Supporting Information
Supporting information features a comparison of the working principles of H-KPFM and MFH-EFM, all the raw and normalized data of the MFH-EFM frequency spectroscopy measurements, the full comparison of the MFH-EFM, SF-EFM, and H-KPFM images on the F14H20 structures, and finally a comparison of the model data and the measured data on the microcapacitors.
| Supporting Information File 1: Additional experimental data. | ||
| Format: PDF | Size: 17.2 MB | Download |
Cite the Following Article
Nanoscale capacitance spectroscopy based on multifrequency electrostatic force microscopy
Pascal N. Rohrbeck, Lukas D. Cavar, Franjo Weber, Peter G. Reichel, Mara Niebling and Stefan A. L. Weber
Beilstein J. Nanotechnol. 2025, 16, 637–651.
https://doi.org/10.3762/bjnano.16.49
How to Cite
Rohrbeck, P. N.; Cavar, L. D.; Weber, F.; Reichel, P. G.; Niebling, M.; Weber, S. A. L. Beilstein J. Nanotechnol. 2025, 16, 637–651. doi:10.3762/bjnano.16.49
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Presentation Graphic
| Picture with graphical abstract, title and authors for social media postings and presentations. | ||
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