Impact of contact resistance on the electrical properties of MoS2 transistors at practical operating temperatures

Filippo Giannazzo, Gabriele Fisichella, Aurora Piazza, Salvatore Di Franco, Giuseppe Greco, Simonpietro Agnello and Fabrizio Roccaforte
Beilstein J. Nanotechnol. 2017, 8, 254–263. https://doi.org/10.3762/bjnano.8.28

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Impact of contact resistance on the electrical properties of MoS2 transistors at practical operating temperatures
Filippo Giannazzo, Gabriele Fisichella, Aurora Piazza, Salvatore Di Franco, Giuseppe Greco, Simonpietro Agnello and Fabrizio Roccaforte
Beilstein J. Nanotechnol. 2017, 8, 254–263. https://doi.org/10.3762/bjnano.8.28

How to Cite

Giannazzo, F.; Fisichella, G.; Piazza, A.; Di Franco, S.; Greco, G.; Agnello, S.; Roccaforte, F. Beilstein J. Nanotechnol. 2017, 8, 254–263. doi:10.3762/bjnano.8.28

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