Beilstein J. Nanotechnol.2024,15, 580–602, doi:10.3762/bjnano.15.50
little precision. An accurate stiffnesscalibration is therefore mandatory if accurate force measurements are targeted. In nc-AFM, the probe may either be a silicon cantilever, a quartz tuning fork (QTF), or a length extensional resonator (LER). When used in ultrahigh vacuum (UHV) and at low temperature
stiffnesscalibration of a particular type of qPlus sensor in UHV and at 9.8 K by means of thermal noise measurements. The stiffnesscalibration of such high-k sensors, featuring high quality factors (Q) as well, requires to master both the acquisition parameters and the data post-processing. Our approach
the framework focuses on a particular kind of sensor, it may be adapted to any high-k, high-Q nc-AFM probe used under similar conditions, such as silicon cantilevers and LERs.
Keywords: low temperature; non-contact atomic force microscopy; qPlus sensors; quartz tuning fork; stiffnesscalibration
PDF
Figure 1:
SEM images of the type of qPlus sensor used in this work. All dimensions are estimated with a relat...
Beilstein J. Nanotechnol.2010,1, 163–171, doi:10.3762/bjnano.1.20
figure).
Comparison of the atomic-scale and stochastic Prandtl–Tomlinson models.
Acknowledgements
This work has been financially supported by the Dutch NWO-STW foundation in the ‘Veni’ program under ref. no. LMF.7302. Geert H. C. J. Wijts (Leiden University) is thanked for the spring stiffness
calibration measurement of the MEMS tribometer. The second author would also like to thank the French Foreign Affair Ministry for its support through a Lavoisier fellowship and the Dutch FOM for its financial support.
PDF
Figure 1:
Schematic top view of the MEMS tribometer for studying microscale friction [19]. Several slider types h...