Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

Scholarly Works

• Ishida, N.; Mano, T. Quantitative characterization of built-in potential profile across GaAs p-n junctions using Kelvin probe force microscopy with qPlus sensor AFM. Nanotechnology 2023, 35, 65708–065708. doi:10.1088/1361-6528/ad0b5e
• Theiler, P. M.; Ritz, C.; Hofmann, R.; Stemmer, A. Detection of a Chirality-Induced Spin Selective Quantum Capacitance in α-Helical Peptides. Nano letters 2023, 23, 8280–8287. doi:10.1021/acs.nanolett.3c02483
• Lu, B.; Vegso, K.; Micky, S.; Ritz, C.; Bodik, M.; Fedoryshyn, Y. M.; Siffalovic, P.; Stemmer, A. Tunable Subnanometer Gaps in Self-Assembled Monolayer Gold Nanoparticle Superlattices Enabling Strong Plasmonic Field Confinement. ACS nano 2023, 17, 12774–12787. doi:10.1021/acsnano.3c03804
• Ishida, N. Utilizing the surface potential of a solid electrolyte region as the potential reference in Kelvin probe force microscopy. Beilstein journal of nanotechnology 2022, 13, 1558–1563. doi:10.3762/bjnano.13.129
• Miyazaki, M.; Sugawara, Y.; Li, Y. J. Dual-bias modulation heterodyne Kelvin probe force microscopy in FM mode. Applied Physics Letters 2022, 121. doi:10.1063/5.0129433
• Kilpatrick, J. I.; Kargin, E.; Rodriguez, B. J. Comparing the performance of single and multifrequency Kelvin probe force microscopy techniques in air and water. Beilstein journal of nanotechnology 2022, 13, 922–943. doi:10.3762/bjnano.13.82
• Fukuzawa, R.; Liang, J.; Shigekawa, N.; Takahashi, T. Quantitative capacitance measurements in frequency modulation electrostatic force microscopy. Japanese Journal of Applied Physics 2022, 61, SL1005. doi:10.35848/1347-4065/ac5fb9
• Richheimer, F.; Vincent, T.; Catanzaro, A.; Huáng, N. J.; Baker, M. A.; Dorey, R. A.; Giusca, C. E.; Castro, F. A.; Kazakova, O.; Wood, S. Probing Nanoscale Schottky Barrier Characteristics at WSe2/Graphene Heterostructures via Electrostatic Doping. Advanced Electronic Materials 2022, 8. doi:10.1002/aelm.202200196
• Gödrich, S.; Schmidt, H.-W.; Papastavrou, G. Stability of Charge Distributions in Electret Films on the nm-Scale. ACS applied materials & interfaces 2022, 14, 4500–4509. doi:10.1021/acsami.1c21174
• Lanzoni, E. M.; Gallet, T.; Spindler, C.; Ramirez, O.; Boumenou, C. K.; Siebentritt, S.; Redinger, A. The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band bending in perovskite and Cu(In,Ga)Se2 solar cells. Nano Energy 2021, 88, 106270. doi:10.1016/j.nanoen.2021.106270
• Caballero-Quintana, I.; Rivera-Taco, J.; Barthes, C.; Nicasio-Collazo, J.; Ramos-Ortiz, G.; Maldonado, J.-L.; Maraval, V.; Chauvin, R. Nano-films of carbo-benzene derivatives: Scanning probe microscopy analysis and prospects of use in organic solar cells. Synthetic Metals 2021, 278, 116826. doi:10.1016/j.synthmet.2021.116826
• Lanzoni, E. M.; Gallet, T.; Spindler, C.; Ramirez, O.; Boumenou, C. K.; Siebentritt, S.; Redinger, A. The impact of Kelvin probe force microscopy operation modes and environment on grain boundary band bending in perovskite and Cu(In,Ga)Se2 solar cells. 2021.
• Larsen, M. N.; Peters, M. S.; Lemos-Silva, R.; da Silva Filho, D. A.; Jørgensen, B.; Albrektsen, O.; Kjelstrup-Hansen, J. Work function difference of naphthyl end-capped oligothiophene in different crystal alignments studied by Kelvin probe force microscopy. Organic Electronics 2021, 89, 106060. doi:10.1016/j.orgel.2020.106060
• Ritz, C.; Wagner, T.; Stemmer, A. Measurement of electrostatic tip-sample interactions by time-domain Kelvin probe force microscopy. Beilstein journal of nanotechnology 2020, 11, 911–921. doi:10.3762/bjnano.11.76
• Xu, J.; Bai, G.; Li, J.; Li, W. Inhomogeneous probe surface induced effect in Kelvin probe force microscopy. Journal of Applied Physics 2020, 127, 184302. doi:10.1063/5.0005276
• Sun, Y.; Zeng, K. Characterization of Catalysts by Advanced Scanning Probe Microscopy and Spectroscopy. ChemCatChem 2020, 12, 3601–3620. doi:10.1002/cctc.201901877
• Könemann, F.; Vollmann, M.; Wagner, T.; Ghazali, N. M.; Yamaguchi, T.; Stemmer, A.; Ishibashi, K.; Gotsmann, B. Thermal Conductivity of a Supported Multiwalled Carbon Nanotube. The Journal of Physical Chemistry C 2019, 123, 12460–12465. doi:10.1021/acs.jpcc.9b00692
• Berweger, S.; Qiu, G.; Wang, Y.; Pollard, B.; Genter, K. L.; Tyrrell-Ead, R.; Wallis, T. M.; Wu, W.; Ye, P. D.; Kabos, P. Imaging Carrier Inhomogeneities in Ambipolar Tellurene Field Effect Transistors. Nano letters 2019, 19, 1289–1294. doi:10.1021/acs.nanolett.8b04865
• Wagner, T. Steady-state and transient behavior in dynamic atomic force microscopy. Journal of Applied Physics 2019, 125, 044301. doi:10.1063/1.5078954
• Collins, L.; Kilpatrick, J. I.; Kalinin, S. V.; Rodriguez, B. J. Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review. Reports on progress in physics. Physical Society (Great Britain) 2018, 81, 086101. doi:10.1088/1361-6633/aab560

Explore citations to this article at