Supporting Information
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Supporting Information File 1:
Supporting Information.
Figure S1 shows a FM-AFM height image obtained in UHV astride the step from a nanostructured TiO2/P3HT-COOH HHJ to the ITO electrode lying below. The applied DC sample bias was varied during the measurement, without illumination. This result aims at demonstrating the absence of floating potential across the layer composing the sample. Figure S2 shows the superimposition of FM-KPFM height and Vcpd profiles over a nanostructured TiO2 film obtained in UHV and recorded with and without illumination. The result aimed at demonstrating the absence of light-induced artefact during the recording of topography, as well as the negligibility of the photovoltaic effect at the TiO2/ITO interface. |
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Cite the Following Article
A scanning probe microscopy study of nanostructured TiO2/poly(3-hexylthiophene) hybrid heterojunctions for photovoltaic applications
Laurie Letertre, Roland Roche, Olivier Douhéret, Hailu G. Kassa, Denis Mariolle, Nicolas Chevalier, Łukasz Borowik, Philippe Dumas, Benjamin Grévin, Roberto Lazzaroni and Philippe Leclère
Beilstein J. Nanotechnol. 2018, 9, 2087–2096.
https://doi.org/10.3762/bjnano.9.197
How to Cite
Letertre, L.; Roche, R.; Douhéret, O.; Kassa, H. G.; Mariolle, D.; Chevalier, N.; Borowik, Ł.; Dumas, P.; Grévin, B.; Lazzaroni, R.; Leclère, P. Beilstein J. Nanotechnol. 2018, 9, 2087–2096. doi:10.3762/bjnano.9.197
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