Advanced atomic force microscopy techniques IV

editorImage
Editor: Dr. Thilo Glatzel
University of Basel
 

This thematic issue presents the latest research results in atomic force microscopy techniques and consists of 13 full research papers. Contributions to this issue come from an international group of noted experts.

 

See related thematic issues:
Advanced atomic force microscopy II
Advanced atomic force microscopy
Advanced atomic force microscopy techniques III
Advanced atomic force microscopy techniques II
Advanced atomic force microscopy techniques

Back to all Issues

Distribution of Pd clusters on ultrathin, epitaxial TiOx films on Pt3Ti(111)

  • Christian Breinlich,
  • Maria Buchholz,
  • Marco Moors,
  • Tobias Pertram,
  • Conrad Becker and
  • Klaus Wandelt

Beilstein J. Nanotechnol. 2015, 6, 2007–2014, doi:10.3762/bjnano.6.204

Graphical Abstract
PDF
Album
Full Research Paper
Published 09 Oct 2015

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

  • Tino Wagner,
  • Hannes Beyer,
  • Patrick Reissner,
  • Philipp Mensch,
  • Heike Riel,
  • Bernd Gotsmann and
  • Andreas Stemmer

Beilstein J. Nanotechnol. 2015, 6, 2193–2206, doi:10.3762/bjnano.6.225

Graphical Abstract
PDF
Album
Supp Info
Full Research Paper
Published 23 Nov 2015

High-bandwidth multimode self-sensing in bimodal atomic force microscopy

  • Michael G. Ruppert and
  • S. O. Reza Moheimani

Beilstein J. Nanotechnol. 2016, 7, 284–295, doi:10.3762/bjnano.7.26

Graphical Abstract
PDF
Album
Full Research Paper
Published 24 Feb 2016

Contact-free experimental determination of the static flexural spring constant of cantilever sensors using a microfluidic force tool

  • John D. Parkin and
  • Georg Hähner

Beilstein J. Nanotechnol. 2016, 7, 492–500, doi:10.3762/bjnano.7.43

Graphical Abstract
PDF
Album
Supp Info
Full Research Paper
Published 30 Mar 2016
Graphical Abstract
PDF
Album
Supp Info
Full Research Paper
Published 15 Apr 2016

Characterization of spherical domains at the polystyrene thin film–water interface

  • Khurshid Ahmad,
  • Xuezeng Zhao,
  • Yunlu Pan and
  • Danish Hussain

Beilstein J. Nanotechnol. 2016, 7, 581–590, doi:10.3762/bjnano.7.51

Graphical Abstract
PDF
Album
Supp Info
Full Research Paper
Published 20 Apr 2016

Correlative infrared nanospectroscopic and nanomechanical imaging of block copolymer microdomains

  • Benjamin Pollard and
  • Markus B. Raschke

Beilstein J. Nanotechnol. 2016, 7, 605–612, doi:10.3762/bjnano.7.53

Graphical Abstract
PDF
Album
Full Research Paper
Published 22 Apr 2016

Cantilever bending based on humidity-actuated mesoporous silica/silicon bilayers

  • Christian Ganser,
  • Gerhard Fritz-Popovski,
  • Roland Morak,
  • Parvin Sharifi,
  • Benedetta Marmiroli,
  • Barbara Sartori,
  • Heinz Amenitsch,
  • Thomas Griesser,
  • Christian Teichert and
  • Oskar Paris

Beilstein J. Nanotechnol. 2016, 7, 637–644, doi:10.3762/bjnano.7.56

Graphical Abstract
PDF
Album
Full Research Paper
Published 28 Apr 2016

Coupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopy

  • Michael Klocke and
  • Dietrich E. Wolf

Beilstein J. Nanotechnol. 2016, 7, 708–720, doi:10.3762/bjnano.7.63

Graphical Abstract
PDF
Album
Full Research Paper
Published 17 May 2016

High-resolution noncontact AFM and Kelvin probe force microscopy investigations of self-assembled photovoltaic donor–acceptor dyads

  • Benjamin Grévin,
  • Pierre-Olivier Schwartz,
  • Laure Biniek,
  • Martin Brinkmann,
  • Nicolas Leclerc,
  • Elena Zaborova and
  • Stéphane Méry

Beilstein J. Nanotechnol. 2016, 7, 799–808, doi:10.3762/bjnano.7.71

Graphical Abstract
PDF
Album
Supp Info
Full Research Paper
Published 03 Jun 2016

Understanding interferometry for micro-cantilever displacement detection

  • Alexander von Schmidsfeld,
  • Tobias Nörenberg,
  • Matthias Temmen and
  • Michael Reichling

Beilstein J. Nanotechnol. 2016, 7, 841–851, doi:10.3762/bjnano.7.76

Graphical Abstract
PDF
Album
Supp Info
Full Research Paper
Published 10 Jun 2016

Generalized Hertz model for bimodal nanomechanical mapping

  • Aleksander Labuda,
  • Marta Kocuń,
  • Waiman Meinhold,
  • Deron Walters and
  • Roger Proksch

Beilstein J. Nanotechnol. 2016, 7, 970–982, doi:10.3762/bjnano.7.89

Graphical Abstract
PDF
Album
Full Research Paper
Published 05 Jul 2016

Signal enhancement in cantilever magnetometry based on a co-resonantly coupled sensor

  • Julia Körner,
  • Christopher F. Reiche,
  • Thomas Gemming,
  • Bernd Büchner,
  • Gerald Gerlach and
  • Thomas Mühl

Beilstein J. Nanotechnol. 2016, 7, 1033–1043, doi:10.3762/bjnano.7.96

Graphical Abstract
PDF
Album
Full Research Paper
Published 18 Jul 2016
Other Beilstein-Institut Open Science Activities