Exploring surface charge dynamics: implications for AFM height measurements in 2D materials

• Mario Navarro-Rodriguez,
• Andres M. Somoza and
• Elisa Palacios-Lidon

Beilstein J. Nanotechnol. 2024, 15, 767–780, doi:10.3762/bjnano.15.64

• of surface charges and their intricate interaction with the tip. Keywords: 2D materials; incorrect height measurements; Joule dissipation; surface conductivity; tip influence; Introduction Two-dimensional (2D) materials have emerged as a promising platform for next-generation electronic devices [1

• surface between two media. In a previous work, we studied the tip-less case, which we will use as the starting point for our model. Here, we just summarize the main aspects and refer to [78] for further details. Then, we include the tip influence by adding the appropriate boundary condition, which is time