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Cite the Following Article
Understanding interferometry for micro-cantilever displacement detection
Alexander von Schmidsfeld, Tobias Nörenberg, Matthias Temmen and Michael Reichling
Beilstein J. Nanotechnol. 2016, 7, 841–851.
https://doi.org/10.3762/bjnano.7.76
How to Cite
von Schmidsfeld, A.; Nörenberg, T.; Temmen, M.; Reichling, M. Beilstein J. Nanotechnol. 2016, 7, 841–851. doi:10.3762/bjnano.7.76
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