Scanning probe microscopy for energy-related materials

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Editors:
Prof. Philippe Leclère, CIRMAP, University of Mons
Dr. Rüdiger Berger, Max Planck Institute for Polymer Research
Dr. Benjamin Grévin, UMR5819 CEA-CNRS-UGA, CEA-Grenoble INAC/SYMMES
Dr. Yi Zhang, Shanghai Institute of Applied Physics, Chinese Academy of Sciences
 

Intensive research is being performed to fulfill the future requirements for low-cost energy conversion and storage. Relevant topics in this emerging field are photovoltaics, batteries, fuel cells, supercapacitors and energy harvesting devices based on piezoelectric and thermoelectric effects. The understanding of nanoscale phenomena occurring at surfaces and interfaces is essential for these crucial energy conversion and energy storage applications. In order to characterize these complex interactions at the nanoscale (where most of the physical and chemical phenomena occur), various metrology methods such as scanning probe microscopy (SPM) currently play a major role.

This Thematic Series is collection of peer-reviewed articles focused on SPM related to energy conversion and storage applications and to stimulate the development and utilization of new SPM methods which could advance our understanding of energy-related materials. The following topics are covered in this Thematic Series:

  • Advanced SPM methods for electrical and mechanical property characterization
  • Novel materials for photovoltaics and batteries
  • Local performance of (hybrid) solar cells, batteries, supercapacitors and thermoelectric devices
  • Time-resolved EFM/KPFM imaging of the charge carrier dynamics of energy devices
  • (Photo)degradation of energy materials and devices
  • Novel architectures for batteries
  • Novel methods for electrochemical surface characterization
  • Piezo–force microscopy on piezoelectric materials for energy harvesting
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Scanning probe microscopy for energy-related materials

  • Rüdiger Berger,
  • Benjamin Grévin,
  • Philippe Leclère and
  • Yi Zhang

Beilstein J. Nanotechnol. 2019, 10, 132–134, doi:10.3762/bjnano.10.12

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Published 10 Jan 2019

Nanoscale mapping of dielectric properties based on surface adhesion force measurements

  • Ying Wang,
  • Yue Shen,
  • Xingya Wang,
  • Zhiwei Shen,
  • Bin Li,
  • Jun Hu and
  • Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 900–906, doi:10.3762/bjnano.9.84

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Published 16 Mar 2018

Electrostatic force spectroscopy revealing the degree of reduction of individual graphene oxide sheets

  • Yue Shen,
  • Ying Wang,
  • Yuan Zhou,
  • Chunxi Hai,
  • Jun Hu and
  • Yi Zhang

Beilstein J. Nanotechnol. 2018, 9, 1146–1155, doi:10.3762/bjnano.9.106

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Published 11 Apr 2018

Correlative electrochemical strain and scanning electron microscopy for local characterization of the solid state electrolyte Li1.3Al0.3Ti1.7(PO4)3

  • Nino Schön,
  • Deniz Cihan Gunduz,
  • Shicheng Yu,
  • Hermann Tempel,
  • Roland Schierholz and
  • Florian Hausen

Beilstein J. Nanotechnol. 2018, 9, 1564–1572, doi:10.3762/bjnano.9.148

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Published 28 May 2018

Nanoscale electrochemical response of lithium-ion cathodes: a combined study using C-AFM and SIMS

  • Jonathan Op de Beeck,
  • Nouha Labyedh,
  • Alfonso Sepúlveda,
  • Valentina Spampinato,
  • Alexis Franquet,
  • Thierry Conard,
  • Philippe M. Vereecken,
  • Wilfried Vandervorst and
  • Umberto Celano

Beilstein J. Nanotechnol. 2018, 9, 1623–1628, doi:10.3762/bjnano.9.154

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Published 04 Jun 2018

Multimodal noncontact atomic force microscopy and Kelvin probe force microscopy investigations of organolead tribromide perovskite single crystals

  • Yann Almadori,
  • David Moerman,
  • Jaume Llacer Martinez,
  • Philippe Leclère and
  • Benjamin Grévin

Beilstein J. Nanotechnol. 2018, 9, 1695–1704, doi:10.3762/bjnano.9.161

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Published 07 Jun 2018

Direct AFM-based nanoscale mapping and tomography of open-circuit voltages for photovoltaics

  • Katherine Atamanuk,
  • Justin Luria and
  • Bryan D. Huey

Beilstein J. Nanotechnol. 2018, 9, 1802–1808, doi:10.3762/bjnano.9.171

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Published 14 Jun 2018

Know your full potential: Quantitative Kelvin probe force microscopy on nanoscale electrical devices

  • Amelie Axt,
  • Ilka M. Hermes,
  • Victor W. Bergmann,
  • Niklas Tausendpfund and
  • Stefan A. L. Weber

Beilstein J. Nanotechnol. 2018, 9, 1809–1819, doi:10.3762/bjnano.9.172

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Published 15 Jun 2018

Numerical analysis of single-point spectroscopy curves used in photo-carrier dynamics measurements by Kelvin probe force microscopy under frequency-modulated excitation

  • Pablo A. Fernández Garrillo,
  • Benjamin Grévin and
  • Łukasz Borowik

Beilstein J. Nanotechnol. 2018, 9, 1834–1843, doi:10.3762/bjnano.9.175

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Published 20 Jun 2018

A scanning probe microscopy study of nanostructured TiO2/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications

  • Laurie Letertre,
  • Roland Roche,
  • Olivier Douhéret,
  • Hailu G. Kassa,
  • Denis Mariolle,
  • Nicolas Chevalier,
  • Łukasz Borowik,
  • Philippe Dumas,
  • Benjamin Grévin,
  • Roberto Lazzaroni and
  • Philippe Leclère

Beilstein J. Nanotechnol. 2018, 9, 2087–2096, doi:10.3762/bjnano.9.197

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Published 01 Aug 2018
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