Noncontact atomic force microscopy
Yale University
See also the Thematic Series:
Noncontact atomic force microscopy III
Noncontact atomic force microscopy II
Advanced atomic force microscopy techniques IV
Noncontact atomic force microscopy
- Udo D. Schwarz
Beilstein J. Nanotechnol. 2012, 3, 172–173, doi:10.3762/bjnano.3.17
Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe
- Adam Sweetman,
- Sam Jarvis,
- Rosanna Danza and
- Philip Moriarty
Beilstein J. Nanotechnol. 2012, 3, 25–32, doi:10.3762/bjnano.3.3
qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution
- Maximilian Schneiderbauer,
- Daniel Wastl and
- Franz J. Giessibl
Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18
Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)
- Christian Held,
- Thomas Seyller and
- Roland Bennewitz
Beilstein J. Nanotechnol. 2012, 3, 179–185, doi:10.3762/bjnano.3.19
Molecular-resolution imaging of pentacene on KCl(001)
- Julia L. Neff,
- Jan Götzen,
- Enhui Li,
- Michael Marz and
- Regina Hoffmann-Vogel
Beilstein J. Nanotechnol. 2012, 3, 186–191, doi:10.3762/bjnano.3.20
Noncontact atomic force microscopy study of the spinel MgAl2O4(111) surface
- Morten K. Rasmussen,
- Kristoffer Meinander,
- Flemming Besenbacher and
- Jeppe V. Lauritsen
Beilstein J. Nanotechnol. 2012, 3, 192–197, doi:10.3762/bjnano.3.21
Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus
- Elena T. Herruzo and
- Ricardo Garcia
Beilstein J. Nanotechnol. 2012, 3, 198–206, doi:10.3762/bjnano.3.22
A measurement of the hysteresis loop in force-spectroscopy curves using a tuning-fork atomic force microscope
- Manfred Lange,
- Dennis van Vörden and
- Rolf Möller
Beilstein J. Nanotechnol. 2012, 3, 207–212, doi:10.3762/bjnano.3.23
An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001)
- Antoine Hinaut,
- Adeline Pujol,
- Florian Chaumeton,
- David Martrou,
- André Gourdon and
- Sébastien Gauthier
Beilstein J. Nanotechnol. 2012, 3, 221–229, doi:10.3762/bjnano.3.25
Modeling noncontact atomic force microscopy resolution on corrugated surfaces
- Kristen M. Burson,
- Mahito Yamamoto and
- William G. Cullen
Beilstein J. Nanotechnol. 2012, 3, 230–237, doi:10.3762/bjnano.3.26
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
- Joachim Welker,
- Esther Illek and
- Franz J. Giessibl
Beilstein J. Nanotechnol. 2012, 3, 238–248, doi:10.3762/bjnano.3.27
Simultaneous current, force and dissipation measurements on the Si(111) 7×7 surface with an optimized qPlus AFM/STM technique
- Zsolt Majzik,
- Martin Setvín,
- Andreas Bettac,
- Albrecht Feltz,
- Vladimír Cháb and
- Pavel Jelínek
Beilstein J. Nanotechnol. 2012, 3, 249–259, doi:10.3762/bjnano.3.28
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Pulse-response measurement of frequency-resolved water dynamics on a hydrophilic surface using a Q-damped atomic force microscopy cantilever
- Masami Kageshima
Beilstein J. Nanotechnol. 2012, 3, 260–266, doi:10.3762/bjnano.3.29
Junction formation of Cu3BiS3 investigated by Kelvin probe force microscopy and surface photovoltage measurements
- Fredy Mesa,
- William Chamorro,
- William Vallejo,
- Robert Baier,
- Thomas Dittrich,
- Alexander Grimm,
- Martha C. Lux-Steiner and
- Sascha Sadewasser
Beilstein J. Nanotechnol. 2012, 3, 277–284, doi:10.3762/bjnano.3.31
Dipole-driven self-organization of zwitterionic molecules on alkali halide surfaces
- Laurent Nony,
- Franck Bocquet,
- Franck Para,
- Frédéric Chérioux,
- Eric Duverger,
- Frank Palmino,
- Vincent Luzet and
- Christian Loppacher
Beilstein J. Nanotechnol. 2012, 3, 285–293, doi:10.3762/bjnano.3.32
Wavelet cross-correlation and phase analysis of a free cantilever subjected to band excitation
- Francesco Banfi and
- Gabriele Ferrini
Beilstein J. Nanotechnol. 2012, 3, 294–300, doi:10.3762/bjnano.3.33
Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM
- Fabien Castanié,
- Laurent Nony,
- Sébastien Gauthier and
- Xavier Bouju
Beilstein J. Nanotechnol. 2012, 3, 301–311, doi:10.3762/bjnano.3.34
Models of the interaction of metal tips with insulating surfaces
- Thomas Trevethan,
- Matthew Watkins and
- Alexander L. Shluger
Beilstein J. Nanotechnol. 2012, 3, 329–335, doi:10.3762/bjnano.3.37
Drive-amplitude-modulation atomic force microscopy: From vacuum to liquids
- Miriam Jaafar,
- David Martínez-Martín,
- Mariano Cuenca,
- John Melcher,
- Arvind Raman and
- Julio Gómez-Herrero
Beilstein J. Nanotechnol. 2012, 3, 336–344, doi:10.3762/bjnano.3.38
