At the cutting edge of atomic force microscopy

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Editors:
PD Dr. Thilo Glatzel, University of Basel, Switzerland
Prof. Peter Grutter, McGill University, Canada
Prof. Omur Dagdeviren, École de Technologie Supérieure, University of Quebec, Canada
 

Submit your exciting research and explore the latest advances in scanning probe microscopy, more specifically, atomic force microscopy (AFM) in our new thematic issue with the Beilstein Journal of Nanotechnology. AFM is a key method for atomic and nanoscale characterization in physics, chemistry, materials science, biology and beyond. This issue features fundamental research highlighting significant improvements in sensitivity and speed, innovative experimental techniques and new applications in a wide range of fields.

Advanced studies of single spins, atoms, molecules, functional surfaces and quantum systems, as well as synergies between AFM and techniques such as scanning tunneling microscopy and THz spectroscopy are topics covered. Learn how AFM exploits a wide range of electromagnetic interactions, from spin–spin and van der Waals to electrostatic and magnetic interactions, making AFM an unprecedented tool for surface science and nanoscale analysis.

Submission deadline: October 31, 2024.

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