Cite the Following Article
Observing the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes
Sebastian Gutsch, Daniel Hiller, Jan Laube, Margit Zacharias and Christian Kübel
Beilstein J. Nanotechnol. 2015, 6, 964–970.
https://doi.org/10.3762/bjnano.6.99
How to Cite
Gutsch, S.; Hiller, D.; Laube, J.; Zacharias, M.; Kübel, C. Beilstein J. Nanotechnol. 2015, 6, 964–970. doi:10.3762/bjnano.6.99
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