breakthroughs in
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Published 23 May 2025
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