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| Supporting Information File 1: AFM topography of manipulated Cu nanoparticles. | ||
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Cite the Following Article
Quantitative estimation of nanoparticle/substrate adhesion by atomic force microscopy
Aydan Çiçek, Markus Kratzer, Christian Teichert and Christian Mitterer
Beilstein J. Nanotechnol. 2026, 17, 1–14.
https://doi.org/10.3762/bjnano.17.1
How to Cite
Çiçek, A.; Kratzer, M.; Teichert, C.; Mitterer, C. Beilstein J. Nanotechnol. 2026, 17, 1–14. doi:10.3762/bjnano.17.1
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