afspm: A framework for manufacturer-agnostic automation in scanning probe microscopy

• Nicholas J. Sullivan,
• Julio J. Valdés,
• Kirk H. Bevan and
• Peter Grutter

Beilstein J. Nanotechnol. 2026, 17, 653–667, doi:10.3762/bjnano.17.45

• interfaces types. An automated experiment was run to ensure overall running beyond integration testing. Keywords: atomic force microscopy; automation; manufacturer-agnostic; scanning probe microscopy; software framework; Introduction In scanning probe microscopy (SPM), an atomically sharp tip is scanned

• a generalized approach to data handling solves part of the problem, it does nothing to address the control needs posed across the various SPM controllers. Another contribution was made in [16], where a hardware–software framework enables automated experimentation. This framework focuses on the

• abstractions that may be suitable to other scientific fields. Bluesky does not solve the reusability issues described above, but may prove suitable as an interface to coordinate an SPM among other instruments. We have developed a software framework for SPM to write reusable and shareable automation scripts

Size limits of magnetic-domain engineering in continuous in-plane exchange-bias prototype films

• Alexander Gaul,
• Daniel Emmrich,
• Timo Ueltzhöffer,
• Henning Huckfeldt,
• Hatice Doğanay,
• Johanna Hackl,
• Muhammad Imtiaz Khan,
• Daniel M. Gottlob,
• Gregor Hartmann,
• André Beyer,
• Dennis Holzinger,
• Slavomír Nemšák,
• Claus M. Schneider,
• Armin Gölzhäuser,
• Günter Reiss and
• Arno Ehresmann

Beilstein J. Nanotechnol. 2018, 9, 2968–2979, doi:10.3762/bjnano.9.276

• simulations was set for or a maximum step number of 2 × 105 iterations. Appendix SRIM simulations of the ion energy loss distribution: To determine the distribution of ions and the spatial distribution of the transferred energy in the sample, simulations using the SRIM software framework have been performed