Cite the Following Article
Models of the interaction of metal tips with insulating surfaces
Thomas Trevethan, Matthew Watkins and Alexander L. Shluger
Beilstein J. Nanotechnol. 2012, 3, 329–335.
https://doi.org/10.3762/bjnano.3.37
How to Cite
Trevethan, T.; Watkins, M.; Shluger, A. L. Beilstein J. Nanotechnol. 2012, 3, 329–335. doi:10.3762/bjnano.3.37
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Citations to This Article
Up to 20 of the most recent references are displayed here.
Scholarly Works
- Pitters, J.; Croshaw, J.; Achal, R.; Livadaru, L.; Ng, S.; Lupoiu, R.; Chutora, T.; Huff, T.; Walus, K.; Wolkow, R. A. Atomically Precise Manufacturing of Silicon Electronics. ACS nano 2024, 18, 6766–6816. doi:10.1021/acsnano.3c10412
- Ellner, M.; Pou, P.; Pérez, R. The Electrostatic Field of CO Functionalized Metal Tips. Springer Series in Surface Sciences; Springer International Publishing, 2018; pp 465–497. doi:10.1007/978-3-319-75687-5_15
- Gao, D. Z.; Schwarz, A.; Shluger, A. L. Imaging Molecules on Bulk Insulators Using Metallic Tips. NanoScience and Technology; Springer International Publishing, 2015; pp 355–378. doi:10.1007/978-3-319-15588-3_17
- Pishkenari, H. N. Atomic interactions between metallic tips and surfaces in NC-AFM. Journal of Physics D: Applied Physics 2015, 48, 125301. doi:10.1088/0022-3727/48/12/125301
- Sang, H.; Jarvis, S.; Zhou, Z.; Sharp, P.; Moriarty, P.; Wang, J.; Wang, Y.; Kantorovich, L. Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting. Scientific reports 2014, 4, 6678. doi:10.1038/srep06678
- Gao, D. Z.; Grenz, J.; Watkins, M.; Canova, F. F.; Schwarz, A.; Wiesendanger, R.; Shluger, A. L. Using metallic noncontact atomic force microscope tips for imaging insulators and polar molecules: tip characterization and imaging mechanisms. ACS nano 2014, 8, 5339–5351. doi:10.1021/nn501785q
- Schneiderbauer, M.; Emmrich, M.; Weymouth, A. J.; Giessibl, F. J. CO tip functionalization inverts atomic force microscopy contrast via short-range electrostatic forces. Physical review letters 2014, 112, 166102. doi:10.1103/physrevlett.112.166102
- Uluutku, B.; Baykara, M. Z. Effect of lateral tip stiffness on atomic-resolution force field spectroscopy. Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena 2013, 31, 041801. doi:10.1116/1.4807376