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Cite the Following Article
Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund and Stefan A. L. Weber
Beilstein J. Nanotechnol. 2018, 9, 1809–1819.
https://doi.org/10.3762/bjnano.9.172
How to Cite
Axt, A.; Hermes, I. M.; Bergmann, V. W.; Tausendpfund, N.; Weber, S. A. L. Beilstein J. Nanotechnol. 2018, 9, 1809–1819. doi:10.3762/bjnano.9.172
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