Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund and Stefan A. L. Weber
Beilstein J. Nanotechnol. 2018, 9, 1809–1819. https://doi.org/10.3762/bjnano.9.172

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Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices
Amelie Axt, Ilka M. Hermes, Victor W. Bergmann, Niklas Tausendpfund and Stefan A. L. Weber
Beilstein J. Nanotechnol. 2018, 9, 1809–1819. https://doi.org/10.3762/bjnano.9.172

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Axt, A.; Hermes, I. M.; Bergmann, V. W.; Tausendpfund, N.; Weber, S. A. L. Beilstein J. Nanotechnol. 2018, 9, 1809–1819. doi:10.3762/bjnano.9.172

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