Supporting Information
Supporting Information File 1: Profile of interferometric patterns in all planes. | ||
Format: MP4 | Size: 27.4 MB | Download |
Cite the Following Article
Understanding interferometry for micro-cantilever displacement detection
Alexander von Schmidsfeld, Tobias Nörenberg, Matthias Temmen and Michael Reichling
Beilstein J. Nanotechnol. 2016, 7, 841–851.
https://doi.org/10.3762/bjnano.7.76
How to Cite
von Schmidsfeld, A.; Nörenberg, T.; Temmen, M.; Reichling, M. Beilstein J. Nanotechnol. 2016, 7, 841–851. doi:10.3762/bjnano.7.76
Download Citation
Citation data can be downloaded as file using the "Download" button or used for copy/paste from the text window
below.
Citation data in RIS format can be imported by all major citation management software, including EndNote,
ProCite, RefWorks, and Zotero.
Presentation Graphic
Picture with graphical abstract, title and authors for social media postings and presentations. | ||
Format: PNG | Size: 1.2 MB | Download |
Citations to This Article
Up to 20 of the most recent references are displayed here.
Scholarly Works
- Khachatryan, K.; Anter, S.; Reichling, M.; von Schmidsfeld, A. Signal generation in dynamic interferometric displacement detection. Beilstein journal of nanotechnology 2024, 15, 1070–1076. doi:10.3762/bjnano.15.87
- Xia, F.; Rangelow, I. W.; Youcef-Toumi, K. Cantilever Mechanics and Deflection Sensing. Active Probe Atomic Force Microscopy; Springer International Publishing, 2024; pp 55–83. doi:10.1007/978-3-031-44233-9_3
- Tetard, L. ACS In Focus; American Chemical Society, 2023. doi:10.1021/acsinfocus.7e7008
- Muñoz-Galán, H.; Alemán, C.; Pérez-Madrigal, M. M. Beyond biology: alternative uses of cantilever-based technologies. Lab on a chip 2023, 23, 1128–1150. doi:10.1039/d2lc00873d
- Xia, F.; Mayborne, M. P.; Ma, Q.; Youcef-Toumi, K. Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy. In 2022 IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM), IEEE, 2022; pp 1722–1729. doi:10.1109/aim52237.2022.9863383
- Alunda, B. O.; Lee, Y. J. Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy. Sensors (Basel, Switzerland) 2020, 20, 4784. doi:10.3390/s20174784
- Basu, A. K.; Basu, A.; Bhattacharya, S. Micro/Nano fabricated cantilever based biosensor platform: A review and recent progress. Enzyme and microbial technology 2020, 139, 109558. doi:10.1016/j.enzmictec.2020.109558
- Yang, W.; Liu, X.; Lu, W.; Zili, L.; Hu, C.; Chen, C. Traceable atomic force microscope based on monochromatic light interference. Precision Engineering 2020, 61, 48–54. doi:10.1016/j.precisioneng.2019.10.001
- Zawierta, M.; Jeffery, R.; Putrino, G.; Silva, K. K. M. B. D.; Keating, A.; Martyniuk, M.; Faraone, L. Atomic force microscopy with integrated on-chip interferometric readout. Ultramicroscopy 2019, 205, 75–83. doi:10.1016/j.ultramic.2019.05.011
- Wang, P.; Michael, A.; Kwok, C. Y. Silicon waveguide cantilever displacement sensor for potential application for on-chip high speed AFM. Frontiers of Optoelectronics 2018, 11, 53–59. doi:10.1007/s12200-018-0774-4
- Andreeva, N. V. Atomic force microscopy with interferometric method for detection of the cantilever displacement and its application for low-temperature studies. Ferroelectrics 2018, 525, 178–186. doi:10.1080/00150193.2018.1432833
- Yang, W.; Yang, X.; Lu, W.; Nengguo, Y.; Chen, L.; Zhou, L.; Chang, S. A Novel White Light Interference Based AFM Head. Journal of Lightwave Technology 2017, 35, 3604–3610. doi:10.1109/jlt.2016.2614542