Cite the Following Article
High-resolution electrical and chemical characterization of nm-scale organic and inorganic devices
Pierre Eyben
Beilstein J. Nanotechnol. 2013, 4, 318–319.
https://doi.org/10.3762/bjnano.4.35
How to Cite
Eyben, P. Beilstein J. Nanotechnol. 2013, 4, 318–319. doi:10.3762/bjnano.4.35
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